T. D. Haeffner
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in PLL and VCO Technologies
- Radio Frequency Integrated Circuit Design
Papers in
-
- Radiation Effects in Electronics 18
- Semiconductor materials and devices 14
- Advancements in Semiconductor Devices and Circuit Design 11
- Integrated Circuits and Semiconductor Failure Analysis 5
- Low-power high-performance VLSI design 4
- Radio Frequency Integrated Circuit Design 3
- Electrostatic Discharge in Electronics 3
-
- VLSI and Analog Circuit Testing 10
- Co-authors
- L. W. Massengill (21 shared papers)J. S. Kauppila (21 shared papers)Dennis R. Ball (15 shared papers)En Xia Zhang (14 shared papers)B. L. Bhuva (11 shared papers)Michael L. Alles (14 shared papers)T. D. Loveless (6 shared papers)W.T. Holman (6 shared papers)
- Partner nations
- United StatesItaly
In The Last Decade
T. D. Haeffner
21 papers receiving 323 citations
Peers
Comparison fields: 5 of 15
- Hardware and Architecture 123
- Electrical and Electronic Engineering 329
- Statistics, Probability and Uncertainty 4
- Radiation 4
- Safety, Risk, Reliability and Quality 3
Countries citing papers authored by T. D. Haeffner
This map shows the geographic impact of T. D. Haeffner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. D. Haeffner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. D. Haeffner more than expected).
Fields of papers citing papers by T. D. Haeffner
This network shows the impact of papers produced by T. D. Haeffner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. D. Haeffner. The network helps show where T. D. Haeffner may publish in the future.
Co-authors
The 25 scholars most cited alongside T. D. Haeffner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 60 | |
| 2 | 2012 | 38 | |
| 3 | 2017 | 28 | |
| 4 | 2019 | 23 | |
| 5 | 2017 | 21 | |
| 6 | 2013 | 19 | |
| 7 | 2018 | 17 | |
| 8 | 2015 | 17 | |
| 9 | 2007 | 16 | |
| 10 | 2016 | 16 | |
| 11 | 2017 | 14 | |
| 12 | 2017 | 13 | |
| 13 | 2017 | 11 | |
| 14 | 2019 | 10 | |
| 15 | 2019 | 9 | |
| 16 | 2014 | 8 | |
| 17 | 2020 | 5 | |
| 18 | 2022 | 5 | |
| 19 | 2021 | 3 | |
| 20 | 2019 | 1 |
About T. D. Haeffner
T. D. Haeffner is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Infectious Diseases, Organic Chemistry and Surgery, having authored 23 papers that have together received 335 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (18 papers), Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Low-power high-performance VLSI design (4 papers), Radio Frequency Integrated Circuit Design (3 papers) and Electrostatic Discharge in Electronics (3 papers). The work is most often cited by research in Hardware and Architecture (123 citations), Electrical and Electronic Engineering (329 citations), Statistics, Probability and Uncertainty (4 citations), Radiation (4 citations) and Safety, Risk, Reliability and Quality (3 citations). T. D. Haeffner has collaborated with scholars based in United States and Italy. Frequent co-authors include L. W. Massengill, J. S. Kauppila, Dennis R. Ball, En Xia Zhang, B. L. Bhuva, Michael L. Alles, T. D. Loveless, W.T. Holman, Daniel M. Fleetwood and S. Jagannathan. Their work appears in journals such as IEEE Transactions on Nuclear Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.