Stephen T. Meyers
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Polymers and Plastics top 10%
- Surfaces, Coatings and Films top 5%
- Biomedical Engineering
- Co-authors
- Douglas A. KeszlerJeremy T. AndersonJohn F. WagerJohn O. ThompsonWilliam D. HinsbergDavid HongAndrew GrenvilleKai Jiang
- Topics
- Advancements in Photolithography Techniques (13 papers)Electron and X-Ray Spectroscopy Techniques (11 papers)Integrated Circuits and Semiconductor Failure Analysis (8 papers)
- Journals
- Journal of the American Chemical SocietyAngewandte Chemie International EditionApplied Physics Letters
- Partner nations
- United StatesBelgiumGermany
In The Last Decade
Stephen T. Meyers
21 papers receiving 780 citations
Peers
Comparison fields: 5 of 39
- Electrical and Electronic Engineering 667
- Materials Chemistry 467
- Polymers and Plastics 135
- Surfaces, Coatings and Films 131
- Biomedical Engineering 123
Countries citing papers authored by Stephen T. Meyers
This map shows the geographic impact of Stephen T. Meyers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephen T. Meyers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephen T. Meyers more than expected).
Fields of papers citing papers by Stephen T. Meyers
This network shows the impact of papers produced by Stephen T. Meyers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephen T. Meyers. The network helps show where Stephen T. Meyers may publish in the future.
Co-authorship network of co-authors of Stephen T. Meyers
This figure shows the co-authorship network connecting the top 25 collaborators of Stephen T. Meyers. A scholar is included among the top collaborators of Stephen T. Meyers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Stephen T. Meyers. Stephen T. Meyers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 6 | |
| 5 | 1 | |
| 6 | 3 | |
| 7 | 51 | |
| 8 | 34 | |
| 9 | 67 | |
| 10 | 6 | |
| 11 | 27 | |
| 12 | 64 | |
| 13 | 5 | |
| 14 | 15 | |
| 15 | 17 | |
| 16 | 64 | |
| 17 | 13 | |
| 18 | 301 | |
| 19 | 98 | |
| 20 | 1 |
About Stephen T. Meyers
Stephen T. Meyers is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 22 papers that have together received 793 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (13 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (131 citations), Electrical and Electronic Engineering (667 citations) and Materials Chemistry (467 citations). Stephen T. Meyers has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include Douglas A. Keszler, Jeremy T. Anderson, John F. Wager, John O. Thompson, William D. Hinsberg, David Hong, Andrew Grenville, Kai Jiang, Darren W. Johnson and Zachary L. Mensinger. Their work appears in journals such as Journal of the American Chemical Society, Angewandte Chemie International Edition and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.