Eric K. Lin

6.8k total citations
169 papers, 5.6k citations indexed

About

Eric K. Lin is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Materials Chemistry. According to data from OpenAlex, Eric K. Lin has authored 169 papers receiving a total of 5.6k indexed citations (citations by other indexed papers that have themselves been cited), including 103 papers in Electrical and Electronic Engineering, 48 papers in Surfaces, Coatings and Films and 44 papers in Materials Chemistry. Recurrent topics in Eric K. Lin's work include Advancements in Photolithography Techniques (58 papers), Electron and X-Ray Spectroscopy Techniques (32 papers) and Copper Interconnects and Reliability (31 papers). Eric K. Lin is often cited by papers focused on Advancements in Photolithography Techniques (58 papers), Electron and X-Ray Spectroscopy Techniques (32 papers) and Copper Interconnects and Reliability (31 papers). Eric K. Lin collaborates with scholars based in United States, Egypt and Bulgaria. Eric K. Lin's co-authors include Wen‐Li Wu, Dean M. DeLongchamp, Daniel A. Fischer, Bryan D. Vogt, Lee J. Richter, R. Joseph Kline, Christopher L. Soles, Sushil K. Satija, Martin Heeney and Iain McCulloch and has published in prestigious journals such as Science, Journal of the American Chemical Society and Advanced Materials.

In The Last Decade

Eric K. Lin

161 papers receiving 5.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Eric K. Lin United States 42 3.2k 1.9k 1.8k 1.4k 764 169 5.6k
Gi Xue China 40 2.6k 0.8× 3.1k 1.7× 2.2k 1.3× 1.6k 1.1× 907 1.2× 223 6.3k
Sophie Demoustier‐Champagne Belgium 38 1.6k 0.5× 1.4k 0.8× 1.4k 0.8× 1.7k 1.2× 420 0.5× 106 4.5k
Yanchun Han China 40 3.1k 1.0× 2.4k 1.3× 1.5k 0.8× 1.7k 1.2× 227 0.3× 229 5.3k
Takeshi Yasuda Japan 35 3.3k 1.0× 2.2k 1.2× 1.8k 1.1× 770 0.6× 354 0.5× 214 5.5k
Christopher L. Soles United States 39 2.0k 0.6× 1.6k 0.9× 2.1k 1.2× 1.5k 1.0× 363 0.5× 166 5.3k
Guangzhao Zhang China 42 2.4k 0.7× 861 0.5× 1.5k 0.9× 1.0k 0.7× 851 1.1× 107 5.6k
Eric Verploegen United States 27 2.3k 0.7× 1.5k 0.8× 1.6k 0.9× 792 0.6× 368 0.5× 47 3.9k
Willi Volksen United States 33 1.4k 0.4× 1.8k 1.0× 2.1k 1.2× 1.3k 0.9× 1.4k 1.9× 115 5.2k
Padma Gopalan United States 44 2.2k 0.7× 916 0.5× 4.4k 2.5× 1.5k 1.1× 847 1.1× 171 6.6k
Panagiotis Argitis Greece 39 2.7k 0.8× 1.7k 0.9× 1.9k 1.1× 1.0k 0.8× 308 0.4× 196 4.7k

Countries citing papers authored by Eric K. Lin

Since Specialization
Citations

This map shows the geographic impact of Eric K. Lin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric K. Lin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric K. Lin more than expected).

Fields of papers citing papers by Eric K. Lin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric K. Lin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric K. Lin. The network helps show where Eric K. Lin may publish in the future.

