Manish Chandhok
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 24
- Optical Coatings and Gratings 4
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- Advancements in Photolithography Techniques 41
- Integrated Circuits and Semiconductor Failure Analysis 28
- Semiconductor materials and devices 8
- Radiation top 10%
- Advanced X-ray Imaging Techniques 3
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- Advanced Surface Polishing Techniques 5
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- Adaptive optics and wavefront sensing 4
- Co-authors
- Bryan J. RiceTodd R. YounkinHeidi B. CaoE. Steve PutnaChristopher K. OberWang YuehSang H. LeeJ. M. Roberts
- Journals
- Journal of Photopolymer Science and Technology (2 papers)Microelectronic Engineering (1 paper)ACS Nano (1 paper)
- Partner nations
- United StatesJapanUnited Kingdom
In The Last Decade
Manish Chandhok
51 papers receiving 593 citations
Peers
Comparison fields: 5 of 31
- Surfaces, Coatings and Films 249
- Electrical and Electronic Engineering 597
- Radiation 43
- Biomedical Engineering 182
- Computational Mechanics 61
Countries citing papers authored by Manish Chandhok
This map shows the geographic impact of Manish Chandhok's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Manish Chandhok with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Manish Chandhok more than expected).
Fields of papers citing papers by Manish Chandhok
This network shows the impact of papers produced by Manish Chandhok. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Manish Chandhok. The network helps show where Manish Chandhok may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Manish Chandhok, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 3 | |
| 2 | 2011 | 5 | |
| 3 | 2011 | 5 | |
| 4 | 2011 | 6 | |
| 5 | 2009 | 5 | |
| 6 | 2009 | 8 | |
| 7 | 2008 | 17 | |
| 8 | 2008 | 30 | |
| 9 | 2008 | 2 | |
| 10 | 2008 | 4 | |
| 11 | 2007 | 24 | |
| 12 | 2006 | 14 | |
| 13 | 2005 | 7 | |
| 14 | 2004 | 25 | |
| 15 | 2004 | 5 | |
| 16 | 2004 | 4 | |
| 17 | 2004 | 20 | |
| 18 | 2004 | 11 | |
| 19 | 2003 | 9 | |
| 20 | 2002 | 1 |
About Manish Chandhok
Manish Chandhok is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation, having authored 51 papers that have together received 666 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (41 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Electron and X-Ray Spectroscopy Techniques (24 papers), Semiconductor materials and devices (8 papers), Advanced Surface Polishing Techniques (5 papers), Adaptive optics and wavefront sensing (4 papers), Optical Coatings and Gratings (4 papers) and Advanced X-ray Imaging Techniques (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (249 citations), Electrical and Electronic Engineering (597 citations) and Radiation (43 citations). Manish Chandhok has collaborated with scholars based in United States, Japan and United Kingdom. Frequent co-authors include Bryan J. Rice, Todd R. Younkin, Heidi B. Cao, E. Steve Putna, Christopher K. Ober, Wang Yueh, Sang H. Lee, J. M. Roberts, Sang Hun Lee and Michael Goldstein. Their work appears in journals such as Journal of Photopolymer Science and Technology, Microelectronic Engineering, ACS Nano, IEEE Transactions on Plasma Science and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.