Erik M. Secula
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advanced Electron Microscopy Techniques and Applications 14
-
- Electron and X-Ray Spectroscopy Techniques 57
- Co-authors
- David G. SeilerAlain C. DieboldRajinder P. KhoslaC. Michael GarnerRobert McDonaldDan HerrAmal ChabliDaniel Herr
- Journals
- AIP conference proceedings (153 papers)AIPC (1 paper)
- Partner nations
- United StatesFranceGermany
In The Last Decade
Erik M. Secula
140 papers receiving 563 citations
Peers
Comparison fields: 5 of 58
- Structural Biology 47
- Surfaces, Coatings and Films 124
- Electrical and Electronic Engineering 349
- Computational Mechanics 106
- Atomic and Molecular Physics, and Optics 142
Countries citing papers authored by Erik M. Secula
This map shows the geographic impact of Erik M. Secula's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Erik M. Secula with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Erik M. Secula more than expected).
Fields of papers citing papers by Erik M. Secula
This network shows the impact of papers produced by Erik M. Secula. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Erik M. Secula. The network helps show where Erik M. Secula may publish in the future.
Co-authors
The 25 scholars most cited alongside Erik M. Secula, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 2 | |
| 2 | 2011 | 1 | |
| 3 | 2011 | 1 | |
| 4 | 2011 | 1 | |
| 5 | 2011 | 24 | |
| 6 | Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 2009 | 28 |
| 7 | 2009 | 3 | |
| 8 | 2009 | 9 | |
| 9 | 2009 | 1 | |
| 10 | 2007 | 1 | |
| 11 | 2007 | 2 | |
| 12 | 2007 | 1 | |
| 13 | 2007 | 1 | |
| 14 | 2007 | 4 | |
| 15 | 2007 | 9 | |
| 16 | 2007 | 5 | |
| 17 | 2007 | 0 | |
| 18 | 2007 | 2 | |
| 19 | 2005 International Conference on Characterization and Metrology for ULSI Technology | 2005 | 8 |
| 20 | Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology | 2003 | 1 |
About Erik M. Secula
Erik M. Secula is a scholar working on Structural Biology, Surfaces, Coatings and Films, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation, having authored 156 papers that have together received 591 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (57 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers), Semiconductor materials and devices (37 papers), Advancements in Photolithography Techniques (22 papers), Force Microscopy Techniques and Applications (17 papers), Surface and Thin Film Phenomena (16 papers), Advanced Electron Microscopy Techniques and Applications (14 papers) and Copper Interconnects and Reliability (13 papers). The work is most often cited by research in Structural Biology (47 citations), Surfaces, Coatings and Films (124 citations), Electrical and Electronic Engineering (349 citations), Computational Mechanics (106 citations) and Atomic and Molecular Physics, and Optics (142 citations). Erik M. Secula has collaborated with scholars based in United States, France and Germany. Frequent co-authors include David G. Seiler, Alain C. Diebold, Rajinder P. Khosla, C. Michael Garner, Robert McDonald, Dan Herr, Robert McDonald, Amal Chabli, Daniel Herr and John Notte. Their work appears in journals such as AIP conference proceedings and AIPC.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.