Co-authorship network of co-authors of Eric K. Lin

This figure shows the co-authorship network connecting the top 25 collaborators of Eric K. Lin. A scholar is included among the top collaborators of Eric K. Lin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eric K. Lin. Eric K. Lin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lin, Eric K., et al.. (2023). Size- and temperature-dependent mechanical properties of metallic lithium. Extreme Mechanics Letters. 61. 102022–102022. 7 indexed citations
2.
Ji, Liwen, Zhongkui Tan, Tevye Kuykendall, et al.. (2011). Fe3O4 nanoparticle-integrated graphene sheets for high-performance half and full lithium ion cells. Physical Chemistry Chemical Physics. 13(15). 7170–7170. 233 indexed citations
3.
Prabhu, Vivek M., Shuhui Kang, David L. VanderHart, et al.. (2010). Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods. Advanced Materials. 23(3). 388–408. 24 indexed citations
4.
VanderHart, David L., et al.. (2009). Thin-film solid-state proton NMR measurements using a synthetic mica substrate: Polymer blends. Journal of Magnetic Resonance. 201(1). 100–110. 7 indexed citations
5.
Wang, Chengqing, Wei-En Fu, Derek Ho, et al.. (2008). CD-SAXS measurements using laboratory-based and synchrotron-based instruments. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 69222E–69222E. 5 indexed citations
6.
Gurau, Marc C., Dean M. DeLongchamp, Brandon M. Vogel, et al.. (2007). Ordering in Poly (3-alkylthiophene) Thin Films Determined with Polarized Optical Spectroscopies | NIST. Langmuir. 23(2). 1 indexed citations
7.
Wu, Wen‐Li, Vivek M. Prabhu, & Eric K. Lin. (2007). Identifying materials limits of chemically amplified photoresists. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6519. 651902–651902. 7 indexed citations
8.
Kang, Shuhui, Bryan D. Vogt, Wen-li Wu, et al.. (2007). FTIR measurements of compositional heterogeneities. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6519. 651916–651916. 1 indexed citations
9.
Vogt, Bryan D., Shuhui Kang, Vivek M. Prabhu, et al.. (2007). Influence of base additives on the reaction-diffusion front of model chemically amplified photoresists. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(1). 175–182. 27 indexed citations
10.
Ro, Hyun Wook, Hae‐Jeong Lee, Eric K. Lin, et al.. (2007). Nanoimprint lithography for the direct patterning of nanoporous interlayer dielectric insulator materials. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6517. 651715–651715. 2 indexed citations
11.
Murphy, Amanda R., Paul C. Chang, Jinsong Liu, et al.. (2005). Self-Assembly, Molecular Ordering, and Charge Mobility in Solution-Processed Ultrathin Oligothiophene Films. Chemistry of Materials. 17(24). 6033–6041. 58 indexed citations
12.
Vogt, Bryan D., et al.. (2005). Moisture absorption into ultrathin hydrophilic polymer films on different substrate surfaces. Polymer. 46(5). 1635–1642. 93 indexed citations
13.
Prabhu, Vivek M., Bryan D. Vogt, Wen-li Wu, et al.. (2005). Direct Measurement of the Counterion Distribution within Swollen Polyelectrolyte Films. Langmuir. 21(15). 6647–6651. 30 indexed citations
14.
Vogt, Bryan D., Christopher L. Soles, Vivek M. Prabhu, et al.. (2004). Measurements of water distribution in thin lithographic films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5376. 56–56. 2 indexed citations
15.
16.
Soles, Christopher L., Ronald L. Jones, Vivek M. Prabhu, et al.. (2003). Polymer Dynamics and Diffusive Properties in Ultra-Thin Photoresist Films. 5039(1). 1 indexed citations
17.
Jones, Ronald L., Tengjiao Hu, Eric K. Lin, et al.. (2003). Subnanometer wavelength metrology of lithographically prepraed structures: a comparison of neutron and X-ray scattering.. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5038. 191–191. 1 indexed citations
18.
Lenhart, Joseph L., Ronald L. Jones, Eric K. Lin, et al.. (2002). Probing surface and bulk chemistry in resist films using near edge x-ray absorption fine structure. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(6). 2920–2926. 22 indexed citations
19.
Goldfarb, Darı́o L., Marie Angelopoulos, Eric K. Lin, et al.. (2001). Confinement effects on the spatial extent of the reaction front in ultrathin chemically amplified photoresists. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(6). 2699–2704. 32 indexed citations
20.
Goldfarb, Darı́o L., Qinghuang Lin, Marie Angelopoulos, et al.. (2001). Characterization of thin and ultrathin polymer and resist films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4345. 335–335. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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