C. Guérin

1.5k citations
33 papers · 926 indexed · h-index 14

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Thin-Film Transistor Technologies
    • Silicon and Solar Cell Technologies
    • Ferroelectric and Negative Capacitance Devices

Papers in

    • Semiconductor materials and devices 22
    • Advancements in Semiconductor Devices and Circuit Design 15
    • Integrated Circuits and Semiconductor Failure Analysis 12
    • Silicon and Solar Cell Technologies 7
    • Silicon Carbide Semiconductor Technologies 4
    • Thin-Film Transistor Technologies 3

C. Guérin

33 papers receiving 901 citations

Peers

C. Guérin
Comparison fields: 5 of 42
  • Electrical and Electronic Engineering 878
  • Hardware and Architecture 29
  • Materials Chemistry 188
  • Atomic and Molecular Physics, and Optics 80
  • Surfaces, Coatings and Films 9
Replace G. Pollack with:
G. Pollack United States
Lars‐Åke Ragnarsson Belgium
Chih Hang Tung Singapore
H.F. Luan United States
T. Nigam United States
Slimane Oussalah Algeria
Alexander Olbrich Germany
C. D’Emic United States
Markus Jech Austria
C. Huffman United States
C. Guérin relative to G. Pollack United States G. Pollack's profile →
Citations per field
00.5×
G. Pollack · 1×
Citations per year

Countries citing papers authored by C. Guérin

Since Specialization
Citations

This map shows the geographic impact of C. Guérin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Guérin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Guérin more than expected).

Fields of papers citing papers by C. Guérin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Guérin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Guérin. The network helps show where C. Guérin may publish in the future.

Co-authorship network

The 25 scholars most cited alongside C. Guérin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Guérin Line = papers co-authored together C. Guérin links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20246
2 20192
3 2011231
4 20116
5 201020
6 20104
7 20102
8 2009113
9 2008110
10 20087
11 20077
12 20076
13
Newcharacterization andmodeling approach forNBTIdegradation fromtransistor toproduct level
20071
14 20071
15 200794
16 20072
17 200727
18 200622
19 200611
20 199518

About C. Guérin

C. Guérin is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Materials Chemistry, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 33 papers that have together received 926 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Silicon and Solar Cell Technologies (7 papers), Silicon Carbide Semiconductor Technologies (4 papers), Thin-Film Transistor Technologies (3 papers), Semiconductor materials and interfaces (3 papers) and Silicon Nanostructures and Photoluminescence (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (878 citations), Hardware and Architecture (29 citations), Materials Chemistry (188 citations), Atomic and Molecular Physics, and Optics (80 citations) and Surfaces, Coatings and Films (9 citations). C. Guérin has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include A. Bravaix, V. Huard, Vincent Huard, C. Parthasarathy, B. Strahm, D. Lachenal, Christophe Ballif, Loris Barraud, Jakub Holovský and Zachary C. Holman. Their work appears in journals such as Microelectronic Engineering, Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Applied Physics Letters and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026