Karen E. Petrillo

1.8k citations
133 papers · 1.5k · h-index 19

Impact in

Papers in

Karen E. Petrillo

121 papers receiving 1.4k citations

Peers

Karen E. Petrillo
Comparison fields: 5 of 49
  • Surfaces, Coatings and Films 378
  • Electrical and Electronic Engineering 1.3k
  • Biomedical Engineering 467
  • Condensed Matter Physics 84
  • Hardware and Architecture 43
Replace Manish Chandhok with:
Manish Chandhok United States
Anthony Yen United States
Jo Finders Netherlands
Tomoaki Kawamura Japan
Laurent Souriau Belgium
Geert Hellings Belgium
Patrick J. McMarr United States
W. W. Molzen United States
Eelco van Setten Netherlands
Shichang Zou China
Karen E. Petrillo relative to Manish Chandhok United States Manish Chandhok's profile →
Citations per field
00.5×1.5×2×2.3×
Manish Chandhok · 1×
Citations per year

Countries citing papers authored by Karen E. Petrillo

Since Specialization
Citations

This map shows the geographic impact of Karen E. Petrillo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Karen E. Petrillo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Karen E. Petrillo more than expected).

Fields of papers citing papers by Karen E. Petrillo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Karen E. Petrillo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Karen E. Petrillo. The network helps show where Karen E. Petrillo may publish in the future.

Co-authors

The 25 scholars most cited alongside Karen E. Petrillo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Karen E. Petrillo Line = papers co-authored together Karen E. Petrillo links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 133 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200298
2 200897
3 199190
4 199287
5 200483
6 199479
7 200942
8 200838
9 198537
10 200131
11 201230
12 200827
13 200725
14 201623
15 200322
16 199320
17 201120
18 198119
19 198619
20 200019

About Karen E. Petrillo

Karen E. Petrillo is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials and Industrial and Manufacturing Engineering, having authored 133 papers that have together received 1.5k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (113 papers), Integrated Circuits and Semiconductor Failure Analysis (65 papers), Electron and X-Ray Spectroscopy Techniques (51 papers), Semiconductor materials and devices (26 papers), Advanced Surface Polishing Techniques (20 papers), Nanofabrication and Lithography Techniques (19 papers), Copper Interconnects and Reliability (15 papers) and Advancements in Semiconductor Devices and Circuit Design (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (378 citations), Electrical and Electronic Engineering (1.3k citations), Biomedical Engineering (467 citations), Condensed Matter Physics (84 citations) and Hardware and Architecture (43 citations). Karen E. Petrillo has collaborated with scholars based in United States, Japan and Netherlands. Frequent co-authors include Marie Angelopoulos, Maria Alejandra Quiñonez Sánchez, David E. Seeger, Chiew-Seng Koay, Ratnam Sooriyakumaran, Philip J. Oldiges, Arpan P. Mahorowala, Michael J. Hargrove, Meikei Ieong and Robert L. Brainard. Their work appears in journals such as Journal of Photopolymer Science and Technology, IEEE Transactions on Electron Devices, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Micro/Nanolithography MEMS and MOEMS and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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