T.L. Turflinger

1.5k citations

35 papers · 1.2k indexed · h-index 18

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 5%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics

Papers in

Hardware and Architecture 15
- VLSI and Analog Circuit Testing 15
Electrical and Electronic Engineering 33
- Radiation Effects in Electronics 30
- Semiconductor materials and devices 13
- Integrated Circuits and Semiconductor Failure Analysis 11
- Low-power high-performance VLSI design 7
- Advancements in Semiconductor Devices and Circuit Design 5
- Electrostatic Discharge in Electronics 3

Co-authors: Paul Eaton Matthew J. Gadlage J.M. Benedetto D.G. Mavis Keith Avery R.L. Pease J.L. Titus J. Krieg
Journals: IEEE Transactions on Nuclear Science (26 papers)Zenodo (CERN European Organization for Nuclear Research) (2 papers)
Partner nations: United States

In The Last Decade

T.L. Turflinger

35 papers receiving 1.1k citations

Peers

Countries citing papers authored by T.L. Turflinger

Since Specialization

Citations

This map shows the geographic impact of T.L. Turflinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.L. Turflinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.L. Turflinger more than expected).

Fields of papers citing papers by T.L. Turflinger

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.L. Turflinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.L. Turflinger. The network helps show where T.L. Turflinger may publish in the future.

