E. Liniger

701 citations

26 papers · 509 indexed · h-index 14

Electronic, Optical and Magnetic Materials top 10%
- Copper Interconnects and Reliability 18
Condensed Matter Physics top 10%
- Physics of Superconductivity and Magnetism 2
Electrical and Electronic Engineering top 10%
- Electronic Packaging and Soldering Technologies 10
- Semiconductor materials and devices 10
- Integrated Circuits and Semiconductor Failure Analysis 2
Mechanics of Materials top 10%
- Metal and Thin Film Mechanics 8
Structural Biology
Radiation
- X-ray Spectroscopy and Fluorescence Analysis 3
- Advanced X-ray Imaging Techniques 2

Co-authors: David R. Clarke I. C. Noyan Jean Jordan‐Sweet S. Kaldor L. Gignac Michael Lane T. M. Shaw Pinhe Wang
Cited by: Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering
Journals: Applied Physics Letters (3 papers)Review of Scientific Instruments (1 paper)Journal of the American Ceramic Society (1 paper)
Partner nations: United States Switzerland Japan

In The Last Decade

E. Liniger

26 papers receiving 491 citations

Peers

Countries citing papers authored by E. Liniger

Since Specialization

Citations

This map shows the geographic impact of E. Liniger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Liniger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Liniger more than expected).

Fields of papers citing papers by E. Liniger

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Liniger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Liniger. The network helps show where E. Liniger may publish in the future.

