Jason K. Stowers
- Electrical and Electronic Engineering top 10%
- Surfaces, Coatings and Films top 2%
- Biomedical Engineering
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Co-authors
- Douglas A. KeszlerAndrew GrenvilleBenjamin L. ClarkKai JiangRoberto FallicaAndreas FrommholdAlex P. G. RobinsonYasin Ekinci
- Topics
- Advancements in Photolithography Techniques (22 papers)Electron and X-Ray Spectroscopy Techniques (17 papers)Integrated Circuits and Semiconductor Failure Analysis (13 papers)
- Partner nations
- United StatesBelgiumGermany
In The Last Decade
Jason K. Stowers
24 papers receiving 494 citations
Peers
Comparison fields: 5 of 49
- Electrical and Electronic Engineering 439
- Surfaces, Coatings and Films 246
- Biomedical Engineering 120
- Materials Chemistry 94
- Atomic and Molecular Physics, and Optics 27
Countries citing papers authored by Jason K. Stowers
This map shows the geographic impact of Jason K. Stowers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jason K. Stowers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jason K. Stowers more than expected).
Fields of papers citing papers by Jason K. Stowers
This network shows the impact of papers produced by Jason K. Stowers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jason K. Stowers. The network helps show where Jason K. Stowers may publish in the future.
Co-authorship network of co-authors of Jason K. Stowers
This figure shows the co-authorship network connecting the top 25 collaborators of Jason K. Stowers. A scholar is included among the top collaborators of Jason K. Stowers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jason K. Stowers. Jason K. Stowers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 6 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 21 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | 34 | |
| 10 | 58 | |
| 11 | 13 | |
| 12 | 26 | |
| 13 | 67 | |
| 14 | 6 | |
| 15 | 19 | |
| 16 | 53 | |
| 17 | 24 | |
| 18 | 49 | |
| 19 | 1 | |
| 20 | 78 |
About Jason K. Stowers
Jason K. Stowers is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation, having authored 25 papers that have together received 517 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (22 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). The work is most often cited by research in Surfaces, Coatings and Films (246 citations), Electrical and Electronic Engineering (439 citations) and Structural Biology (4 citations). Jason K. Stowers has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include Douglas A. Keszler, Andrew Grenville, Benjamin L. Clark, Kai Jiang, Roberto Fallica, Andreas Frommhold, Alex P. G. Robinson, Yasin Ekinci, Peter De Schepper and Geert Vandenberghe. Their work appears in journals such as Frontiers in Microbiology, Microelectronic Engineering and ACS Applied Nano Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.