David G. Seiler
About
In The Last Decade
David G. Seiler
253 papers receiving 2.0k citations
Peers
Comparison fields: 5 of 93
- Atomic and Molecular Physics, and Optics 1.2k
- Electrical and Electronic Engineering 1.2k
- Materials Chemistry 514
- Biomedical Engineering 310
- Condensed Matter Physics 200
Countries citing papers authored by David G. Seiler
This map shows the geographic impact of David G. Seiler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David G. Seiler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David G. Seiler more than expected).
Fields of papers citing papers by David G. Seiler
This network shows the impact of papers produced by David G. Seiler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David G. Seiler. The network helps show where David G. Seiler may publish in the future.
Co-authorship network of co-authors of David G. Seiler
This figure shows the co-authorship network connecting the top 25 collaborators of David G. Seiler. A scholar is included among the top collaborators of David G. Seiler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David G. Seiler. David G. Seiler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Epitaxially-grown self-assembled Bi2Se3/Bi2MnSe4 multilayer heterostructures | NIST | 1 |
| 2 | 6 | |
| 3 | Does Employment Status Impact Learning Style | 0 |
| 4 | Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 28 |
| 5 | Characterization and metrology for ULSI technology | 116 |
| 6 | 2005 International Conference on Characterization and Metrology for ULSI Technology | 8 |
| 7 | Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology | 1 |
| 8 | Characterization and metrology for ULSI technology : 2000 international conference, Gaithersburg, Maryland, 26-29 June 2000 | 1 |
| 9 | Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland March 1998 | 2 |
| 10 | Characterization of Two-Dimensional Dopant Profiles: Status and Review | 1 |
| 11 | 2 | |
| 12 | Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon | 2 |
| 13 | The spectroscopy of semiconductors | 13 |
| 14 | Investigation of Mercury Interstitials in Hg1-2CdxTe Alloys Using Resonant Impact-Ionization Spectroscopy | 5 |
| 15 | 2 | |
| 16 | International Conference on Narrow-Gap Semiconductors and Related Materials | 1 |
| 17 | 33 | |
| 18 | 8 | |
| 19 | Use of the tcPO2 electrode in the animal fetus. | 2 |
| 20 | 13 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.