K.F. Schuegraf
- Electrical and Electronic Engineering top 5%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Biomedical Engineering
- Topics
- Semiconductor materials and devices (10 papers)Advancements in Semiconductor Devices and Circuit Design (9 papers)Integrated Circuits and Semiconductor Failure Analysis (6 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryAtomic and Molecular Physics, and Optics
- Journals
- Journal of Applied PhysicsIEEE Transactions on Electron DevicesSemiconductor Science and Technology
- Partner nations
- United StatesItaly
In The Last Decade
K.F. Schuegraf
11 papers receiving 809 citations
Hit Papers
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 827
- Materials Chemistry 197
- Atomic and Molecular Physics, and Optics 91
- Electronic, Optical and Magnetic Materials 46
- Biomedical Engineering 37
Countries citing papers authored by K.F. Schuegraf
This map shows the geographic impact of K.F. Schuegraf's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K.F. Schuegraf with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K.F. Schuegraf more than expected).
Fields of papers citing papers by K.F. Schuegraf
This network shows the impact of papers produced by K.F. Schuegraf. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K.F. Schuegraf. The network helps show where K.F. Schuegraf may publish in the future.
Co-authorship network of co-authors of K.F. Schuegraf
This figure shows the co-authorship network connecting the top 25 collaborators of K.F. Schuegraf. A scholar is included among the top collaborators of K.F. Schuegraf based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K.F. Schuegraf. K.F. Schuegraf is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 46 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | 12 | |
| 5 | 3 | |
| 6 | 63 | |
| 7 | 101 | |
| 8 | 22 | |
| 9 | 112 | |
| 10 | Hole injection SiO/sub 2/ breakdown model for very low voltage lifetime extrapolationbreakdown → | 426 |
| 11 | 69 |
About K.F. Schuegraf
K.F. Schuegraf is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Infectious Diseases, having authored 11 papers that have together received 858 indexed citations. Recurring topics across this work include Semiconductor materials and devices (10 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (827 citations), Materials Chemistry (197 citations) and Atomic and Molecular Physics, and Optics (91 citations). K.F. Schuegraf has collaborated with scholars based in United States and Italy. Frequent co-authors include Chenming Hu, Chenming Hu, Chenming Hu, C. Hu, Chenming Hu, H. Rhodes, P. Fazan and Donggun Park. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Semiconductor Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.