Christophe Defranoux

690 citations

38 papers · 581 indexed · h-index 11

Impact in

Polymers and Plastics top 10%
- Conducting polymers and applications
- Transition Metal Oxide Nanomaterials
Electrical and Electronic Engineering top 10%
- Organic Electronics and Photovoltaics
- Thin-Film Transistor Technologies
- Semiconductor materials and devices
- Perovskite Materials and Applications
- Advancements in Semiconductor Devices and Circuit Design

Papers in

Surfaces, Coatings and Films 11
- Optical Coatings and Gratings 10
Structural Biology 1

Co-authors: F. Flory Jean‐Jacques Simon Philippe Torchio Ludovic Escoubas Florent Monestier Rémi de Bettignies Stéphane Guillerez Pierre Boher
Journals: Thin Solid Films (10 papers)Materials Science and Engineering B (3 papers)Journal of Crystal Growth (1 paper)Solar Energy Materials and Solar Cells (1 paper)Microelectronic Engineering (1 paper)
Partner nations: France Belgium Italy

In The Last Decade

Christophe Defranoux

37 papers receiving 558 citations

Peers

Countries citing papers authored by Christophe Defranoux

Since Specialization

Citations

This map shows the geographic impact of Christophe Defranoux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Christophe Defranoux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Christophe Defranoux more than expected).

Fields of papers citing papers by Christophe Defranoux

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Christophe Defranoux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Christophe Defranoux. The network helps show where Christophe Defranoux may publish in the future.

