Rita Fung
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 14
-
- Integrated Circuits and Semiconductor Failure Analysis 21
- Radiation Effects in Electronics 21
- Semiconductor materials and devices 20
- Electrostatic Discharge in Electronics 12
- Low-power high-performance VLSI design 11
- Advancements in Semiconductor Devices and Circuit Design 8
-
- Copper Interconnects and Reliability 6
- Co-authors
- Shi-Jie WenRichard WongB. L. BhuvaLi ChenHaibin WangSanghyeon BaegJ. S. KauppilaL. W. Massengill
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringNuclear Energy and Engineering
- Journals
- IEEE Transactions on Nuclear Science (15 papers)Electronics (1 paper)Microelectronics Reliability (2 papers)
- Partner nations
- United StatesChinaCanada
In The Last Decade
Rita Fung
41 papers receiving 298 citations
Peers
Comparison fields: 5 of 27
- Hardware and Architecture 122
- Electrical and Electronic Engineering 305
- Nuclear Energy and Engineering 2
- Electronic, Optical and Magnetic Materials 36
- Radiation 6
Countries citing papers authored by Rita Fung
This map shows the geographic impact of Rita Fung's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rita Fung with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rita Fung more than expected).
Fields of papers citing papers by Rita Fung
This network shows the impact of papers produced by Rita Fung. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rita Fung. The network helps show where Rita Fung may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Rita Fung, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2024 | 2 | |
| 3 | 2024 | 0 | |
| 4 | 2024 | 0 | |
| 5 | 2023 | 3 | |
| 6 | 2023 | 5 | |
| 7 | 2023 | 1 | |
| 8 | 2023 | 1 | |
| 9 | 2023 | 1 | |
| 10 | 2021 | 14 | |
| 11 | 2021 | 18 | |
| 12 | Electromigration-Induced Bit-Error-Rate Degradation of Interconnect Signal Paths Characterized from a 16nm Test Chip | 2021 | 3 |
| 13 | 2020 | 4 | |
| 14 | 2019 | 1 | |
| 15 | 2019 | 3 | |
| 16 | 2018 | 9 | |
| 17 | 2017 | 8 | |
| 18 | 2016 | 22 | |
| 19 | 2015 | 6 | |
| 20 | 2014 | 2 |
About Rita Fung
Rita Fung is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 44 papers that have together received 316 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (21 papers), Radiation Effects in Electronics (21 papers), Semiconductor materials and devices (20 papers), VLSI and Analog Circuit Testing (14 papers), Electrostatic Discharge in Electronics (12 papers), Low-power high-performance VLSI design (11 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers) and Copper Interconnects and Reliability (6 papers). The work is most often cited by research in Hardware and Architecture (122 citations), Electrical and Electronic Engineering (305 citations) and Nuclear Energy and Engineering (2 citations). Rita Fung has collaborated with scholars based in United States, China and Canada. Frequent co-authors include Shi-Jie Wen, Richard Wong, B. L. Bhuva, Li Chen, Haibin Wang, Sanghyeon Baeg, J. S. Kauppila, L. W. Massengill, Jingchen Cao and Chris H. Kim. Their work appears in journals such as IEEE Transactions on Nuclear Science, Electronics and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.