S. Kuboyama

1.5k total citations
72 papers, 1.2k citations indexed

About

S. Kuboyama is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, S. Kuboyama has authored 72 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 71 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in S. Kuboyama's work include Semiconductor materials and devices (47 papers), Radiation Effects in Electronics (46 papers) and Integrated Circuits and Semiconductor Failure Analysis (32 papers). S. Kuboyama is often cited by papers focused on Semiconductor materials and devices (47 papers), Radiation Effects in Electronics (46 papers) and Integrated Circuits and Semiconductor Failure Analysis (32 papers). S. Kuboyama collaborates with scholars based in Japan, Belgium and United States. S. Kuboyama's co-authors include Sumio Matsuda, Takashi Tamura, Toshio Hirao, H. Shindou, Eiichi Mizuta, H. Ohyama, Hiroshi Abe, Y. Iwata, T. Hirao and N. Ikeda and has published in prestigious journals such as Applied Physics Letters, Sensors and Actuators B Chemical and Thin Solid Films.

In The Last Decade

S. Kuboyama

66 papers receiving 1.1k citations

Peers

Countries citing papers authored by S. Kuboyama

Since Specialization

Citations

This map shows the geographic impact of S. Kuboyama's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Kuboyama with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Kuboyama more than expected).

Fields of papers citing papers by S. Kuboyama

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Kuboyama. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Kuboyama. The network helps show where S. Kuboyama may publish in the future.

Co-authorship network of co-authors of S. Kuboyama

This figure shows the co-authorship network connecting the top 25 collaborators of S. Kuboyama. A scholar is included among the top collaborators of S. Kuboyama based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Kuboyama. S. Kuboyama is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Characteristic Charge Collection Mechanism Observed in FinFET SRAM Cells 2022 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), (unknown), (unknown), Takashi Kato, (unknown), Akinori Takeyama, Takeshi Ohshima, S. Kuboyama, (unknown)	7
2	Single-Event Effects Induced on Atom Switch-based Field-Programmable Gate Array 2019 ·IEEE Transactions on Nuclear Science ·(unknown), Toshitsugu Sakamoto, Munehiro Tada, Akinori Takeyama, Takeshi Ohshima, S. Kuboyama, H. Shindou	5
3	Radiation Test Results in Newly Developed Super-Junction Power MOSFETs 2018 ·Eiichi Mizuta, (unknown), S. Kuboyama, Masasi Inoue, (unknown), (unknown), (unknown), (unknown), H. Shindou	1
4	Applicability of Redundant Pairs of SOI Transistors for Analog Circuits and Their Applications to Phase-Locked Loop Circuits 2013 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), Y. Tsuchiya, (unknown), Hiroshi Abe, H. Shindou, (unknown), (unknown), (unknown), S. Kuboyama, Takashi Tamura	6
5	Rediscovery of Single-Event Gate Rupture Mechanism in Power MOSFETs 2012 ·IEEE Transactions on Nuclear Science ·S. Kuboyama, (unknown), Eiichi Mizuta, Hiroshi Abe, Toshio Hirao, Takashi Tamura	5
6	Single-Event Damages Caused by Heavy Ions Observed in AlGaN/GaN HEMTs 2011 ·IEEE Transactions on Nuclear Science ·S. Kuboyama, (unknown), H. Shindou, (unknown), Toshio Hirao, Hiroshi Abe, Takashi Tamura	75
7	Effects of electron and proton irradiation on embedded SiGe source/drain diodes 2008 ·Materials Science in Semiconductor Processing ·H. Ohyama, (unknown), (unknown), (unknown), Kazuya Matsuo, Hiroki Nakamura, M. SAWADA, (unknown), S. Kuboyama, Mireia Bargalló González, Eddy Simoen, Cor Claeys	3
8	Improvement of the tolerance to total ionizing dose in SOI CMOS 2008 ·(unknown), (unknown), H. Shindou, (unknown), S. Kuboyama, Jiro Ida	3
9	New SET Characterization Technique Using SPICE for Fully Depleted CMOS/SOI Digital Circuitry 2008 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), Y. Tsuchiya, Yoshiharu AMANO, H. Shindou, (unknown), Yuji Takahashi, S. Kuboyama	14
10	Single-Event Burnout of Silicon Carbide Schottky Barrier Diodes Caused by High Energy Protons 2007 ·IEEE Transactions on Nuclear Science ·S. Kuboyama, (unknown), (unknown), Toshio Hirao, H. Ohyama	58
11	Radiation damages of GaAlAs LEDs by 70-MeV proton and 2-MeV electron irradiation 2007 ·Journal of Materials Science Materials in Electronics ·H. Ohyama, (unknown), (unknown), (unknown), S. Kuboyama, (unknown), E. Simoen, C. Claeys	0
12	Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation 2007 ·Physica B Condensed Matter ·(unknown), (unknown), H. Ohyama, S. Kuboyama, Eddy Simoen, A. Mercha, C. Claeys	4
13	Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity 2005 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), Tatsuya Yamaguchi, (unknown), (unknown), Y. Tsuchiya, (unknown), (unknown), H. Shindou, S. Kuboyama, Sumio Matsuda	40
14	Radiation damages of InGaAs photodiodes by high-temperature electron irradiation 2004 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·H. Ohyama, (unknown), (unknown), T. Hirao, Shinobu Onoda, Tomihiro Kamiya, E. Simoen, Cor Claeys, S. Kuboyama, Kaori Oka, Sumio Matsuda	2
15	Single-event burnout of Super-junction power MOSFETs 2004 ·IEEE Transactions on Nuclear Science ·N. Ikeda, S. Kuboyama, Sumio Matsuda	25
16	A nondamaging beam blanking SEM test method and its application to highly integrated devices 2001 ·IEEE Transactions on Nuclear Science ·(unknown), S. Kuboyama, Sumio Matsuda, Natsuki Nemoto, (unknown), (unknown), Shunsuke Baba, (unknown)	1
17	Single-event burnout of epitaxial bipolar transistors 1998 ·IEEE Transactions on Nuclear Science ·S. Kuboyama, K. Sugimoto, (unknown), Sumio Matsuda, T. Hirao	11
18	A radiation-hardened 32-bit microprocessor based on the commercial CMOS process 1994 ·IEEE Transactions on Nuclear Science ·S. Yoshioka, Hiroshi Kamimura, Mitsuyoshi Akiyama, Mitsuhiro Nakamura, Takashi Tamura, S. Kuboyama	8
19	Identification of soft-error sensitive junction in SRAM's using a single ion microprobe 1994 ·IEEE Electron Device Letters ·Takashi Matsukawa, (unknown), Koh Matsumoto, (unknown), (unknown), Makoto Goto, Sumio Matsuda, S. Kuboyama, Iwao Ohdomari	8
20	The measurement and prediction of proton upset 1989 ·IEEE Transactions on Nuclear Science ·(unknown), T. Goka, S. Kuboyama, K Kawachi, (unknown), Y. Takami	27

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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