Vimal Kamineni

761 total citations
28 papers, 495 citations indexed

About

Vimal Kamineni is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, Vimal Kamineni has authored 28 papers receiving a total of 495 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 12 papers in Surfaces, Coatings and Films and 11 papers in Biomedical Engineering. Recurrent topics in Vimal Kamineni's work include Semiconductor materials and devices (10 papers), Optical Coatings and Gratings (8 papers) and Surface Roughness and Optical Measurements (7 papers). Vimal Kamineni is often cited by papers focused on Semiconductor materials and devices (10 papers), Optical Coatings and Gratings (8 papers) and Surface Roughness and Optical Measurements (7 papers). Vimal Kamineni collaborates with scholars based in United States, China and India. Vimal Kamineni's co-authors include Alain C. Diebold, Florence Nelson, Ting Zhang, Everett Comfort, Tabbetha Dobbins, Yuri Lvov, Erik R. Hosler, Mark Raymond, Eric Bersch and Mengbing Huang and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Langmuir.

In The Last Decade

Vimal Kamineni

28 papers receiving 477 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Vimal Kamineni United States 12 252 229 188 135 108 28 495
Thomas Bottein France 10 144 0.6× 95 0.4× 146 0.8× 111 0.8× 56 0.5× 16 334
Allan Chang United States 12 275 1.1× 162 0.7× 342 1.8× 216 1.6× 139 1.3× 33 664
Manuel R. Gonçalves Germany 12 121 0.5× 122 0.5× 355 1.9× 168 1.2× 60 0.6× 26 521
Baoan Song China 14 257 1.0× 325 1.4× 189 1.0× 90 0.7× 37 0.3× 56 542
Xing Yan United States 9 276 1.1× 153 0.7× 84 0.4× 90 0.7× 183 1.7× 12 436
Koji Asakawa Japan 12 296 1.2× 224 1.0× 238 1.3× 86 0.6× 145 1.3× 45 515
Young Dong Kim South Korea 14 350 1.4× 514 2.2× 164 0.9× 125 0.9× 46 0.4× 35 697
Hiroyuki Hieda Japan 12 156 0.6× 342 1.5× 178 0.9× 209 1.5× 87 0.8× 28 553
Russell B. Goodman United States 13 386 1.5× 126 0.6× 237 1.3× 59 0.4× 94 0.9× 31 532
Moniraj Ghosh United States 6 110 0.4× 130 0.6× 111 0.6× 77 0.6× 73 0.7× 7 374

Countries citing papers authored by Vimal Kamineni

Since Specialization
Citations

This map shows the geographic impact of Vimal Kamineni's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Vimal Kamineni with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Vimal Kamineni more than expected).

Fields of papers citing papers by Vimal Kamineni

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Vimal Kamineni. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Vimal Kamineni. The network helps show where Vimal Kamineni may publish in the future.

