M.P. Baze

1.6k citations

31 papers · 1.3k indexed · h-index 18

Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing 8
- Physical Unclonable Functions (PUFs) and Hardware Security 2
Electrical and Electronic Engineering top 5%
- Integrated Circuits and Semiconductor Failure Analysis 19
- Radiation Effects in Electronics 19
- Semiconductor materials and devices 18
- Electrostatic Discharge in Electronics 8
- Advancements in Semiconductor Devices and Circuit Design 6
- Low-power high-performance VLSI design 5
Radiation top 10%
Safety, Risk, Reliability and Quality top 10%
Nuclear and High Energy Physics

Co-authors: S. Büchner Dale McMorrow A.H. Johnston L. W. Massengill Oluwole A. Amusan B. L. Bhuva Joseph S. Melinger David J. Brown
Cited by: Hardware and Architecture Electrical and Electronic Engineering Radiation
Journals: IEEE Transactions on Nuclear Science (22 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)
Partner nations: United States France Canada

In The Last Decade

M.P. Baze

30 papers receiving 1.2k citations

Peers

Countries citing papers authored by M.P. Baze

Since Specialization

Citations

This map shows the geographic impact of M.P. Baze's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.P. Baze with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.P. Baze more than expected).

Fields of papers citing papers by M.P. Baze

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.P. Baze. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.P. Baze. The network helps show where M.P. Baze may publish in the future.

Co-authorship network

The 25 scholars most cited alongside M.P. Baze, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M.P. Baze Line = papers co-authored together M.P. Baze links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process IEEE Transactions on Device and Materials Reliability ·Oluwole A. Amusan,L. W. Massengill,M.P. Baze,B. L. Bhuva,Arthur F. Witulski,Gisele Karine Santos de Souza,A. Balasubramanian,Megan C. Casey,Dolores Black,Jonathan R. Ahlbin,Robert A. Reed,Michael W. McCurdy	2009	57
2	Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry IEEE Transactions on Nuclear Science ·Kevin M. Warren,A. Sternberg,Robert A. Weller,M.P. Baze,赵志星,Robert A. Reed,Marcus H. Mendenhall,Ronald D. Schrimpf	2008	42
3	Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing IEEE Transactions on Device and Materials Reliability ·Oluwole A. Amusan,L. W. Massengill,M.P. Baze,Andrew L. Sternberg,達也中村,B. L. Bhuva,Jeffrey D. Black	2008	91
4	Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process Oluwole A. Amusan,L. W. Massengill,M.P. Baze,B. L. Bhuva,Arthur F. Witulski,Jeffrey D. Black,A. Balasubramanian,Megan C. Casey,Dolores Black,Jonathan R. Ahlbin,Robert A. Reed,Michael W. McCurdy	2008	22
5	Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing Oluwole A. Amusan,Syskin German,達也中村,B. L. Bhuva,Jeffrey D. Black,M.P. Baze,L. W. Massengill	2007	48
6	Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing IEEE Transactions on Nuclear Science ·Oluwole A. Amusan,赵志星,M.P. Baze,B. L. Bhuva,Arthur F. Witulski,Sandeepan DasGupta,Andrew L. Sternberg,Patrick R. Fleming,Yumika Ogasawara,Michael L. Alles	2007	81
7	Propagating SET Characterization Technique for Digital CMOS Libraries IEEE Transactions on Nuclear Science ·M.P. Baze,J.L. Wert,Fabio Canzian da Silva,O Tetrel,Arthur F. Witulski,Oluwole A. Amusan,L. W. Massengill,Dale McMorrow	2006	51
8	HBD layout isolation techniques for multiple node charge collection mitigation IEEE Transactions on Nuclear Science ·Jeffrey D. Black,Andrew L. Sternberg,Michael L. Alles,Arthur F. Witulski,B. L. Bhuva,L. W. Massengill,J.M. Benedetto,M.P. Baze,J.L. Wert,O Tetrel	2005	93
9	Laser-Induced Latchup Screening and Mitigation in CMOS Devices Dale McMorrow,S. Büchner,M.P. Baze,Bavaro Simona Lucia,Richard B. Katz,Martha V. O'Bryan,C. Poivey,Kenneth A. LaBel,Ray Ladbury,М. А. Дубова,F.W. Sexton	2005	3
10	Confirmation of calculated error rates in a logic circuit using a pulsed laser S. Büchner,Joseph S. Melinger,Dale McMorrow,M.P. Baze,F. Simon	2002	1
11	A rad-hard analog CMOS cell library Carl F. Meier,Gad Perry,choi shin hyoung,Robert Priseman,A. Jadhav T.,M.P. Baze,Viktoriia Glazyrina	2002	1
12	A digital CMOS design technique for SEU hardening IEEE Transactions on Nuclear Science ·M.P. Baze,S. Büchner,Dale McMorrow	2000	98
13	Attenuation of single event induced pulses in CMOS combinational logic IEEE Transactions on Nuclear Science ·M.P. Baze,S. Büchner	1997	125
14	Automated radiation hard ASIC design tool IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Magda Lipka Falck,Bavaro Simona Lucia,M.P. Baze	1993	1
15	A comparison of methods for total dose testing of bulk CMOS and CMOS/SOS devices IEEE Transactions on Nuclear Science ·M.P. Baze,J.P. Boutonnet,A.H. Johnston	1990	17
16	Dose dependence of interface traps in gate oxides at high levels of total dose IEEE Transactions on Nuclear Science ·M.P. Baze,J.P. Boutonnet,A. H. Johnson	1989	16
17	The effect of circuit topology on radiation-induced latchup IEEE Transactions on Nuclear Science ·A.H. Johnston,J.P. Boutonnet,M.P. Baze	1989	12
18	A distributed model for radiation-induced latchup IEEE Transactions on Nuclear Science ·J.P. Boutonnet,M.P. Baze,A.H. Johnston	1988	11
19	Latchup Paths in Bipolar Integrated Circuits IEEE Transactions on Nuclear Science ·M.P. Baze,A.H. Johnston	1986	9
20	Mechanisms for the Latchup Window Effect in Integrated Circuits IEEE Transactions on Nuclear Science ·A.H. Johnston,M.P. Baze	1985	25

About M.P. Baze

M.P. Baze is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Ceramics and Composites, Computational Mechanics and Biomedical Engineering, having authored 31 papers that have together received 1.3k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (19 papers), Radiation Effects in Electronics (19 papers), Semiconductor materials and devices (18 papers), Electrostatic Discharge in Electronics (8 papers), VLSI and Analog Circuit Testing (8 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers), Low-power high-performance VLSI design (5 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (2 papers). The work is most often cited by research in Hardware and Architecture (642 citations), Electrical and Electronic Engineering (1.2k citations), Radiation (45 citations), Safety, Risk, Reliability and Quality (30 citations) and Nuclear and High Energy Physics (31 citations). M.P. Baze has collaborated with scholars based in United States, France and Canada. Frequent co-authors include S. Büchner, Dale McMorrow, A.H. Johnston, L. W. Massengill, Oluwole A. Amusan, B. L. Bhuva, Joseph S. Melinger, David J. Brown, Jeffrey D. Black and Arthur F. Witulski. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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