D. K. Bowen

3.1k total citations · 2 hit papers
86 papers, 2.2k citations indexed

About

D. K. Bowen is a scholar working on Radiation, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, D. K. Bowen has authored 86 papers receiving a total of 2.2k indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Radiation, 26 papers in Electrical and Electronic Engineering and 24 papers in Materials Chemistry. Recurrent topics in D. K. Bowen's work include Advanced X-ray Imaging Techniques (23 papers), X-ray Spectroscopy and Fluorescence Analysis (16 papers) and Advanced Surface Polishing Techniques (15 papers). D. K. Bowen is often cited by papers focused on Advanced X-ray Imaging Techniques (23 papers), X-ray Spectroscopy and Fluorescence Analysis (16 papers) and Advanced Surface Polishing Techniques (15 papers). D. K. Bowen collaborates with scholars based in United Kingdom, United States and Netherlands. D. K. Bowen's co-authors include B. K. Tanner, V. Vítek, R. C. Perrin, J. W. Christian, Graham K. Taylor, D.G. Chetwynd, S. T. Davies, J. Miltat, Stuart T. Smith and Matthew Wormington and has published in prestigious journals such as Nature, Journal of Applied Physics and Physics Today.

In The Last Decade

D. K. Bowen

83 papers receiving 2.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

High Resolution X-Ray Diffractometry And Topography

1998 510 citations D. K. Bowen, B. K. Tanner profile →
The core structure of ½(111) screw dislocations in b.c.c. crystals

1970 399 citations D. K. Bowen et al. profile →

Peers

Countries citing papers authored by D. K. Bowen

Since Specialization

Citations

This map shows the geographic impact of D. K. Bowen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. K. Bowen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. K. Bowen more than expected).

Fields of papers citing papers by D. K. Bowen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. K. Bowen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. K. Bowen. The network helps show where D. K. Bowen may publish in the future.

Co-authorship network of co-authors of D. K. Bowen

This figure shows the co-authorship network connecting the top 25 collaborators of D. K. Bowen. A scholar is included among the top collaborators of D. K. Bowen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. K. Bowen. D. K. Bowen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers 2010 ·Powder Diffraction ·(unknown), (unknown), D.M. Allen, P.J. McNally, (unknown), Tilo Baumbach, (unknown), (unknown), M.R. Elizalde, David A. Jacques, Matteo Fossati, D. K. Bowen, B. K. Tanner	8
2	Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging 2010 ·Journal of Crystal Growth ·A.N. Danilewsky, (unknown), (unknown), D.M. Allen, P.J. McNally, Patrik Vagovič, Tomy dos Santos Rolo, (unknown), Tilo Baumbach, (unknown), (unknown), M.R. Elizalde, Matteo Fossati, D. K. Bowen, B. K. Tanner	25
3	A comparison of techniques for nondestructive composition measurements in CdZnTe substrates 1995 ·Journal of Electronic Materials ·S. P. Tobin, (unknown), P. W. Norton, D. Chandler‐Horowitz, P. M. Amirtharaj, (unknown), W. M. Duncan, A. J. Syllaios, Christopher Ard, N. C. Giles, Jaesun Lee, Rajasekhar Balasubramanian‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬‬, (unknown), T. Steiner, M. L. W. Thewalt, D. K. Bowen, B. K. Tanner	48
4	Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale 1994 ·MRS Proceedings ·Matthew Wormington, Kenji Sakurai, D. K. Bowen, B. K. Tanner	8
5	Experimental Comparison of Widely Differing Lattice Parameters 1993 ·Advances in X-ray Analysis ·D. K. Bowen, B. K. Tanner, (unknown), I. Pape, (unknown), (unknown)	4
6	Calibration of Height Measuring Probes. 1992 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), D.G. Chetwynd, D. K. Bowen	1
7	Synchrotron X-radiation topography 1992 ·B. K. Tanner, D. K. Bowen	20
8	The “Computer-Aided Epitaxy” Si:MBE-Control System 1991 ·MRS Proceedings ·R. A. A. Kubiak, S. M. Newstead, Adrian R. Powell, D. K. Bowen, R. D. Barlow, Mark Dowsett, T. E. Whall, E. H. C. Parker	1
9	Structural and electrical properties of B delta layers in Si 1991 ·Semiconductor Science and Technology ·Adrian R. Powell, (unknown), R. A. A. Kubiak, E. H. C. Parker, T. E. Whall, D. K. Bowen	13
10	Sub-nanometre displacements calibration using X-ray interferometry 1990 ·Measurement Science and Technology ·D. K. Bowen, D.G. Chetwynd, (unknown)	33
11	X-ray diffraction characterization of Sb delta doping in Si 1990 ·Journal of Physics D Applied Physics ·Adrian R. Powell, R. A. A. Kubiak, T. E. Whall, D. K. Bowen	11
12	Three-dimensional X-ray microscopy with accurate registration of tomographic sections 1989 ·Journal of Microscopy ·S. D. Dover, J. C. Elliott, (unknown), D. K. Bowen	11
13	X-ray microtomography of biological tissues using laboratory and synchrotron sources 1987 ·Biological Trace Element Research ·J. C. Elliott, D. K. Bowen, S. D. Dover, S. T. Davies	14
14	A method for improving digital image comparison in X-ray topographs 1987 ·Materials Letters ·Tardi Tjahjadi, D. K. Bowen	1
15	X-ray Microtomography with Synchrotron Radiation 1986 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·D. K. Bowen, Justine Elliott, Stuart R. Stock, S. D. Dover	17
16	Calibration Of Surface Roughness Transducers At Angstrom Levels Using X-Ray Interferometry 1985 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·D. K. Bowen, D.G. Chetwynd, S. T. Davies	14
17	Quantitative analysis of arsenic-implanted layers in silicon by synchrotron-radiation-excited x-ray fluorescence 1985 ·Journal of Applied Physics ·D. K. Bowen, S. T. Davies, T. Ambridge	6
18	Synchrotron radiation damage in sodium bromate 1982 ·Journal of Materials Science Letters ·Kevin J. Roberts, J. N. Sherwood, D. K. Bowen, S. T. Davies	4
19	Slip initiation in iron-silicon single crystals : a study by conventional and synchrotron X-Ray topography 1979 ·Journal de physique ·J. Miltat, D. K. Bowen	11
20	Microscopy of Materials 1975 ·D. K. Bowen, C. R. Hall	20

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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