P.K. Ko

4.5k citations

89 papers · 3.3k indexed · 2 hit papers · h-index 27

Impact in

Electrical and Electronic Engineering top 1%
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
- Ferroelectric and Negative Capacitance Devices
- Electrostatic Discharge in Electronics
Hardware and Architecture top 5%

Papers in

Electrical and Electronic Engineering 84
- Semiconductor materials and devices 76
- Advancements in Semiconductor Devices and Circuit Design 72
- Silicon Carbide Semiconductor Technologies 25
- Integrated Circuits and Semiconductor Failure Analysis 16
- Ferroelectric and Negative Capacitance Devices 7
- Thin-Film Transistor Technologies 6
- Electrostatic Discharge in Electronics 5
- Low-power high-performance VLSI design 4
Biomedical Engineering 11

Co-authors: Chenming Hu Kuo-Hsiang Hung B.J. Sheu Yingchun Cheng M.-C. Jeng T.Y. Chan D.L. Scharfetter J.E. Chung
Journals: IEEE Electron Device Letters (18 papers)IEEE Transactions on Electron Devices (16 papers)IEEE Journal of Solid-State Circuits (4 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (4 papers)Applied Physics Letters (2 papers)
Partner nations: United States Hong Kong Italy

In The Last Decade

P.K. Ko

81 papers receiving 3.1k citations

Hit Papers

align trajectories log scale

A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors 1990 · 654 citations

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if any of the following hold:

it has ≥500 total citations;
it reaches ≥1.5× the top-1% citation threshold for papers in the same subfield and year (the threshold is the minimum needed to enter the top 1%, not the average within it);
it reaches the top citation threshold in at least one of its specific research topics.

1990 IEEE Transactions on Electron Devices
1987 IEEE Journal of Solid-State Circuits

Peers

Countries citing papers authored by P.K. Ko

Since Specialization

Citations

This map shows the geographic impact of P.K. Ko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.K. Ko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.K. Ko more than expected).

Fields of papers citing papers by P.K. Ko

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.K. Ko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.K. Ko. The network helps show where P.K. Ko may publish in the future.

Co-authorship network

The 25 scholars most cited alongside P.K. Ko, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P.K. Ko Line = papers co-authored together P.K. Ko links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	The evolution of fabless IC industry in China: Past, present, and future Rare & Special e-Zone (The Hong Kong University of Science and Technology) ·P.K. Ko, C. Patrick Yue	2012	2
2	Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs J.E. Chung, M.-C. Jeng, J.E. Moon, P.K. Ko, C. Hu	2003	0
3	The effects of off-axis substrate orientation on MOSFET characteristics J.E. Chung, Anne Heitmann, M. E. Levi, P.K. Ko, C. Hu	2003	0
4	A deep-submicrometer raised source/drain LDD structure fabricated using hot-wall epitaxy Rare & Special e-Zone (The Hong Kong University of Science and Technology) ·J.E. Moon, Antonio Calandriello, Ludwig Philipp, M. Wong, W.G. Oldham, P.K. Ko, C. Hu	2002	1
5	A dynamic threshold voltage MOSFET (DTMOS) for ultra-low voltage operation F. Assaderaghi, D. Sinitsky, S. Parke, Jeffrey Bokor, P.K. Ko, Chenming Hu	2002	118
6	A novel high-gain CMOS image sensor using floating N-well/gate tied PMOSFET Weiquan Zhang, Mansun Chan, P.K. Ko	1998	4
7	The impact of device scaling and power supply change on CMOS gate performance IEEE Electron Device Letters ·Kai Chen, Masao Nitoh, P.K. Ko, Chenming Hu	1996	49
8	Narrow width effect of ROSIE isolated SOI MOSFET Rare & Special e-Zone (The Hong Kong University of Science and Technology) ·S.K.H. Fung, Mansun Chan, Syin Chan, P.K. Ko	1995	2
9	A charge conserving non-quasi-state (NQS) MOSFET model for SPICE transient analysis IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Bo-Young Jeong, P.K. Ko, Chenming Hu	1991	22
10	Hot-carrier effects in depletion-mode MOSFETs Solid-State Electronics ·T.C. Ong, P.K. Ko, C. Hu	1989	2
11	Low-Voltage Hot-Electron Currents and Degradation in Deep-Submicrometer MOSFETs Reliability physics ·Jong Won Chung, M.-C. Jeng, J.E. Moon, P.K. Ko, Chenming Hu	1989	2
12	Oxides grown on textured single-crystal silicon for enhanced conduction Applied Physics Letters ·John Leslie Knight, A.T. Wu, P.K. Ko, C. Hu	1988	5
13	Eeproms as analog storage devices for neural nets Neural Networks ·VANDA OLIVEIRA, P.K. Ko	1988	7
14	Recovery of threshold voltage after hot-carrier stressing IEEE Transactions on Electron Devices ·T.C. Ong, M. E. Levi, P.K. Ko, Chenming Hu	1988	21
15	Modeling of substrate current in p-MOSFET's IEEE Electron Device Letters ·T.C. Ong, P.K. Ko, Chenming Hu	1987	16
16	50-Å gate-Oxide MOSFET's at 77 K IEEE Transactions on Electron Devices ·坂口顕, P.K. Ko, Chenming Hu	1987	35
17	BSIM: Berkeley short-channel IGFET model for MOS transistors IEEE Journal of Solid-State Circuits ·B.J. Sheu, D.L. Scharfetter, P.K. Ko, M.-C. Jeng Hit paper breakdown →	1987	407
18	Short-channel effects on MOS transistor capacitances IEEE Transactions on Circuits and Systems ·B.J. Sheu, P.K. Ko	1986	1
19	A simple method to determine channel widths for conventional and LDD MOSFET's IEEE Electron Device Letters ·B.J. Sheu, P.K. Ko	1984	51
20	Digital NMOS test circuits fabricated in silicon MBE IEEE Electron Device Letters ·R.G. Swartz, G.M. Chin, Minaji, P.K. Ko, B.A. Wooley, R P WALKER, Ladilson Clemente Pedro Da Cunha	1984	3

About P.K. Ko

P.K. Ko is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Ceramics and Composites, Atomic and Molecular Physics, and Optics and Media Technology, having authored 89 papers that have together received 3.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (76 papers), Advancements in Semiconductor Devices and Circuit Design (72 papers), Silicon Carbide Semiconductor Technologies (25 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Ferroelectric and Negative Capacitance Devices (7 papers), Thin-Film Transistor Technologies (6 papers), Electrostatic Discharge in Electronics (5 papers) and Low-power high-performance VLSI design (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (3.2k citations), Hardware and Architecture (160 citations), Biomedical Engineering (429 citations), Atomic and Molecular Physics, and Optics (188 citations) and Bioengineering (26 citations). P.K. Ko has collaborated with scholars based in United States, Hong Kong and Italy. Frequent co-authors include Chenming Hu, Kuo-Hsiang Hung, B.J. Sheu, Yingchun Cheng, M.-C. Jeng, T.Y. Chan, D.L. Scharfetter, J.E. Chung, Yuhua Cheng and Ralf Meyer. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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