Co-authorship network of co-authors of Vimal Kamineni

This figure shows the co-authorship network connecting the top 25 collaborators of Vimal Kamineni. A scholar is included among the top collaborators of Vimal Kamineni based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Vimal Kamineni. Vimal Kamineni is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lanzillo, Nicholas A., Hemant Dixit, Erik Milosevic, et al.. (2018). Defect and grain boundary scattering in tungsten: A combined theoretical and experimental study. Journal of Applied Physics. 123(15). 31 indexed citations
2.
Dixit, Hemant, Mark Raymond, Vimal Kamineni, et al.. (2017). First-Principles Investigations of TiGe/Ge Interface and Recipes to Reduce the Contact Resistance. IEEE Transactions on Electron Devices. 64(9). 3775–3780. 11 indexed citations
3.
Hosler, Erik R., et al.. (2016). Optical critical dimension metrology for directed self-assembly assisted contact hole shrink. Journal of Micro/Nanolithography MEMS and MOEMS. 15(1). 14004–14004. 19 indexed citations
4.
Kim, Jiseok, Huifeng Li, Mark Raymond, et al.. (2015). Specific contact resistivity of n-type Si and Ge M-S and M-I-S contacts. 33. 234–237. 6 indexed citations
5.
Hosler, Erik R., et al.. (2015). Silicon fin line edge roughness determination and sensitivity analysis by Mueller matrix spectroscopic ellipsometry based scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9424. 94242P–94242P. 1 indexed citations
6.
Takamasu, Kiyoshi, Satoru Takahashi, Osamu Inoue, et al.. (2014). Sidewall roughness and line profile measurement of photoresist and finFET features by cross-section STEM and TEM image for reference metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90501K–90501K. 10 indexed citations
7.
Settens, Charles, Benjamin Bunday, Vimal Kamineni, et al.. (2014). Assessment of critical dimension small-angle x-ray scattering measurement approaches for FinFET fabrication process monitoring. Journal of Micro/Nanolithography MEMS and MOEMS. 13(4). 41408–41408. 7 indexed citations
8.
Fronheiser, Jody, Vimal Kamineni, Matthew Wormington, et al.. (2014). Measurement of periodicity and strain in arrays of single crystal silicon and pseudomorphic Si1−xGex/Si fin structures using x-ray reciprocal space maps. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 32(2). 11 indexed citations
9.
Kamineni, Vimal, et al.. (2014). Metrology for directed self-assembly block lithography using optical scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90500N–90500N. 10 indexed citations
10.
Fronheiser, Jody, et al.. (2013). Mueller based scatterometry measurement of nanoscale structures with anisotropic in-plane optical properties. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86810M–86810M. 14 indexed citations
11.
Diebold, Alain C., et al.. (2013). Fin stress and pitch measurement using X-ray diffraction reciprocal space maps and optical scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86810I–86810I. 3 indexed citations
12.
Kamineni, Vimal, Richard Moore, Spyros Gallis, et al.. (2012). Optical and structural characterization of thermal oxidation effects of erbium thin films deposited by electron beam on silicon. Journal of Applied Physics. 111(1). 26 indexed citations
13.
14.
Kamineni, Vimal & Alain C. Diebold. (2011). Electron-phonon interaction effects on the direct gap transitions of nanoscale Si films. Applied Physics Letters. 99(15). 17 indexed citations
15.
16.
Kamineni, Vimal, et al.. (2010). Investigation of optical properties of benzocyclobutene wafer bonding layer used for 3D interconnects via infrared spectroscopic ellipsometry. Thin Solid Films. 519(9). 2924–2928. 6 indexed citations
17.
Kamineni, Vimal, et al.. (2010). Dielectric properties and thickness metrology of strain engineered GaN/AlN/Si (111) thin films grown by MOCVD. Thin Solid Films. 519(9). 2929–2932. 5 indexed citations
18.
Kamineni, Vimal, James N. Hilfiker, J. L. Freeouf, et al.. (2010). Extension of Far UV spectroscopic ellipsometry studies of High-κ dielectric films to 130 nm. Thin Solid Films. 519(9). 2894–2898. 9 indexed citations
19.
Higgins, Craig, Seth Kruger, Vimal Kamineni, et al.. (2010). Understanding Ultra-Thin Film Resist and Underlayer Performance through Physical Characterization. Journal of Photopolymer Science and Technology. 23(5). 699–707. 5 indexed citations
20.
Kamineni, Vimal, M. Raymond, Eric Bersch, et al.. (2009). Thickness Measurement of Thin-metal Films by Optical Metrology. AIP conference proceedings. 114–121. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Thomas Bottein Breakdown of academic impact, for papers by Allan Chang Breakdown of academic impact, for papers by Manuel R. Gonçalves Breakdown of academic impact, for papers by Baoan Song Breakdown of academic impact, for papers by Xing Yan Breakdown of academic impact, for papers by Koji Asakawa Breakdown of academic impact, for papers by Young Dong Kim Breakdown of academic impact, for papers by Hiroyuki Hieda Breakdown of academic impact, for papers by Russell B. Goodman Breakdown of academic impact, for papers by Moniraj Ghosh
Rankless by CCL
2026