Jonathan R. Ahlbin

1.5k total citations
37 papers, 1.2k citations indexed

About

Jonathan R. Ahlbin is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry. According to data from OpenAlex, Jonathan R. Ahlbin has authored 37 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 22 papers in Hardware and Architecture and 1 paper in Materials Chemistry. Recurrent topics in Jonathan R. Ahlbin's work include Radiation Effects in Electronics (34 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (19 papers). Jonathan R. Ahlbin is often cited by papers focused on Radiation Effects in Electronics (34 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (19 papers). Jonathan R. Ahlbin collaborates with scholars based in United States, Israel and Canada. Jonathan R. Ahlbin's co-authors include B. L. Bhuva, L. W. Massengill, Matthew J. Gadlage, Arthur F. Witulski, Balaji Narasimham, Robert A. Reed, Ronald D. Schrimpf, N. M. Atkinson, Oluwole A. Amusan and W.T. Holman and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Solid-State Electronics.

In The Last Decade

Jonathan R. Ahlbin

36 papers receiving 1.1k citations

Peers

Jonathan R. Ahlbin
Oluwole A. Amusan United States
J. S. Kauppila United States
D.G. Mavis United States
D. Giot France
S. Doyle United States
V. Ambrose United States
N. J. Gaspard United States
G. Bruguier France
Maxim S. Gorbunov Russia
R. Marec France
Oluwole A. Amusan United States
Jonathan R. Ahlbin
Citations per year, relative to Jonathan R. Ahlbin Jonathan R. Ahlbin (= 1×) peers Oluwole A. Amusan

Countries citing papers authored by Jonathan R. Ahlbin

Since Specialization
Citations

This map shows the geographic impact of Jonathan R. Ahlbin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonathan R. Ahlbin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonathan R. Ahlbin more than expected).

Fields of papers citing papers by Jonathan R. Ahlbin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jonathan R. Ahlbin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonathan R. Ahlbin. The network helps show where Jonathan R. Ahlbin may publish in the future.

Co-authorship network of co-authors of Jonathan R. Ahlbin

This figure shows the co-authorship network connecting the top 25 collaborators of Jonathan R. Ahlbin. A scholar is included among the top collaborators of Jonathan R. Ahlbin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jonathan R. Ahlbin. Jonathan R. Ahlbin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gadlage, Matthew J., et al.. (2016). Characterization of Single-Event Transients in Schmitt Trigger Inverter Chains Operating at Subthreshold Voltages. IEEE Transactions on Nuclear Science. 64(1). 637–642. 10 indexed citations
2.
Ahlbin, Jonathan R., Nicholas C. Hooten, Matthew J. Gadlage, et al.. (2013). Identification of pulse quenching enhanced layouts with subbandgap laser-induced single-event effects. 6C.2.1–6C.2.6. 11 indexed citations
3.
Loveless, T. D., J. S. Kauppila, S. Jagannathan, et al.. (2012). On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology. IEEE Transactions on Nuclear Science. 59(6). 2748–2755. 38 indexed citations
4.
Gaspard, N. J., Arthur F. Witulski, N. M. Atkinson, et al.. (2011). Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS. IEEE Transactions on Nuclear Science. 58(6). 2614–2620. 28 indexed citations
5.
Ahlbin, Jonathan R., Matthew J. Gadlage, N. M. Atkinson, et al.. (2011). Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths. IEEE Transactions on Device and Materials Reliability. 11(3). 401–406. 47 indexed citations
6.
Ahlbin, Jonathan R., T. D. Loveless, Dennis R. Ball, et al.. (2011). Double-pulse-single-event transients in combinational logic. 3C.5.1–3C.5.6. 23 indexed citations
7.
Ahlbin, Jonathan R., N. M. Atkinson, Matthew J. Gadlage, et al.. (2011). Influence of N-Well Contact Area on the Pulse Width of Single-Event Transients. IEEE Transactions on Nuclear Science. 58(6). 2585–2590. 20 indexed citations
8.
Gouker, Pascale, Brian Tyrrell, P.W. Wyatt, et al.. (2011). Radiation Effects in 3D Integrated SOI SRAM Circuits. IEEE Transactions on Nuclear Science. 58(6). 2845–2854. 14 indexed citations
9.
Atkinson, N. M., Jonathan R. Ahlbin, Arthur F. Witulski, et al.. (2011). Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS. IEEE Transactions on Nuclear Science. 58(6). 2578–2584. 47 indexed citations
10.
Artola, L., G. Hubert, Kevin M. Warren, et al.. (2011). SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node. IEEE Transactions on Nuclear Science. 58(3). 1338–1346. 53 indexed citations
11.
Gadlage, Matthew J., Jonathan R. Ahlbin, B. L. Bhuva, L. W. Massengill, & Ronald D. Schrimpf. (2010). Single event transient pulse width measurements in a 65-nm bulk CMOS technology at elevated temperatures. 763–767. 14 indexed citations
12.
Jagannathan, S., Matthew J. Gadlage, B. L. Bhuva, et al.. (2010). Independent Measurement of SET Pulse Widths From N-Hits and P-Hits in 65-nm CMOS. IEEE Transactions on Nuclear Science. 49 indexed citations
13.
Ahlbin, Jonathan R., Matthew J. Gadlage, Dennis R. Ball, et al.. (2010). The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process. IEEE Transactions on Nuclear Science. 87 indexed citations
14.
Mahatme, N. N., Indranil Chatterjee, B. L. Bhuva, et al.. (2010). Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies. 1031–1035. 34 indexed citations
15.
Ahlbin, Jonathan R., Matthew J. Gadlage, N. M. Atkinson, et al.. (2010). Effect of multiple-transistor charge collection on SET pulse widths. 198–202. 6 indexed citations
16.
Casey, Megan C., Rajan Arora, M. King, et al.. (2009). Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power. IEEE Transactions on Nuclear Science. 56(6). 3262–3266. 10 indexed citations
17.
Gadlage, Matthew J., Jonathan R. Ahlbin, Balaji Narasimham, et al.. (2009). The effect of elevated temperature on digital single event transient pulse widths in a bulk CMOS technology. 51. 170–173. 13 indexed citations
18.
Amusan, Oluwole A., L. W. Massengill, M.P. Baze, et al.. (2009). Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process. IEEE Transactions on Device and Materials Reliability. 9(2). 311–317. 57 indexed citations
19.
Amusan, Oluwole A., L. W. Massengill, M.P. Baze, et al.. (2008). Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process. 468–472. 22 indexed citations
20.
Ahlbin, Jonathan R., Jeffrey D. Black, L. W. Massengill, et al.. (2008). C-CREST Technique for Combinational Logic SET Testing. IEEE Transactions on Nuclear Science. 55(6). 3347–3351. 35 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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