J. Holt

1.2k citations

40 papers · 482 indexed · h-index 11

Co-authors: Conal E. Murray Martin V. Holt S. O. Hruszkewycz P. H. Fuoss S. T. Ceyer Virginie Chamard Ian McNulty J. Bruley
Topics: Semiconductor materials and devices (21 papers)Advancements in Semiconductor Devices and Circuit Design (14 papers)Integrated Circuits and Semiconductor Failure Analysis (11 papers)
Cited by: Structural Biology Radiation Electrical and Electronic Engineering
Journals: Physical Review Letters The Journal of Chemical Physics Nature Materials
Partner nations: United States Germany France

In The Last Decade

J. Holt

38 papers receiving 465 citations

Peers

Countries citing papers authored by J. Holt

Since Specialization

Citations

This map shows the geographic impact of J. Holt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Holt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Holt more than expected).

Fields of papers citing papers by J. Holt

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Holt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Holt. The network helps show where J. Holt may publish in the future.

Co-authorship network of co-authors of J. Holt

This figure shows the co-authorship network connecting the top 25 collaborators of J. Holt. A scholar is included among the top collaborators of J. Holt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Holt. J. Holt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	415/610GHz f_T/f_MAX SiGe HBTs Integrated in a 45nm PDSOI BiCMOS process 2022 ·2022 International Electron Devices Meeting (IEDM) ·Vibhor Jain,John J. Pekarik,(unknown),J. Holt,Chris Durcan,Jeffrey B. Johnson,Sudesh Saroop,(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),Alvin Joseph	8
2	SiGe HBTs with ${f_{T}/f_{\max}\,\sim\,375/510GHz}$ Integrated in 45nm PDSOI CMOS 2021 ·John J. Pekarik,Vibhor Jain,(unknown),J. Holt,(unknown),Sudesh Saroop,Jeffrey B. Johnson,(unknown),(unknown),Christopher Durcan,(unknown),(unknown),Sangameshwar Rao Saudari,(unknown),(unknown),Alvin Joseph	6
3	Advanced Process Control (APC) for Selective EPI process in 300mm Fab 2020 ·Hongying Peng,(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),(unknown),C. Gaire,J. Holt,G. Braithwaite,Dali Shao,(unknown)	0
4	Full structure transistor process monitoring of boron and germanium in PFET EPI using in-line XPS 2019 ·Jusang Lee,Ganesh Subramanian,(unknown),(unknown),J. Holt,C. Gaire,Paul K. Isbester,(unknown)	1
5	Characterization of atomic layer deposited low-k spacer for FDSOI high-k metal gate transistor 2017 ·Dina H. Triyoso,(unknown),K. Hempel,H.J. Tao,Fabian M. Koehler,Laegu Kang,A. Senthil Kumar,(unknown),J. Holt,(unknown),(unknown),Frank Ludwig,(unknown),J. Kluth,(unknown)	3
6	High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography 2016 ·Nature Materials ·S. O. Hruszkewycz,(unknown),Martin V. Holt,Conal E. Murray,J. Holt,P. H. Fuoss,Virginie Chamard	78
7	In-Situ Boron Doped SiGe Epitaxy Optimization for FinFET Source/Drain 2016 ·ECS Meeting Abstracts ·Yi Qi,(unknown),(unknown),J. Holt,(unknown),C. Gaire,(unknown),(unknown),H.Y. Yu,(unknown),(unknown)	0
8	Multitechnique metrology methods for evaluating pitch walking in 14 nm and beyond FinFETs 2014 ·Journal of Micro/Nanolithography MEMS and MOEMS ·(unknown),(unknown),(unknown),Anita Madan,(unknown),Augustin J. Hong,David Conklin,J. Holt,Todd Bailey	10
9	Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography 2014 ·Physical Review Letters ·Martin V. Holt,S. O. Hruszkewycz,Conal E. Murray,J. Holt,Deborah M. Paskiewicz,P. H. Fuoss	39
