J. Mandelman
- Hardware and Architecture top 10%
-
- Advancements in Semiconductor Devices and Circuit Design 17
- Semiconductor materials and devices 17
- Integrated Circuits and Semiconductor Failure Analysis 4
- Low-power high-performance VLSI design 3
- Silicon Carbide Semiconductor Technologies 3
- Ferroelectric and Negative Capacitance Devices 3
- Silicon and Solar Cell Technologies 2
- Electrostatic Discharge in Electronics 2
J. Mandelman
17 papers receiving 304 citations
Peers
Comparison fields: 5 of 32
- Hardware and Architecture 76
- Electrical and Electronic Engineering 263
- Computer Networks and Communications 64
- Information Systems 18
- Cognitive Neuroscience 11
Countries citing papers authored by J. Mandelman
This map shows the geographic impact of J. Mandelman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Mandelman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Mandelman more than expected).
Fields of papers citing papers by J. Mandelman
This network shows the impact of papers produced by J. Mandelman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Mandelman. The network helps show where J. Mandelman may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Mandelman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 2 | |
| 2 | 2003 | 5 | |
| 3 | 2003 | 2 | |
| 4 | 2003 | 2 | |
| 5 | 2002 | 0 | |
| 6 | 2002 | 183 | |
| 7 | 2002 | 5 | |
| 8 | 2002 | 6 | |
| 9 | 2002 | 1 | |
| 10 | 2002 | 0 | |
| 11 | 1998 | 12 | |
| 12 | 1997 | 11 | |
| 13 | A Novel 1Gb Trench DRAM Cell With Raised Shallow Trench Isolation (RSTI) | 1997 | 0 |
| 14 | 1996 | 3 | |
| 15 | 1994 | 12 | |
| 16 | 1993 | 27 | |
| 17 | 1992 | 11 | |
| 18 | 1990 | 23 | |
| 19 | 1990 | 14 | |
| 20 | 1989 | 4 |
About J. Mandelman
J. Mandelman is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Electronic, Optical and Magnetic Materials, having authored 20 papers that have together received 323 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (17 papers), Semiconductor materials and devices (17 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Low-power high-performance VLSI design (3 papers), Silicon Carbide Semiconductor Technologies (3 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Silicon and Solar Cell Technologies (2 papers) and Electrostatic Discharge in Electronics (2 papers). The work is most often cited by research in Hardware and Architecture (76 citations), Electrical and Electronic Engineering (263 citations) and Computer Networks and Communications (64 citations). J. Mandelman has collaborated with scholars based in United States, Italy and France. Frequent co-authors include J. DeBrosse, R.H. Dennard, R. Divakaruni, G. Bronner, Y. Li, C. Radens, Wilfried Haensch, A. Bryant, G. Shahidi and F. Assaderaghi. Their work appears in journals such as IEEE Electron Device Letters, IBM Journal of Research and Development, Applied Physics Letters, Solid-State Electronics and Journal of Electrostatics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.