Co-authorship network

The 25 scholars most cited alongside E. Liniger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. Liniger Line = papers co-authored together E. Liniger links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Experimental study of nanoscale Co damascene BEOL interconnect structures James J. Kelly,Edward W. Hessler,Huai Huang,C.‐K. Hu,E. Liniger,R. Patlolla,B. Peethala,Praneet Adusumilli,H. Shobha,T. Nogami,T. Spooner,E. Huang,D. Edelstein,D. Canaperi,V. Kamineni,Frank W. Mont,S. Siddiqui	2016	43
2	Pre-liner dielectric nitridation for resistance reduction in copper interconnects C.-C. Yang,T. Spooner,J. Finno,Rezky Ramdhany Senjaya,P. McLaughlin,Chunhua Hu,E. Liniger,川田昭孝,D. Canaperi,Ines Ben Hlima,E. Huang,D. Edelstein	2016	4
3	Microstructure, impurity and metal cap effects on Cu electromigration AIP conference proceedings ·Chao Hu,Utomo Langgeng Prayitno,Joan Brough,Chris Breslin,E‐Wen Huang,Griselda Bonilla,E. Liniger,R. Rosenberg,Clifford B. U,A. Simon	2014	8
4	Reliability challenges for the 10nm node and beyond J. H. Stathis,Brenda Luu,Richard G. Southwick,Ernest Y. Wu,B.P. Linder,E. Liniger,Griselda Bonilla,H. Kothari	2014	28
5	Materials and scaling effects on on-chip interconnect reliability MRS Proceedings ·C.‐K. Hu,E. Liniger,L. Gignac,Griselda Bonilla,D. Edelstein	2013	11
6	Robust low-k film with sub-nm pores and high carbon content for highly reliable Cu/low-k BEOL modules N. Inoue,豊和久保,Fuminori Ito,Hironori Yamamoto,J. Kawahara,山際勝也,H. Shobha,S. James Gates,Sidney Cohen,E. Liniger,Anita Madan,J.M. Dolan,E. Todd Ryan,Jan Vinke,M. Ueki,Y. Hayashi,T. Spooner	2012	1
7	Ultrathin (5-35 nm) SiCNH Dielectrics for Damascene Cu Cap Application: Thickness Scaling and Oxidation Barrier Performance Limitation ECS Transactions ·S. Nguyen,Amédée le Faure,T. M. Shaw,S. Molis,A.A. Konyschev,Eeva-Liisa Miettinen,Hadeel N. M. Salloum,H. Shobha,E. Liniger,Chunhua Hu,Griselda Bonilla,N. Klymko,A. Grill	2010	3
8	Electromigration Challenges for Nanoscale Cu Wiring AIP conference proceedings ·Chao Hu,L. Gignac,E. Liniger,E. Huang,Iain Orr,P. McLaughlin,C.-C. Yang,J. Demarest,Paul S. Ho,Ehrenfried Zschech,Shinichi Ogawa	2009	12
9	Development and optimization of porous pSiCOH interconnect dielectrics for 45 nm and beyond A. Grill,S. James Gates,Christos Dimitrakopoulos,V. Patel,Sidney Cohen,Santanu Chacraverti,E. Liniger,E. Simonyi,D. Restaino,S. Sankaran,Sina Reiter,Ashwin G. Prakash,Kang Sub Yim,覃功炯,Martin Theben,Vinicius Barbosa Pujol	2008	5
10	Impact of Cu microstructure on electromigration reliability Chao Hu,L. Gignac,B. G. Baker,E. Liniger,R. Yu,P. Flaitz	2007	49
11	Chip-Package-Interaction Modeling of Ultra Low-k/Copper Back End of Line Gernot Boege,T. M. Shaw,Michael Lane,E. Liniger,Zainab Mohy AL-Fatlawy,Karin Witte-Bölt	2007	44
12	Physical, Electrical, and Reliability Characterization of Ru for Cu Interconnects Albert Schuster,T. Spooner,S. Ponoth,Kaushik Chanda,A. Simon,C. Lavoie,Michael Lane,C.‐K. Hu,E. Liniger,L. Gignac,T. M. Shaw,Sidney Cohen,F. R. McFeely,D. Edelstein	2006	30
13	Comparison of the Fracture Behavior of Brittle ILD Films used in the BEOL in Dry and Wet Environment using Nanoindentation MRS Proceedings ·E. Simonyi,Michael Lane,E. Liniger,A. Grill	2006	1
14	Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires Applied Physics Letters ·Pinhe Wang,I. C. Noyan,S. Kaldor,Jean Jordan‐Sweet,E. Liniger,D. Marx	2001	18
15	Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines Applied Physics Letters ·Pinhe Wang,I. C. Noyan,S. Kaldor,Jean Jordan‐Sweet,E. Liniger,D. Marx	2000	20
16	Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics Review of Scientific Instruments ·I. C. Noyan,Pinhe Wang,S. Kaldor,Jean Jordan‐Sweet,E. Liniger	2000	21
17	Grain Orientation Mapping and Spatially Resolved Strain Measurements for Polycrystalline Films by X-Ray Microdiffraction MRS Proceedings ·نازنین اشرفی تبار,G. S. Cargill,I. C. Noyan,E. Liniger	1995	2
18	<title>Simulations and experiments on capillary optics for x-ray microbeams</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·G. S. Cargill,Kevin Hwang,Isabella Maina,WALTER A. BRAY,E. Liniger,I. C. Noyan	1995	3
19	ENVIRONMENTAL AND SOLVENT EFFECTS ON YTTRIUM BARIUM CUPRATE (Y₁Ba₂Cu₃O_x) Advanced Ceramic Materials ·José Rafael García-Sánchez,E. Liniger,David R. Clarke	1987	30
20	Phase Compatibilities in the System Y ₂ O ₃ ‐BaO‐CuO at 950°C Journal of the American Ceramic Society ·José Rafael García-Sánchez,E. Liniger,David R. Clarke	1987	88

About E. Liniger

E. Liniger is a scholar working on Electronic, Optical and Magnetic Materials, Mechanics of Materials and Ceramics and Composites, having authored 26 papers that have together received 509 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (18 papers), Electronic Packaging and Soldering Technologies (10 papers), Semiconductor materials and devices (10 papers), Metal and Thin Film Mechanics (8 papers), X-ray Spectroscopy and Fluorescence Analysis (3 papers), Physics of Superconductivity and Magnetism (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Advanced X-ray Imaging Techniques (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (288 citations), Condensed Matter Physics (113 citations) and Electrical and Electronic Engineering (331 citations). E. Liniger has collaborated with scholars based in United States, Switzerland and Japan. Frequent co-authors include David R. Clarke, I. C. Noyan, Jean Jordan‐Sweet, S. Kaldor, L. Gignac, Michael Lane, T. M. Shaw, Pinhe Wang, Chao Hu and P. Flaitz. Their work appears in journals such as Applied Physics Letters, Review of Scientific Instruments, Journal of the American Ceramic Society, Journal of Applied Physics and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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