J.M. Palau

2.1k citations

79 papers · 1.7k indexed · h-index 24

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 2%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics

Papers in

Hardware and Architecture 12
- VLSI and Analog Circuit Testing 10
Surfaces, Coatings and Films 9
- Electron and X-Ray Spectroscopy Techniques 9

Co-authors: G. Bruguier M.-C. Calvet J. Gasiot L. Lassabatère C. Dachs Abu Bakar Md. Ismail F. Wrobel G. Hubert
Journals: IEEE Transactions on Nuclear Science (34 papers)Surface Science (9 papers)Thin Solid Films (4 papers)Solid-State Electronics (4 papers)Journal of Applied Physics (2 papers)
Partner nations: France United States Israel

In The Last Decade

J.M. Palau

79 papers receiving 1.6k citations

Peers

Countries citing papers authored by J.M. Palau

Since Specialization

Citations

This map shows the geographic impact of J.M. Palau's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Palau with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Palau more than expected).

Fields of papers citing papers by J.M. Palau

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.M. Palau. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Palau. The network helps show where J.M. Palau may publish in the future.

Co-authors

The 25 scholars most cited alongside J.M. Palau, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.M. Palau Line = papers co-authored together J.M. Palau links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Determination of the deposited energy in a silicon volume by n-Si nuclear interaction Journal of Applied Physics ·Corrado Magnani, J.-R. Vaillé, Audrey Lauer, Frédéric Saigné, L. Dusseau, M. Dumas, J.M. Palau, Hyowook Chiang, J.L. Decossas, F. Wrobel, N. Buard, Irenis Abad Ramírez	2006	8
2	DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section IEEE Transactions on Nuclear Science ·Tristan Dreisbach, G. Hubert, 知子中村, N. Buard, T. Carrière, L G Navar, J.M. Palau, Frédéric Saigné, R. Gaillard	2006	13
3	A review of DASIE code family: contribution to SEU/MBU understanding G. Hubert, N. Buard, Tristan Dreisbach, Jérôme Loizillon, Irenis Abad Ramírez, J.M. Palau, Damien Lambert, Ganesh R. Jagadale, F. Wrobel, 宏之富澤, R. Gaillard	2005	26
4	Comparison of NMOS and PMOS transistor sensitivity to SEU in SRAMs by device simulation IEEE Transactions on Nuclear Science ·Zhou Renyun, B. Sagnes, Frédéric Saigné, J.M. Palau, M.-C. Calvet, P.E. Dodd, F.W. Sexton	2003	9
5	Simulation of heavy ion latchup cross section curves A. G. SUTULO, G. Bruguier, J.M. Palau, J. Gasiot, R. Ecoffet	2002	1
6	Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections IEEE Transactions on Nuclear Science ·F. Wrobel, J.M. Palau, M.-C. Calvet, O. Bersillon, Aisaule Kuntugankyzy	2001	68
7	Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs IEEE Transactions on Nuclear Science ·G. Hubert, J.M. Palau, Helen Miglys Diniz Silva, M.-C. Calvet, M. Wanneveich	2001	47
8	Study of Vehicle Attitude Effect on Shuttle Radiation Measurements NASA Technical Reports Server (NASA) ·Nicolas Guillet, E. G. Stassinopoulos, Ihsan Bayu Merdeka, M. Dumas, J.M. Palau, M.-C. Calvet	2001	1
9	Cell design modifications to harden an N-channel power IGBT against single event latchup IEEE Transactions on Nuclear Science ·E. Lorfèvre, Paul Stief, G. Bruguier, J.M. Palau, J. Gasiot, M.-C. Calvet, R. Ecoffet	1999	5
10	SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domain IEEE Transactions on Nuclear Science ·Ph. Roche, J.M. Palau, Fry We, G. Bruguier, R. Ecoffet, J. Gasiot	1998	47
11	SEU critical charge and sensitive area in a submicron CMOS technology IEEE Transactions on Nuclear Science ·C. Detcheverry, C. Dachs, E. Lorfèvre, C. Sudre, G. Bruguier, J.M. Palau, J. Gasiot, R. Ecoffet	1997	60
12	Single particle-induced latchup IEEE Transactions on Nuclear Science ·G. Bruguier, J.M. Palau	1996	101
13	Application of Device Simulations to Radiation Hardening Studies C. Sudre, C. Dachs, A. G. SUTULO, 藤松信義, G. Bruguier, Tereza Cristina de Brito Azevedo, J.M. Palau, J. Gasiot	1995	1
14	Evidence of the ion's impact position effect on SEB in N-channel power MOSFETs IEEE Transactions on Nuclear Science ·C. Dachs, 藤松信義, J.M. Palau, G. Bruguier, J. Gasiot, Ngan Ngoc. Chau	1994	56
15	Experimental and 2D simulation study of the single-event burnout in N-channel power MOSFETs IEEE Transactions on Nuclear Science ·藤松信義, C. Dachs, J.M. Palau, J. Gasiot, Ngan Ngoc. Chau	1993	53
16	GaAs (110)–oxygen interaction: A study of electronic properties Journal of Applied Physics ·Abu Bakar Md. Ismail, J.M. Palau, L. Lassabatère	1986	10
17	Comparison between GaAs(110) and InP(110) surface properties induced by cleavage defects and by oxygen adsorption Surface Science Letters ·Abu Bakar Md. Ismail, Sishmita Tamang, J.M. Palau, L. Lassabatère	1985	12
18	Electron beam effect on GaAs real surfaces and on AgGaAs schottky diodes Surface Science ·Abu Bakar Md. Ismail, J.M. Palau, Klaus Rauter, L. Lassabatère	1985	6
19	Chemical etching and annealing induced GaAs(100) surface properties Applications of Surface Science ·Abu Bakar Md. Ismail, J.M. Palau, L. Lassabatère	1984	13
20	Propriétés des surfaces de GaAs (110) clivées induites par l'oxygéne et la température — contribution aux caractéristiques des diodes Schottky Revue de Physique Appliquée ·Abu Bakar Md. Ismail, J.M. Palau, L. Lassabatère	1984	3

About J.M. Palau

J.M. Palau is a scholar working on Hardware and Architecture, Surfaces, Coatings and Films, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation, having authored 79 papers that have together received 1.7k indexed citations. Recurring topics across this work include Semiconductor materials and devices (42 papers), Radiation Effects in Electronics (36 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Semiconductor materials and interfaces (19 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), VLSI and Analog Circuit Testing (10 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and Surface and Thin Film Phenomena (8 papers). The work is most often cited by research in Hardware and Architecture (451 citations), Electrical and Electronic Engineering (1.6k citations), Radiation (99 citations), Surfaces, Coatings and Films (63 citations) and Atomic and Molecular Physics, and Optics (251 citations). J.M. Palau has collaborated with scholars based in France, United States and Israel. Frequent co-authors include G. Bruguier, M.-C. Calvet, J. Gasiot, L. Lassabatère, C. Dachs, Abu Bakar Md. Ismail, F. Wrobel, G. Hubert, R. Ecoffet and Ph. Roche. Their work appears in journals such as IEEE Transactions on Nuclear Science, Surface Science, Thin Solid Films, Solid-State Electronics and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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