Matthew Wormington

789 total citations
44 papers, 597 citations indexed

About

Matthew Wormington is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, Matthew Wormington has authored 44 papers receiving a total of 597 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 12 papers in Surfaces, Coatings and Films. Recurrent topics in Matthew Wormington's work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advancements in Photolithography Techniques (7 papers) and Silicon and Solar Cell Technologies (7 papers). Matthew Wormington is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advancements in Photolithography Techniques (7 papers) and Silicon and Solar Cell Technologies (7 papers). Matthew Wormington collaborates with scholars based in United States, United Kingdom and Belgium. Matthew Wormington's co-authors include Kevin Matney, D. Keith Bowen, Charles Panaccione, D. K. Bowen, B. K. Tanner, I. Pape, T. P. A. Hase, Paul Ryan, Roger Loo and Liesbeth Witters and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Crystallography and Journal of Physics Condensed Matter.

In The Last Decade

Matthew Wormington

43 papers receiving 563 citations

Peers

Countries citing papers authored by Matthew Wormington

Since Specialization

Citations

This map shows the geographic impact of Matthew Wormington's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Matthew Wormington with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Matthew Wormington more than expected).

Fields of papers citing papers by Matthew Wormington

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Matthew Wormington. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Matthew Wormington. The network helps show where Matthew Wormington may publish in the future.

Co-authorship network of co-authors of Matthew Wormington

This figure shows the co-authorship network connecting the top 25 collaborators of Matthew Wormington. A scholar is included among the top collaborators of Matthew Wormington based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Matthew Wormington. Matthew Wormington is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Inline metrology of high aspect ratio hole tilt and center line shift using small-angle x-ray scattering 2023 ·Journal of Micro/Nanopatterning Materials and Metrology ·Peter Gin, Matthew Wormington, (unknown), (unknown), (unknown), (unknown), Kevin Matney, Jin Zhang, (unknown)	6
2	Deep learning for the analysis of x-ray scattering data from high-aspect ratio structures 2023 ·(unknown), (unknown), (unknown), (unknown), Matthew Wormington	2
3	Model-free measurement of lateral recess in gate-all-around transistors with micro hard-X-ray fluorescence 2023 ·Journal of Micro/Nanopatterning Materials and Metrology ·(unknown), Yusuke Oniki, Karine Kenis, (unknown), Hans Mertens, (unknown), (unknown), Matthew Wormington, (unknown), (unknown)	5
4	Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs 2020 ·Journal of Applied Crystallography ·Victor Boureau, (unknown), Patrice Gergaud, (unknown), Matthew Wormington, D. Rouchon, A. Claverie, (unknown), Martin Hÿtch	1
5	Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures 2017 ·Nanotechnology ·Andreas Schulze, Roger Loo, Paul Ryan, Matthew Wormington, Paola Favia, Liesbeth Witters, Nadine Collaert, H. Bender, Wilfried Vandervorst, Matty Caymax	9
6	Materials characterization for process integration of multi-channel gate all around (GAA) devices 2017 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), (unknown), (unknown), Juntao Li, Michael Guillorn, (unknown), Sivananda Kanakasabapathy, John G. Gaudiello, (unknown), Matthew Sendelbach, (unknown), (unknown), (unknown), Daniel Kandel, (unknown), (unknown), Peter Gin, Kevin Matney, Matthew Wormington	4
7	Processing Technologies for Advanced Ge Devices 2016 ·ECS Journal of Solid State Science and Technology ·Roger Loo, Andriy Hikavyy, Liesbeth Witters, Andreas Schulze, Hiroaki Arimura, Daire Cott, Jérôme Mitard, Clément Porret, Hans Mertens, Paul Ryan, (unknown), Kevin Matney, Matthew Wormington, Paola Favia, Olivier Richard, H. Bender, Aaron Thean, Naoto Horiguchi, D. Mocuta, Nadine Collaert	30
8	Benefit of combining metrology techniques for thin SiGe:B layers 2014 ·(unknown), (unknown), (unknown), F. Abbate, (unknown), Nicolas Laurent, (unknown), Matthew Wormington	0
9	Measurement of periodicity and strain in arrays of single crystal silicon and pseudomorphic Si1−xGex/Si fin structures using x-ray reciprocal space maps 2014 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·(unknown), (unknown), Jody Fronheiser, Vimal Kamineni, Matthew Wormington, Kevin Matney, Thomas Adam, Evguenia Karapetrova, Alain C. Diebold	11
10	Investigation of surface and sub‐surface damage in high quality synthetic diamonds by X‐ray reflectivity and grazing incidence in‐plane diffraction 2011 ·physica status solidi (a) ·(unknown), Tamzin Lafford, (unknown), Alain Gibaud, Dina Carbone, Tobias U. Schülli, S. H. Connell, Amparo Rommeveaux, Matthew Wormington, J. Härtwig	1
11	A Novel X-ray Diffraction and Reflectivity Tool for Front-End of Line Metrology 2011 ·AIP conference proceedings ·Matthew Wormington, (unknown), (unknown), A. Krokhmal, (unknown), Paul Ryan, (unknown), (unknown), David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M. Secula	2
12	Lateral length scales of latent image roughness as determined by off-specular neutron reflectivity 2008 ·Applied Physics Letters ·Kristopher A. Lavery, Vivek M. Prabhu, Eric K. Lin, Wen‐Li Wu, Sushil K. Satija, (unknown), Matthew Wormington	6
13	In-Line Characterization of Heterojunction Bipolar Transistor Base Layers by High-Resolution X-Ray Diffraction 2007 ·ECS Transactions ·Ngoc Duy Nguyen, Roger Loo, Andriy Hikavyy, Benny Van Daele, Paul Ryan, Matthew Wormington, (unknown)	2
14	Specular and off‐specular x‐ray reflectivity study of ion irradiated Co/Pt multilayers 2004 ·Surface and Interface Analysis ·(unknown), (unknown), R. Berger, Andreas Dietzel, Matthew Wormington	3
15	Characterization of structures from X-ray scattering data using genetic algorithms 1999 ·Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences ·Matthew Wormington, Charles Panaccione, Kevin Matney, D. Keith Bowen	241
16	Analysis of lattice distortions in high-quality InGaAsP epitaxial overgrowth of rectangular-patterned InP gratings 1998 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·(unknown), Mark S. Goorsky, (unknown), Michael Lim, G.S. Petrich, L. A. Kolodziejski, Vincent V. Wong, Henry I. Smith, Kevin Matney, Matthew Wormington	5
17	Analysis of grazing incidence X-ray diffuse scatter from Co–Cu multilayers 1998 ·Physica B Condensed Matter ·I. Pape, T. P. A. Hase, B. K. Tanner, Matthew Wormington	34
18	Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale 1994 ·MRS Proceedings ·Matthew Wormington, Kenji Sakurai, D. K. Bowen, B. K. Tanner	8
19	Grazing Incidence X-Ray Characterization of Materials 1992 ·Advances in X-ray Analysis ·D. K. Bowen, Matthew Wormington	24
20	Thermal Degradation of SiGe Interfaces Studied by X-Ray Reflectivity and Diffraction 1991 ·MRS Proceedings ·(unknown), Adrian R. Powell, D. K. Bowen, Matthew Wormington, B. K. Tanner, R. A. A. Kubiak, E. H. C. Parker	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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