M. Gall

483 citations
43 papers · 331 indexed · h-index 11

Impact in

Papers in

    • Copper Interconnects and Reliability 31
    • Electronic Packaging and Soldering Technologies 26
    • Semiconductor materials and devices 25
    • Integrated Circuits and Semiconductor Failure Analysis 8
    • 3D IC and TSV technologies 5
    • Advancements in Semiconductor Devices and Circuit Design 5
    • Radio Frequency Integrated Circuit Design 3

M. Gall

38 papers receiving 310 citations

Peers

M. Gall
Comparison fields: 5 of 31
  • Electronic, Optical and Magnetic Materials 228
  • Electrical and Electronic Engineering 311
  • Hardware and Architecture 21
  • Mechanics of Materials 32
  • Atomic and Molecular Physics, and Optics 30
Replace M. Shinosky with:
M. Shinosky United States
Patrick Justison United States
R. Schulz United States
Oliver Aubel Germany
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E.T. Ogawa United States
Meike Hauschildt Germany
Geraldine Jamieson Belgium
K. Vandersmissen Belgium
M. Gall relative to M. Shinosky United States M. Shinosky's profile →
Citations per field
00.5×
M. Shinosky · 1×
Citations per year

Countries citing papers authored by M. Gall

Since Specialization
Citations

This map shows the geographic impact of M. Gall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Gall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Gall more than expected).

Fields of papers citing papers by M. Gall

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Gall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Gall. The network helps show where M. Gall may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Gall, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Gall Line = papers co-authored together M. Gall links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201346
2 200146
3 200735
4 199718
5 200417
6 200015
7 200615
8 201811
9 200611
10 202111
11 199810
12 20048
13 19997
14 20146
15 20186
16 20026
17 20085
18 19985
19 19985
20 19995

About M. Gall

M. Gall is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Mechanics of Materials and Automotive Engineering, having authored 43 papers that have together received 331 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (31 papers), Electronic Packaging and Soldering Technologies (26 papers), Semiconductor materials and devices (25 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), 3D IC and TSV technologies (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Radio Frequency Integrated Circuit Design (3 papers) and Metal and Thin Film Mechanics (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (228 citations), Electrical and Electronic Engineering (311 citations), Hardware and Architecture (21 citations), Mechanics of Materials (32 citations) and Atomic and Molecular Physics, and Optics (30 citations). M. Gall has collaborated with scholars based in United States, Germany and France. Frequent co-authors include H. Kawasaki, Paul S. Ho, Meike Hauschildt, D. Jawarani, C. Capasso, Ehrenfried Zschech, Patrick Justison, Ch. S. N. Murthy, C. Hennesthal and Oliver Aubel. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Microelectronic Engineering and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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