Kristopher A. Lavery
- Materials Chemistry
- Organic Chemistry top 10%
- Polymers and Plastics top 10%
- Biomedical Engineering
- Electrical and Electronic Engineering
- Co-authors
- Thomas P. RussellDu Yeol RyuEric J. AmisNathan D. GallantMatthew L. BeckerJin Kon KimJames J. WatkinsSushil K. Satija
- Topics
- Advancements in Photolithography Techniques (7 papers)Electron and X-Ray Spectroscopy Techniques (7 papers)Block Copolymer Self-Assembly (7 papers)
- Partner nations
- United StatesSouth KoreaBulgaria
In The Last Decade
Kristopher A. Lavery
20 papers receiving 536 citations
Peers
Comparison fields: 5 of 57
- Materials Chemistry 304
- Organic Chemistry 208
- Polymers and Plastics 173
- Biomedical Engineering 146
- Electrical and Electronic Engineering 94
Countries citing papers authored by Kristopher A. Lavery
This map shows the geographic impact of Kristopher A. Lavery's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kristopher A. Lavery with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kristopher A. Lavery more than expected).
Fields of papers citing papers by Kristopher A. Lavery
This network shows the impact of papers produced by Kristopher A. Lavery. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kristopher A. Lavery. The network helps show where Kristopher A. Lavery may publish in the future.
Co-authorship network of co-authors of Kristopher A. Lavery
This figure shows the co-authorship network connecting the top 25 collaborators of Kristopher A. Lavery. A scholar is included among the top collaborators of Kristopher A. Lavery based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kristopher A. Lavery. Kristopher A. Lavery is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 10 | |
| 3 | 6 | |
| 4 | 10 | |
| 5 | 6 | |
| 6 | 110 | |
| 7 | 56 | |
| 8 | 53 | |
| 9 | 1 | |
| 10 | 10 | |
| 11 | 7 | |
| 12 | 7 | |
| 13 | 12 | |
| 14 | 32 | |
| 15 | 1 | |
| 16 | 39 | |
| 17 | 22 | |
| 18 | 81 | |
| 19 | 45 | |
| 20 | 31 |
About Kristopher A. Lavery
Kristopher A. Lavery is a scholar working on Surfaces, Coatings and Films, Polymers and Plastics and Radiation, having authored 20 papers that have together received 546 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (7 papers), Electron and X-Ray Spectroscopy Techniques (7 papers) and Block Copolymer Self-Assembly (7 papers). The work is most often cited by research in Polymers and Plastics (173 citations), Surfaces, Coatings and Films (80 citations) and Fluid Flow and Transfer Processes (60 citations). Kristopher A. Lavery has collaborated with scholars based in United States, South Korea and Bulgaria. Frequent co-authors include Thomas P. Russell, Du Yeol Ryu, Eric J. Amis, Nathan D. Gallant, Matthew L. Becker, Jin Kon Kim, James J. Watkins, Sushil K. Satija, Dong Hyun Lee and Jacques Penelle. Their work appears in journals such as Physical Review Letters, Advanced Materials and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.