J.L. Wert
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics
Papers in
-
- VLSI and Analog Circuit Testing 6
-
- Radiation Effects in Electronics 24
- Semiconductor materials and devices 10
- Integrated Circuits and Semiconductor Failure Analysis 6
- Low-power high-performance VLSI design 5
- Electrostatic Discharge in Electronics 3
- Co-authors
- D.L. ObergE. NormandS.A. WenderPaweł MajewskiM.P. BazeL. W. MassengillArthur F. WitulskiPaul L. Voss
- Journals
- IEEE Transactions on Nuclear Science (17 papers)OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (1 paper)NASA STI Repository (National Aeronautics and Space Administration) (1 paper)
- Partner nations
- United StatesRussiaGermany
In The Last Decade
J.L. Wert
26 papers receiving 753 citations
Peers
Comparison fields: 5 of 36
- Hardware and Architecture 253
- Electrical and Electronic Engineering 803
- Radiation 72
- Safety, Risk, Reliability and Quality 38
- Nuclear and High Energy Physics 45
Countries citing papers authored by J.L. Wert
This map shows the geographic impact of J.L. Wert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.L. Wert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.L. Wert more than expected).
Fields of papers citing papers by J.L. Wert
This network shows the impact of papers produced by J.L. Wert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.L. Wert. The network helps show where J.L. Wert may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.L. Wert, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Team Update on North American Proton Facilities for Radiation Testing | 2016 | 2 |
| 2 | 2015 | 5 | |
| 3 | 2011 | 13 | |
| 4 | 2010 | 9 | |
| 5 | First record of single event upset on the ground, Cray-1 computer memory at Los Alamos in 1976 | 2010 | 1 |
| 6 | 2008 | 44 | |
| 7 | 2006 | 51 | |
| 8 | 2005 | 93 | |
| 9 | 2005 | 5 | |
| 10 | 2005 | 3 | |
| 11 | 2002 | 5 | |
| 12 | 2002 | 15 | |
| 13 | 2002 | 17 | |
| 14 | 2002 | 15 | |
| 15 | 1997 | 73 | |
| 16 | 1996 | 86 | |
| 17 | 1995 | 9 | |
| 18 | 1994 | 60 | |
| 19 | 1988 | 12 | |
| 20 | 1987 | 81 |
About J.L. Wert
J.L. Wert is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Safety, Risk, Reliability and Quality and Automotive Engineering, having authored 27 papers that have together received 824 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (24 papers), Semiconductor materials and devices (10 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), VLSI and Analog Circuit Testing (6 papers), Low-power high-performance VLSI design (5 papers), Radiation Therapy and Dosimetry (5 papers), Electrostatic Discharge in Electronics (3 papers) and Radiation Detection and Scintillator Technologies (3 papers). The work is most often cited by research in Hardware and Architecture (253 citations), Electrical and Electronic Engineering (803 citations), Radiation (72 citations), Safety, Risk, Reliability and Quality (38 citations) and Nuclear and High Energy Physics (45 citations). J.L. Wert has collaborated with scholars based in United States, Russia and Germany. Frequent co-authors include D.L. Oberg, E. Normand, S.A. Wender, Paweł Majewski, M.P. Baze, L. W. Massengill, Arthur F. Witulski, Paul L. Voss, Oluwole A. Amusan and A. Gavron. Their work appears in journals such as IEEE Transactions on Nuclear Science, OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) and NASA STI Repository (National Aeronautics and Space Administration).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.