David del Rio

583 total citations
61 papers, 400 citations indexed

About

David del Rio is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, David del Rio has authored 61 papers receiving a total of 400 indexed citations (citations by other indexed papers that have themselves been cited), including 59 papers in Electrical and Electronic Engineering, 15 papers in Surfaces, Coatings and Films and 8 papers in Biomedical Engineering. Recurrent topics in David del Rio's work include Radio Frequency Integrated Circuit Design (25 papers), Advancements in Photolithography Techniques (24 papers) and Microwave Engineering and Waveguides (18 papers). David del Rio is often cited by papers focused on Radio Frequency Integrated Circuit Design (25 papers), Advancements in Photolithography Techniques (24 papers) and Microwave Engineering and Waveguides (18 papers). David del Rio collaborates with scholars based in Spain, Belgium and Netherlands. David del Rio's co-authors include Juan F. Sevillano, Roc Berenguer, Vladimir Ermolov, Héctor Solar, Antti Lamminen, Andrea Mazzanti, Jussi Säily, Igone Vélez, L. Pain and Werner Gillijns and has published in prestigious journals such as IEEE Transactions on Microwave Theory and Techniques, IEEE Transactions on Instrumentation and Measurement and IEEE Sensors Journal.

In The Last Decade

David del Rio

58 papers receiving 382 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David del Rio Spain 12 369 62 54 49 25 61 400
Martin McCallum United States 11 309 0.8× 101 1.6× 20 0.4× 77 1.6× 7 0.3× 57 359
Rodney Kendall Australia 8 258 0.7× 71 1.1× 43 0.8× 52 1.1× 7 0.3× 20 287
Koen van Ingen Schenau Netherlands 10 318 0.9× 119 1.9× 8 0.1× 152 3.1× 18 0.7× 28 339
M.W. Beranek United States 10 203 0.6× 43 0.7× 9 0.2× 19 0.4× 3 0.1× 52 278
Choon Sik Cho South Korea 12 537 1.5× 47 0.8× 381 7.1× 10 0.2× 10 0.4× 78 577
K.G. Nair India 12 323 0.9× 21 0.3× 386 7.1× 33 0.7× 14 0.6× 53 440
Futoshi Kuroki Japan 9 356 1.0× 38 0.6× 184 3.4× 7 0.1× 11 0.4× 126 378
Ruey‐Bing Hwang Taiwan 12 207 0.6× 55 0.9× 245 4.5× 11 0.2× 10 0.4× 31 358
Michiru Nishiwaki Japan 8 88 0.2× 24 0.4× 42 0.8× 22 0.4× 27 184
Jogender Nagar United States 10 215 0.6× 66 1.1× 206 3.8× 36 0.7× 5 0.2× 34 335

Countries citing papers authored by David del Rio

Since Specialization
Citations

This map shows the geographic impact of David del Rio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David del Rio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David del Rio more than expected).

Fields of papers citing papers by David del Rio

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David del Rio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David del Rio. The network helps show where David del Rio may publish in the future.

Co-authorship network of co-authors of David del Rio

This figure shows the co-authorship network connecting the top 25 collaborators of David del Rio. A scholar is included among the top collaborators of David del Rio based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David del Rio. David del Rio is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Rio, David del, et al.. (2024). Area-Efficient SiGe BiCMOS LNA With Wideband Frequency Tuning Capability Across D and G Bands. IEEE Transactions on Circuits and Systems I Regular Papers. 72(3). 1114–1125.
2.
Rio, David del, et al.. (2024). EUV OPC modeling of dry photoresist system for pitch 32nm BEOL. 18–18.
3.
Rio, David del, et al.. (2024). Benefits of using advanced sub-resolution features for 0.55NA brightfield imaging. 12–12. 1 indexed citations
4.
Kaplan, Christopher J., Jeff Zhiqiang Lu, Michael Crouse, et al.. (2023). Physical dose modeling and throughput optimization in EUV computational lithography. 19–19. 1 indexed citations
5.
Rio, David del, et al.. (2023). SDR-Based Monostatic Chipless RFID Reader With Vector Background Subtraction Capabilities. IEEE Transactions on Instrumentation and Measurement. 72. 1–14. 2 indexed citations
6.
Rio, David del, et al.. (2023). Area-Efficient and Wideband Input Stages for SiGe BiCMOS G-Band LNAs. 17–20. 1 indexed citations
7.
Franke, Joern-Holger, Andreas Frommhold, Natalia Davydova, et al.. (2021). Metal layer single EUV expose at pitch 28: how bright field and NTD resist advantages align. 27–27. 8 indexed citations
8.
Roux, Pierre, David del Rio, Juan F. Sevillano, et al.. (2021). SiGe:BiCMOS technology is enabling D-band link with Active Phased Antenna Array. 496–501. 10 indexed citations
9.
Rio, David del, et al.. (2021). Extending 0.33 NA EUVL to 28 nm pitch using alternative mask and controlled aberrations. 29–29. 3 indexed citations
10.
Solar, Héctor, et al.. (2020). A 21 m Operation Range RFID Tag for “Pick to Light” Applications with a Photovoltaic Harvester. Micromachines. 11(11). 1013–1013. 8 indexed citations
11.
Rio, David del, Joern-Holger Franke, Mircea Dusa, et al.. (2018). EUV pupil optimization for 32nm pitch logic structures. 10143. 66–66. 2 indexed citations
12.
13.
14.
Rio, David del, et al.. (2017). 67‐90 GHz broadband power detector with 3 GHz output bandwidth for on‐chip test of millimeter‐wave circuits. International Journal of Circuit Theory and Applications. 46(3). 366–374. 1 indexed citations
15.
Rio, David del, et al.. (2017). EUV local CDU healing performance and modeling capability towards 5nm node. 10149. 43–43. 1 indexed citations
16.
Rio, David del, Sook Lee, Thomas I. Wallow, et al.. (2017). Compact 2D OPC modeling of a metal oxide EUV resist for a 7nm node BEOL layer. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10143. 101431E–101431E. 1 indexed citations
17.
Rio, David del, et al.. (2014). Impact of AC Coupling on Zero-IF Architectures for Wide-Band Millimeter-Wave Gigabit Transmitters. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1–6. 5 indexed citations
18.
Gillijns, Werner, Peter De Bisschop, David del Rio, et al.. (2013). OPC resist model separability validation after SMO source change. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8683. 86831B–86831B. 1 indexed citations
19.
Rio, David del, Werner Gillijns, Jinling Wang, et al.. (2013). Imaging challenges in 20nm and 14nm logic nodes: hot spots performance in Metal1 layer. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8886. 88860N–88860N. 2 indexed citations
20.
Rio, David del, et al.. (2010). 5 kV multielectron beam lithography: MAPPER tool and resist process characterization. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(6). C6C14–C6C20. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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