Co-authors

The 25 scholars most cited alongside Christophe Defranoux, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Christophe Defranoux Line = papers co-authored together Christophe Defranoux links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	Inkjet-printed vertically emitting solid-state organic lasers Journal of Applied Physics ·T. Likhomanenko, Sebastien Chénais, Sébastien Forget, Christophe Defranoux, Sébastien Sanaur	2016	5
2	Optical modeling of organic solar cells based on CuPc and C_60 Applied Optics ·Florent Monestier, Jean‐Jacques Simon, Philippe Torchio, Ludovic Escoubas, Bernard Ratier, C. De La Herran Munoz, Bruno Lucas, André Moliton, Michel Cathelinaud, Christophe Defranoux, F. Flory	2008	34
3	Pulsed Plasma Deposition from Vinyltrimethylsilane/Oxygen Mixtures Plasma Processes and Polymers ·A. A Shanenko, Fabio Palumbo, Riccardo d’Agostino, Christophe Defranoux	2008	15
4	Review of Characterization of ZnO by Spectroscopic Ellipsometry ECS Transactions ·David Nguyen-Tri, Zhuoyi Pang, Christophe Defranoux	2008	3
5	Ellipsometric Porosimetry: Fast and Non Destructive Technique for Characterization of Porous Low-K; Highlights on Plasma Damage and Water Effect on Treated Materials ECS Transactions ·A. Bourgeois, David Nguyen-Tri, Zhuoyi Pang, Christophe Defranoux	2008	1
6	Ellipsometry porosimetry: fast and nondestructive technique to characterize porosity of cubic mesoporous TiO 2 thin films Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·David Nguyen-Tri, Zhuoyi Pang, Christophe Defranoux	2007	3
7	Modeling the short-circuit current density of polymer solar cells based on P3HT:PCBM blend Solar Energy Materials and Solar Cells ·Florent Monestier, Jean‐Jacques Simon, Philippe Torchio, Ludovic Escoubas, F. Flory, Andresa Maíra da Fonseca, Rémi de Bettignies, Stéphane Guillerez, Christophe Defranoux	2006	245
8	In Situ Phosphorus Doping of Germanium by APCVD ECS Transactions ·С.А. Орехов, Sean Morley, Alain Moussa, Frederik Leys, Benny Van Daele, R. A. H. Unthank, Trudo Clarysse, Eddy Simoen, Christophe Defranoux, M. Meuris, A. Benedetti, Olivier Richard, H. Bender	2006	26
9	Infrared spectroscopic ellipsometry applied to the characterization of ultra shallow junction on silicon and SOI Thin Solid Films ·Christophe Defranoux, Marcio Paes De Almeida, JCB Oliveira, J. Venturini, Pierre Boher, Miguel Hernández, C. Laviron, Takashi Noguchi	2004	4
10	Dielectric function of Si nanocrystals embedded in SiO2 Thin Solid Films ·Bruno Gallas, Mohamed Abouelmahassine, Christophe Defranoux, S. Fisson, G. Vuye, J. Rivory	2004	11
11	VUV spectroscopic ellipsometry applied to the characterization of high-k dielectrics Materials Science and Engineering B ·Pierre Boher, Christophe Defranoux, Meiko Geselbracht, Jackie Wolstenholme, H. Bender	2004	20
12	Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics Thin Solid Films ·Karina Bertolino, Oleksandr Trushin, Δημήτριος Κορωναίος, T. P. Mitchell, Christophe Defranoux, A. R. Heyligers, D.G. Drozdov, Ashley Palumbo	2004	2
13	Accurate electrical activation characterization of CMOS ultra-shallow profiles Materials Science and Engineering B ·Trudo Clarysse, Fabian Dortu, Danielle Vanhaeren, I. Hoflijk, Kunteenun Nokkunthong, Tom Janssens, Roger Loo, Wilfried Vandervorst, Bartek Pawlak, Yolanda Silva Escamilla, Christophe Defranoux, 明裕澤井, Michael Current	2004	12
14	Selective epitaxial growth of boron- and phosphorus-doped Si and SiGe for raised sources and drains Journal of Crystal Growth ·Jean‐Michel Hartmann, L. Clavelier, C. Jahan, P. Holliger, G. Rolland, T. Billon, Christophe Defranoux	2004	57
15	Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics Thin Solid Films ·Pierre Boher, Oleksandr Trushin, Δημήτριος Κορωναίος, Abhijit Khandre A, Christophe Defranoux, Ashley Palumbo	2004	3
16	Single-Shot Excimer Laser Annealing and In Process Ellipsometry Analysis for Ultra Shallow Junctions MRS Proceedings ·Takashi Noguchi, Budi Hata, T. Sarnet, D. Débarre, J. Boulmer, Amada O. Iglesias Fernández, Miguel Hernández, Christophe Defranoux, C. Laviron, M.N. Séméria	2002	3
17	Deep ultra-violet measurements of SiON anti-reflective coatings by spectroscopic ellipsometry Thin Solid Films ·Christophe Defranoux, A. R. Heyligers, Roberto Hernández Leyva	1998	7
18	High accuracy IR ellipsometer working with a Ge Brewster angle reflection polarizer and grid analyzer Thin Solid Films ·Lourdes Verdugo-Barraza, Roberto Hernández Leyva, Christophe Defranoux, A. R. Heyligers	1998	10
19	Precise measurement of ARC optical indices in the deep-UV range by variable-angle spectroscopic ellipsometry Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Pierre Boher, Roberto Hernández Leyva, A. R. Heyligers, Christophe Defranoux, Louis Hennet	1997	1
20	<title>Spectroscopic ellipsometry and photometry applied to color filter characterization</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Christophe Defranoux, A. R. Heyligers, Roberto Hernández Leyva	1996	1

About Christophe Defranoux

Christophe Defranoux is a scholar working on Surfaces, Coatings and Films, Structural Biology, Electronic, Optical and Magnetic Materials, Polymers and Plastics and Electrical and Electronic Engineering, having authored 38 papers that have together received 581 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (10 papers), Optical Polarization and Ellipsometry (9 papers), Semiconductor materials and devices (8 papers), Copper Interconnects and Reliability (6 papers), Thin-Film Transistor Technologies (5 papers), Semiconductor materials and interfaces (4 papers), Silicon and Solar Cell Technologies (4 papers) and Surface Roughness and Optical Measurements (4 papers). The work is most often cited by research in Polymers and Plastics (216 citations), Electrical and Electronic Engineering (511 citations), Surfaces, Coatings and Films (34 citations), Atomic and Molecular Physics, and Optics (104 citations) and Biomedical Engineering (142 citations). Christophe Defranoux has collaborated with scholars based in France, Belgium and Italy. Frequent co-authors include F. Flory, Jean‐Jacques Simon, Philippe Torchio, Ludovic Escoubas, Florent Monestier, Rémi de Bettignies, Stéphane Guillerez, Pierre Boher, Jean‐Michel Hartmann and T. Billon. Their work appears in journals such as Thin Solid Films, Materials Science and Engineering B, Journal of Crystal Growth, Solar Energy Materials and Solar Cells and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact