D. Keith Bowen
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
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- Microstructure and mechanical properties
Papers in
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- Electron and X-Ray Spectroscopy Techniques 4
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- X-ray Spectroscopy and Fluorescence Analysis 2
- Co-authors
- Matthew WormingtonCharles PanaccioneKevin MatneyM. S. DuesberyV. VítekB. K. TannerMichael A. CapanoL. Hart
- Journals
- Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences (1 paper)Interacting with Computers (1 paper)Proceedings of the Royal Society of London A Mathematical and Physical Sciences (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)Advances in X-ray Analysis (2 papers)
- Partner nations
- United KingdomCanadaUnited States
In The Last Decade
D. Keith Bowen
15 papers receiving 396 citations
Peers
Comparison fields: 5 of 59
- Surfaces, Coatings and Films 47
- Materials Chemistry 208
- Atomic and Molecular Physics, and Optics 131
- Radiation 32
- Condensed Matter Physics 38
Countries citing papers authored by D. Keith Bowen
This map shows the geographic impact of D. Keith Bowen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Keith Bowen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Keith Bowen more than expected).
Fields of papers citing papers by D. Keith Bowen
This network shows the impact of papers produced by D. Keith Bowen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Keith Bowen. The network helps show where D. Keith Bowen may publish in the future.
Co-authors
The 20 scholars most cited alongside D. Keith Bowen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2018 | 18 | |
| 3 | 2005 | 0 | |
| 4 | 2003 | 1 | |
| 5 | 2001 | 5 | |
| 6 | 1999 | 241 | |
| 7 | 1992 | 2 | |
| 8 | 1991 | 2 | |
| 9 | 1990 | 1 | |
| 10 | 1990 | 4 | |
| 11 | 1990 | 8 | |
| 12 | 1990 | 17 | |
| 13 | 1990 | 2 | |
| 14 | 1989 | 1 | |
| 15 | 1989 | 5 | |
| 16 | 1973 | 112 |
About D. Keith Bowen
D. Keith Bowen is a scholar working on Surfaces, Coatings and Films, Radiation, Mechanical Engineering, Mathematical Physics and Electronic, Optical and Magnetic Materials, having authored 16 papers that have together received 421 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (4 papers), Advancements in Photolithography Techniques (2 papers), Advanced Measurement and Metrology Techniques (2 papers), Semiconductor materials and interfaces (2 papers), Surface Roughness and Optical Measurements (2 papers), Advanced Surface Polishing Techniques (2 papers), Metal Forming Simulation Techniques (2 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (47 citations), Materials Chemistry (208 citations), Atomic and Molecular Physics, and Optics (131 citations), Radiation (32 citations) and Condensed Matter Physics (38 citations). D. Keith Bowen has collaborated with scholars based in United Kingdom, Canada and United States. Frequent co-authors include Matthew Wormington, Charles Panaccione, Kevin Matney, M. S. Duesbery, V. Vítek, B. K. Tanner, Michael A. Capano, L. Hart, Graham R. Fisher and Stuart T. Smith. Their work appears in journals such as Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences, Interacting with Computers, Proceedings of the Royal Society of London A Mathematical and Physical Sciences, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Advances in X-ray Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.