Jan Mulkens
- Electrical and Electronic Engineering top 10%
- Biomedical Engineering
- Surfaces, Coatings and Films top 5%
- Mechanical Engineering
- Computational Mechanics
- Co-authors
- Paul HinnenDonis G. FlagelloJos BenschopChristian WagnerFred de JongJo FindersPaul GräupnerH. Bakker
- Topics
- Advancements in Photolithography Techniques (43 papers)Advanced Surface Polishing Techniques (19 papers)Integrated Circuits and Semiconductor Failure Analysis (15 papers)
- Journals
- Annual Review of Materials ResearchIEEE Transactions on Semiconductor ManufacturingJournal of Micro/Nanolithography MEMS and MOEMS
- Partner nations
- NetherlandsGermanyBelgium
In The Last Decade
Jan Mulkens
46 papers receiving 423 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 401
- Biomedical Engineering 218
- Surfaces, Coatings and Films 127
- Mechanical Engineering 68
- Computational Mechanics 45
Countries citing papers authored by Jan Mulkens
This map shows the geographic impact of Jan Mulkens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jan Mulkens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jan Mulkens more than expected).
Fields of papers citing papers by Jan Mulkens
This network shows the impact of papers produced by Jan Mulkens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jan Mulkens. The network helps show where Jan Mulkens may publish in the future.
Co-authorship network of co-authors of Jan Mulkens
This figure shows the co-authorship network connecting the top 25 collaborators of Jan Mulkens. A scholar is included among the top collaborators of Jan Mulkens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jan Mulkens. Jan Mulkens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 2 | |
| 3 | 31 | |
| 4 | 4 | |
| 5 | 3 | |
| 6 | 2 | |
| 7 | 5 | |
| 8 | 4 | |
| 9 | 36 | |
| 10 | 5 | |
| 11 | 18 | |
| 12 | Latest developments on immersion exposure systems - art. no. 69241P | 1 |
| 13 | 7 | |
| 14 | 8 | |
| 15 | 2 | |
| 16 | 9 | |
| 17 | 30 | |
| 18 | 9 | |
| 19 | 8 | |
| 20 | 13 |
About Jan Mulkens
Jan Mulkens is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Biomedical Engineering, having authored 47 papers that have together received 467 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (43 papers), Advanced Surface Polishing Techniques (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). The work is most often cited by research in Surfaces, Coatings and Films (127 citations), Electrical and Electronic Engineering (401 citations) and Biomedical Engineering (218 citations). Jan Mulkens has collaborated with scholars based in Netherlands, Germany and Belgium. Frequent co-authors include Paul Hinnen, Donis G. Flagello, Jos Benschop, Christian Wagner, Fred de Jong, Jo Finders, Paul Gräupner, H. Bakker, Toralf Gruner and Youping Zhang. Their work appears in journals such as Annual Review of Materials Research, IEEE Transactions on Semiconductor Manufacturing and Journal of Micro/Nanolithography MEMS and MOEMS.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.