10	Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography 2012 ·Nano Letters ·S. O. Hruszkewycz,Martin V. Holt,Conal E. Murray,J. Bruley,J. Holt,A. Tripathi,Oleg Shpyrko,Ian McNulty,Matthew J. Highland,P. H. Fuoss	75
11	SIMS quantification of SiGe composition with low‐energy ion beams 2010 ·Surface and Interface Analysis ·(unknown),Paul Ronsheim,(unknown),(unknown),Anita Madan,(unknown),J. Holt,A. Reznicek	10
12	High-Performance Undoped-Body 8-nm-Thin SOI Field-Effect Transistors 2008 ·IEEE Electron Device Letters ·Amlan Majumdar,Zhibin Ren,J.W. Sleight,(unknown),J. Holt,(unknown),Steven J. Koester,Wilfried Haensch	27
13	SiGe Selective Epitaxy: Morphology and Thickness Control for High Performance CMOS Technology 2008 ·ECS Transactions ·J. Holt,(unknown),Thomas Adam,S.J. Jeng,(unknown),Rohit Pal,Hasan M. Nayfeh,(unknown),(unknown),M. W. Stoker,Abhishek Dube,D. Schepis	4
14	Systematic Characterization of Pseudomorphic (110) Intrinsic SiGe Epitaxial Films for Hybrid Orientation Technology with Embedded SiGe Source/Drain 2006 ·MRS Proceedings ·(unknown),Anita Madan,N. Klymko,Jinghong Li,Richard J. Murphy,(unknown),Robert E. Davis,Conal E. Murray,J. Holt,Siddhartha Panda,M. Ieong,(unknown)	2
15	Selective epitaxial channel ground plane thin SOI CMOS devices 2006 ·Zhibin Ren,M. Ieong,Jian Cai,J. Holt,D. Boyd,R. Mo,H. Yin,O. Dokumaci,(unknown),Takayuki Sato,P. Ronsheim,(unknown),C.Y. Sung,Wilfried Haensch	5
16	Stress and Strain Measurements in Semiconductor Device Channel Areas by Convergent Beam Electron Diffraction 2006 ·MRS Proceedings ·Jinghong Li,A. Domenicucci,D. Chidambarrao,B. Greene,(unknown),J. Holt,(unknown),(unknown)	4
17	Integration of Local Stress Techniques with Strained-Si Directly on Insulator (SSDOI) Substrates 2006 ·H. Yin,Zhibin Ren,H. Chen,J. Holt,(unknown),J.W. Sleight,K. Rim,Victor Chan,David Fried,(unknown),J. O. Chu,B. Greene,Stephen W. Bedell,G. Pfeiffer,(unknown),D. K. Sadana,T. Kanarsky,C.Y. Sung,M. Ieong,G. Shahidi	4
18	Investigation of CMOS devices with embedded sige source/drain on hybrid orientation substrates 2005 ·(unknown),Min Yang,J. Holt,Siddhartha Panda,Huajie Chen,(unknown),Massimo V. Fischetti,N. Rovedo,Jinghong Li,N. Klymko,(unknown),T. Kanarsky,G. Costrini,David Fried,A. Bryant,J. A. Ott,M. Ieong,(unknown)	20
19	Dissociation of a Product of a Surface Reaction in the Gas Phase:XeF2Reaction with Si 2004 ·Physical Review Letters ·(unknown),J. Holt,(unknown),(unknown),M. F. Bertino,S. T. Ceyer	9
20	X-ray fluorescence analysis of lead in leaves 1976 ·Journal of Radioanalytical and Nuclear Chemistry ·J.S.C. McKee,M. L. H. Wise,J. Holt,(unknown)	2

About J. Holt

J. Holt is a scholar working on Structural Biology, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 40 papers that have together received 482 indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). The work is most often cited by research in Structural Biology (103 citations), Radiation (145 citations) and Electrical and Electronic Engineering (278 citations). J. Holt has collaborated with scholars based in United States, Germany and France. Frequent co-authors include Conal E. Murray, Martin V. Holt, S. O. Hruszkewycz, P. H. Fuoss, S. T. Ceyer, Virginie Chamard, Ian McNulty, J. Bruley, A. Tripathi and Oleg Shpyrko. Their work appears in journals such as Physical Review Letters, The Journal of Chemical Physics and Nature Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact