Michael Lee McLain

707 total citations
32 papers, 533 citations indexed

About

Michael Lee McLain is a scholar working on Electrical and Electronic Engineering, Cellular and Molecular Neuroscience and Computational Mechanics. According to data from OpenAlex, Michael Lee McLain has authored 32 papers receiving a total of 533 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 5 papers in Cellular and Molecular Neuroscience and 2 papers in Computational Mechanics. Recurrent topics in Michael Lee McLain's work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Radiation Effects in Electronics (12 papers). Michael Lee McLain is often cited by papers focused on Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Radiation Effects in Electronics (12 papers). Michael Lee McLain collaborates with scholars based in United States, Switzerland and Canada. Michael Lee McLain's co-authors include Hugh Barnaby, Ivan Sanchez Esqueda, Ronald D. Schrimpf, Philippe C. Adell, L. Gonella, Daniel M. Fleetwood, F. Faccio, M.P. Baze, J.L. Wert and Keith E. Holbert and has published in prestigious journals such as Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and IEEE Transactions on Nuclear Science.

In The Last Decade

Michael Lee McLain

28 papers receiving 485 citations

Peers

Michael Lee McLain

EEE

CMN

NHEP

P. Asenov United Kingdom

G.H. Johnson United States

A. Tanabe Japan

P. Candelier France

Adri J. Mierop Netherlands

J.P. Tero Netherlands

F.T. Brady United States

Thomas Gerard United Kingdom

J. Miyamoto Japan

Zixuan Sun China

P. Asenov United Kingdom

Michael Lee McLain

230 ×0.4

EEE

15 ×0.4

41 ×1.5

CMN

16 ×0.8

16 ×0.9

NHEP

Citations per year, relative to Michael Lee McLain Michael Lee McLain (= 1×) peers P. Asenov

Countries citing papers authored by Michael Lee McLain

Since Specialization

Citations

This map shows the geographic impact of Michael Lee McLain's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Lee McLain with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Lee McLain more than expected).

Fields of papers citing papers by Michael Lee McLain

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael Lee McLain. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Lee McLain. The network helps show where Michael Lee McLain may publish in the future.

Co-authorship network of co-authors of Michael Lee McLain

This figure shows the co-authorship network connecting the top 25 collaborators of Michael Lee McLain. A scholar is included among the top collaborators of Michael Lee McLain based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael Lee McLain. Michael Lee McLain is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ashby, David S., György Vizkelethy, Matthew Marinella, et al.. (2021). Identification of localized radiation damage in power MOSFETs using EBIC imaging. Applied Physics Letters. 118(20). 1 indexed citations

Xiao, T. Patrick, Edward S. Bielejec, György Vizkelethy, et al.. (2021). Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose. IEEE Transactions on Nuclear Science. 68(5). 724–732. 17 indexed citations

Rodrigues, Arun, Dolores Black, Jeffrey D. Black, et al.. (2021). Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors. IEEE Transactions on Nuclear Science. 68(5). 980–990. 4 indexed citations

Barnaby, Hugh, Lawrence T. Clark, John Brunhaver, et al.. (2021). Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies. IEEE Transactions on Nuclear Science. 68(5). 671–676. 5 indexed citations

Rodrigues, Arun, Dolores Black, J. D. Black, et al.. (2020). Multiscale System Modeling of Single Event Induced Faults in Advanced Node Processors.. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information).

Jacobs-Gedrim, Robin, Michael Lee McLain, Hugh Barnaby, et al.. (2018). Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects. IEEE Transactions on Nuclear Science. 66(1). 69–76. 4 indexed citations

McLain, Michael Lee, et al.. (2017). Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs. IEEE Transactions on Nuclear Science. 1–1. 19 indexed citations

McLain, Michael Lee, et al.. (2016). Effects of process variation on radiation-induced edge leakage currents in n-channel MOSFETs. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 1–5. 2 indexed citations

McLain, Michael Lee, et al.. (2015). Play Directing.

10.

Hughart, David Russell, Andrew J. Lohn, Patrick R. Mickel, et al.. (2014). Radiation-induced resistance changes in TaO<inf>x</inf> and TiO<inf>2</inf> memristors. 60. 1–11. 6 indexed citations

11.

Hughart, David Russell, Jose L Pacheco, Andrew J. Lohn, et al.. (2014). Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in <formula formulatype="inline"> <tex Notation="TeX">${\rm TaO}_{\rm x}$</tex></formula> Memristors. IEEE Transactions on Nuclear Science. 61(6). 2965–2971. 6 indexed citations

12.

McLain, Michael Lee, et al.. (2013). Effects of High Dose Rate Ionizing Radiation on Fused Silica and Sapphire Films. IEEE Transactions on Nuclear Science. 60(6). 4116–4121. 1 indexed citations

13.

Hughart, David Russell, Andrew J. Lohn, Patrick R. Mickel, et al.. (2013). A Comparison of the Radiation Response of ${\rm TaO}_{\rm x}$ and ${\rm TiO}_2$ Memristors. IEEE Transactions on Nuclear Science. 60(6). 4512–4519. 38 indexed citations

14.

Miri, Mehdi & Michael Lee McLain. (2012). ELECTROMAGNETIC RADIATION FROM UNBALANCED TRANSMISSION LINES. Progress In Electromagnetics Research B. 43. 129–150. 3 indexed citations

15.

Ascough, Richard S., et al.. (2010). Responses to Hugh Heclo's On Thinking Institutionally. Teaching Theology & Religion. 13(3). 272–284. 2 indexed citations

16.

McLain, Michael Lee, et al.. (2009). Reliability of high performance standard two-edge and radiation hardened by design enclosed geometry transistors. 174–179. 18 indexed citations

17.

Esqueda, Ivan Sanchez, Hugh Barnaby, Michael Lee McLain, et al.. (2009). Modeling the Radiation Response of Fully-Depleted SOI n-Channel MOSFETs. IEEE Transactions on Nuclear Science. 56(4). 2247–2250. 31 indexed citations

18.

Barnaby, Hugh, et al.. (2008). Modeling ionizing radiation effects in solid state materials and CMOS devices. 273–280. 15 indexed citations

19.

Barnaby, Hugh, Michael Lee McLain, & Ivan Sanchez Esqueda. (2007). Total-ionizing-dose effects on isolation oxides in modern CMOS technologies. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 261(1-2). 1142–1145. 39 indexed citations

20.

McLain, Michael Lee, Michael J. Campola, Ivan Sanchez Esqueda, & Hugh Barnaby. (2005). Modeling "Dog Bone" Gate Geometry n-Channel MOSFETs. PJ2–1. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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