W.T. Holman

2.6k total citations
113 papers, 2.0k citations indexed

About

W.T. Holman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, W.T. Holman has authored 113 papers receiving a total of 2.0k indexed citations (citations by other indexed papers that have themselves been cited), including 105 papers in Electrical and Electronic Engineering, 65 papers in Hardware and Architecture and 10 papers in Biomedical Engineering. Recurrent topics in W.T. Holman's work include Radiation Effects in Electronics (80 papers), VLSI and Analog Circuit Testing (59 papers) and Low-power high-performance VLSI design (38 papers). W.T. Holman is often cited by papers focused on Radiation Effects in Electronics (80 papers), VLSI and Analog Circuit Testing (59 papers) and Low-power high-performance VLSI design (38 papers). W.T. Holman collaborates with scholars based in United States, China and Taiwan. W.T. Holman's co-authors include L. W. Massengill, B. L. Bhuva, T. D. Loveless, Arthur F. Witulski, J.A. Connelly, J. S. Kauppila, Y. Boulghassoul, Ronald D. Schrimpf, N. M. Atkinson and Michael L. Alles and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Aerospace and Electronic Systems and Electronics Letters.

In The Last Decade

W.T. Holman

109 papers receiving 1.9k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
W.T. Holman United States 26 1.8k 855 128 114 86 113 2.0k
Carlos Tokunaga United States 18 1.5k 0.8× 873 1.0× 199 1.6× 252 2.2× 268 3.1× 43 1.9k
Marisa López‐Vallejo Spain 15 643 0.3× 339 0.4× 48 0.4× 97 0.9× 134 1.6× 106 947
Lawrence T. Clark United States 22 2.0k 1.1× 899 1.1× 42 0.3× 187 1.6× 147 1.7× 152 2.3k
Yici Cai China 20 1.5k 0.8× 826 1.0× 35 0.3× 131 1.1× 96 1.1× 220 1.7k
D.G. Elliott Canada 19 680 0.4× 235 0.3× 79 0.6× 290 2.5× 95 1.1× 84 1.1k
D.M.W. Leenaerts Netherlands 18 813 0.4× 161 0.2× 15 0.1× 149 1.3× 140 1.6× 79 1.1k
Ben Keller United States 16 660 0.4× 385 0.5× 232 1.8× 75 0.7× 154 1.8× 28 941
Shuming Chen China 19 974 0.5× 576 0.7× 46 0.4× 63 0.6× 49 0.6× 164 1.2k
A. Rueda Spain 22 1.5k 0.8× 793 0.9× 74 0.6× 898 7.9× 273 3.2× 187 2.0k

Countries citing papers authored by W.T. Holman

Since Specialization
Citations

This map shows the geographic impact of W.T. Holman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.T. Holman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.T. Holman more than expected).

Fields of papers citing papers by W.T. Holman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W.T. Holman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.T. Holman. The network helps show where W.T. Holman may publish in the future.