Co-authorship network

The 25 scholars most cited alongside T.L. Turflinger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T.L. Turflinger Line = papers co-authored together T.L. Turflinger links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Response Variability in Commercial MOSFET SEE Qualification IEEE Transactions on Nuclear Science ·J. George, 정인지, T.L. Turflinger, João Rocha Santos, A. E. Middleton, R. Koga, Elizabeth Francis Beach, Jefff Schneider, Jean‐Marie Lauenstein, J.L. Titus, M. Sivertz	2016	10
2	Proton on Metal Fission Environments in an IC Package: An RHA Evaluation Method IEEE Transactions on Nuclear Science ·T.L. Turflinger, 정인지, João Rocha Santos, A. E. Middleton, J. George, R. Koga, Marcelo Marques da Fonseca, Jefff Schneider	2016	8
3	The Neutron Radiation Effects Program (NREP) at Indiana University Cyclotron Facility B. von Przewoski, David V. Baxter, Qin Zhi-jian, Chad Pusateri, V. Derenchuk, Hu Yu-Anjun, C. M. Lavelle, M. Leuschner, Nicholas B. Remmes, T. Rinckel, P. E. Sokol, T.L. Turflinger	2006	2
4	Digital Single Event Transient Trends With Technology Node Scaling IEEE Transactions on Nuclear Science ·J.M. Benedetto, Paul Eaton, D.G. Mavis, Matthew J. Gadlage, T.L. Turflinger	2006	103
5	Single event transient pulsewidth measurements using a variable temporal latch technique IEEE Transactions on Nuclear Science ·Paul Eaton, J.M. Benedetto, D.G. Mavis, Keith Avery, Rosa Anna Gardi, Matthew J. Gadlage, T.L. Turflinger	2004	99
6	Characterization of SET response of the LM124A the LM111, and the LM6144 M.W. Savage, T.L. Turflinger, J.L. Titus, R.L. Pease, C. Poivey	2004	11
7	Variations in SET pulse shapes in the LM124A and LM111 Zenodo (CERN European Organization for Nuclear Research) ·M.W. Savage, T.L. Turflinger, J.L. Titus, T.M. Kamerski, Andrew L. Sternberg, Y. Boulghassoul, L. W. Massengill	2003	26
8	ELDRS in space: an updated and expanded analysis of the bipolar ELDRS experiment on MPTB IEEE Transactions on Nuclear Science ·T.L. Turflinger, A.B. Campbell, Liu-Ting He, Sreedevi Narayana, J. Krieg, J.L. Titus, 井澤陽, Paul W. Marshall, R.L. Pease	2003	12
9	Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs] M. Simons, R.L. Pease, Daniel M. Fleetwood, J.R. Schwank, Nana K. Gerrar, T.L. Turflinger, 彭文怡, L.C. Riewe, 阎海英, J.P.P. Haenen, A.H. Johnston, Dmitri Levonian, Robert E. Mills, Andrew Holmes‐Siedle, Bertung Suryadharma, Johanna Brankaer, Uschash Karan	2002	3
10	Total-dose hardening of a bipolar-voltage comparator IEEE Transactions on Nuclear Science ·R.L. Pease, M.C. Maher, M.R. Shaneyfelt, M.W. Savage, AI Chang-sheng, J. Krieg, T.L. Turflinger	2002	10
11	Frequency domain analysis of analog single-event transients in linear circuits IEEE Transactions on Nuclear Science ·Y. Boulghassoul, L. W. Massengill, T.L. Turflinger, W.T. Holman	2002	53
12	A compendium of single event transient data M.W. Savage, T.L. Turflinger, J.W. Howard, S. Büchner	2002	6
13	Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator IEEE Transactions on Nuclear Science ·J. Krieg, T.L. Turflinger, J.L. Titus, J. Gabryel, AI Chang-sheng, M. Gehlhausen, M. E. Parmala, T.A Arowolo, R.L. Pease, Hugh Barnaby, Ronald D. Schrimpf, M.C. Maher	1999	17
14	Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment IEEE Transactions on Nuclear Science ·J.L. Titus, M. E. Parmala, J. Krieg, T.L. Turflinger, R.L. Pease, A.B. Campbell	1999	25
15	Single-event effects in resolver-to-digital converters IEEE Transactions on Nuclear Science ·S. Büchner, Yahya Santoso Wijaya, Kyungjune Baek, T.L. Turflinger, Dale McMorrow, A.B. Campbell, C. M. Dozier	1999	14
16	First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment IEEE Transactions on Nuclear Science ·J.L. Titus, W.E. Combs, T.L. Turflinger, J. Krieg, Amanda Silvennoinen, D. B. Brown, R.L. Pease, A.B. Campbell	1998	18
17	A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment IEEE Transactions on Nuclear Science ·R.L. Pease, Bertung Suryadharma, Daniel M. Fleetwood, M. Gehlhausen, T.L. Turflinger, D. B. Brown, A.H. Johnston	1997	68
18	Single event effects in analog-to-digital converters: device performance and system impact IEEE Transactions on Nuclear Science ·T.L. Turflinger, Юрий Васильевич Тарануха, S Sapienza	1994	16
19	Understanding single event phenomena in complex analog and digital integrated circuits IEEE Transactions on Nuclear Science ·T.L. Turflinger, Юрий Васильевич Тарануха	1990	20
20	Transient radiation test techniques for high-speed analog-to-digital converters IEEE Transactions on Nuclear Science ·T.L. Turflinger, Юрий Васильевич Тарануха	1989	17

About T.L. Turflinger

T.L. Turflinger is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Automotive Engineering and Nuclear and High Energy Physics, having authored 35 papers that have together received 1.2k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (30 papers), VLSI and Analog Circuit Testing (15 papers), Semiconductor materials and devices (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Low-power high-performance VLSI design (7 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Radiation Detection and Scintillator Technologies (4 papers) and Electrostatic Discharge in Electronics (3 papers). The work is most often cited by research in Hardware and Architecture (427 citations), Electrical and Electronic Engineering (1.1k citations), Radiation (68 citations), Nuclear and High Energy Physics (54 citations) and Safety, Risk, Reliability and Quality (26 citations). T.L. Turflinger has collaborated with scholars based in United States. Frequent co-authors include Paul Eaton, Matthew J. Gadlage, J.M. Benedetto, D.G. Mavis, Keith Avery, R.L. Pease, J.L. Titus, J. Krieg, Ronald D. Schrimpf and M. Gehlhausen. Their work appears in journals such as IEEE Transactions on Nuclear Science and Zenodo (CERN European Organization for Nuclear Research).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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