Matthew Sendelbach

509 citations
45 papers · 394 indexed · h-index 12
Topics
Optical Coatings and Gratings (28 papers)Advancements in Photolithography Techniques (15 papers)Surface Roughness and Optical Measurements (12 papers)
Journals
IEEE Transactions on Semiconductor ManufacturingJournal of Micro/Nanolithography MEMS and MOEMSProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

In The Last Decade

Matthew Sendelbach

41 papers receiving 358 citations

Peers

Matthew Sendelbach
Comparison fields: 5 of 28
  • Electrical and Electronic Engineering 248
  • Surfaces, Coatings and Films 210
  • Biomedical Engineering 142
  • Computational Mechanics 92
  • Mechanical Engineering 58
Replace John A. Allgair with:
John A. Allgair United States
Alok Vaid United States
G. Owen United States
M.W. Cresswell United States
Soichi Inoue Japan
Jan Mulkens Netherlands
Alessandro Vaglio Pret Belgium
Osamu Suga Japan
Ryoung-Han Kim United States
Norio Saitou Japan
Matthew Sendelbach relative to John A. Allgair United States John A. Allgair's profile →
Citations per field
00.5×1.6×
John A. Allgair · 1×
Citations per year

Countries citing papers authored by Matthew Sendelbach

Since Specialization
Citations

This map shows the geographic impact of Matthew Sendelbach's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Matthew Sendelbach with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Matthew Sendelbach more than expected).

Fields of papers citing papers by Matthew Sendelbach

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Matthew Sendelbach. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Matthew Sendelbach. The network helps show where Matthew Sendelbach may publish in the future.

Co-authorship network of co-authors of Matthew Sendelbach

This figure shows the co-authorship network connecting the top 25 collaborators of Matthew Sendelbach. A scholar is included among the top collaborators of Matthew Sendelbach based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Matthew Sendelbach. Matthew Sendelbach is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 9
2 5
3 1
4 4
5 2
6 2
7 2
8 1
9 14
10 2
11 17
12 3
13 51
14 18
15 2
16 8
17 6
18 1
19 19
20 49

About Matthew Sendelbach

Matthew Sendelbach is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electrical and Electronic Engineering, having authored 45 papers that have together received 394 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (28 papers), Advancements in Photolithography Techniques (15 papers) and Surface Roughness and Optical Measurements (12 papers). The work is most often cited by research in Surfaces, Coatings and Films (210 citations), Structural Biology (11 citations) and Computational Mechanics (92 citations). Matthew Sendelbach has collaborated with scholars based in United States, Japan and Germany. Frequent co-authors include Charles N. Archie, Alok Vaid, Cornel Bozdog, Igor Turovets, John A. Allgair, S. Zangooie, Paul K. Isbester, A.G. Muñoz, Boris Sherman and Erin Mclellan. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, Journal of Micro/Nanolithography MEMS and MOEMS and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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