Co-authorship network of co-authors of W.T. Holman

This figure shows the co-authorship network connecting the top 25 collaborators of W.T. Holman. A scholar is included among the top collaborators of W.T. Holman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W.T. Holman. W.T. Holman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Alles, Michael L., Dennis R. Ball, Andrew L. Sternberg, et al.. (2023). On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs. IEEE Transactions on Nuclear Science. 71(4). 500–507. 1 indexed citations
2.
Loveless, T. D., et al.. (2020). Radiation Hardened by Design Subsampling Phase-Locked Loop Techniques in PD-SOI. IEEE Transactions on Nuclear Science. 67(6). 1144–1151. 5 indexed citations
3.
Kauppila, J. S., Dennis R. Ball, T. D. Haeffner, et al.. (2017). Dual-Interlocked Logic for Single-Event Transient Mitigation. IEEE Transactions on Nuclear Science. 65(8). 1872–1878. 11 indexed citations
4.
Massengill, L. W., Andrew L. Sternberg, En Xia Zhang, et al.. (2017). Time-Domain Modeling of All-Digital PLLs to Single-Event Upset Perturbations. IEEE Transactions on Nuclear Science. 65(1). 311–317. 4 indexed citations
5.
Kauppila, J. S., Dennis R. Ball, T. D. Haeffner, et al.. (2017). Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques. IEEE Transactions on Nuclear Science. 65(1). 362–368. 13 indexed citations
6.
Bhuva, B. L., et al.. (2017). Frequency Dependence of Heavy-Ion-Induced Single-Event Responses of Flip-Flops in a 16-nm Bulk FinFET Technology. IEEE Transactions on Nuclear Science. 65(1). 413–417. 10 indexed citations
7.
Massengill, L. W., Michael L. Alles, B. L. Bhuva, et al.. (2016). Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections. IEEE Transactions on Nuclear Science. 64(1). 441–448. 48 indexed citations
8.
Massengill, L. W., B. L. Bhuva, W.T. Holman, et al.. (2015). Single-Event Characterization of Bang-bang All-digital Phase-locked Loops (ADPLLs). IEEE Transactions on Nuclear Science. 62(6). 2650–2656. 5 indexed citations
9.
Holman, W.T., et al.. (2011). Single-event vulnerability of mixed-signal circuit interfaces. 485–488. 4 indexed citations
10.
Bhuva, B. L., et al.. (2011). Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops. IEEE Transactions on Nuclear Science. 58(6). 2658–2663. 23 indexed citations
11.
Loveless, T. D., L. W. Massengill, W.T. Holman, et al.. (2010). A Generalized Linear Model for Single Event Transient Propagation in Phase-Locked Loops. IEEE Transactions on Nuclear Science. 57(5). 2933–2947. 36 indexed citations
12.
Olson, Brian D., et al.. (2010). Demonstration of a Differential Layout Solution for Improved ASET Tolerance in CMOS A/MS Circuits. IEEE Transactions on Nuclear Science. 28 indexed citations
13.
Olson, Brian D., W.T. Holman, L. W. Massengill, & B. L. Bhuva. (2008). Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis. IEEE Transactions on Nuclear Science. 55(6). 2957–2961. 3 indexed citations
14.
Narasimham, Balaji, B. L. Bhuva, Ronald D. Schrimpf, et al.. (2008). Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes. IEEE Transactions on Nuclear Science. 55(3). 1708–1713. 52 indexed citations
15.
Olson, Brian D., W.T. Holman, L. W. Massengill, B. L. Bhuva, & Patrick R. Fleming. (2008). Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs. IEEE Transactions on Nuclear Science. 55(6). 3440–3446. 14 indexed citations
16.
Adell, Philippe C., et al.. (2005). Total Dose and Single Event Transients in Linear Voltage Regulators. HAL (Le Centre pour la Communication Scientifique Directe). F5–1. 1 indexed citations
17.
Adell, Philippe C., et al.. (2004). Total dose effects in a linear Voltage regulator. IEEE Transactions on Nuclear Science. 51(6). 3816–3821. 37 indexed citations
18.
Newbould, Rexford D., et al.. (2003). Mixed signal design watermarking for IP protection. Integrated Computer-Aided Engineering. 10(3). 249–265. 6 indexed citations
19.
20.
Holman, W.T., et al.. (1997). An integrated analog/digital random noise source. IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications. 44(6). 521–528. 138 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Carlos Tokunaga Breakdown of academic impact, for papers by Marisa López‐Vallejo Breakdown of academic impact, for papers by Lawrence T. Clark Breakdown of academic impact, for papers by Yici Cai Breakdown of academic impact, for papers by D.G. Elliott Breakdown of academic impact, for papers by D.M.W. Leenaerts Breakdown of academic impact, for papers by Ben Keller Breakdown of academic impact, for papers by Shuming Chen Breakdown of academic impact, for papers by A. Rueda
Rankless by CCL
2026