Bruce W. Smith
- Electrical and Electronic Engineering top 5%
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 1%
- Radiation top 5%
- Media Technology top 5%
- Co-authors
- Neal LaffertyKazuaki SuzukiPaul ZimmermanPeng XieJohn J. McManusEmmanuel P. GiannelisMarkos TrikeriotisChristopher K. Ober
- Topics
- Advancements in Photolithography Techniques (112 papers)Optical Coatings and Gratings (36 papers)Integrated Circuits and Semiconductor Failure Analysis (34 papers)
- Journals
- SHILAP Revista de lepidopterologíaChemistry of MaterialsJournal of Applied Psychology
- Partner nations
- United StatesBelgiumUnited Kingdom
In The Last Decade
Bruce W. Smith
141 papers receiving 943 citations
Peers
Comparison fields: 5 of 98
- Electrical and Electronic Engineering 779
- Biomedical Engineering 421
- Surfaces, Coatings and Films 368
- Radiation 114
- Media Technology 114
Countries citing papers authored by Bruce W. Smith
This map shows the geographic impact of Bruce W. Smith's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce W. Smith with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce W. Smith more than expected).
Fields of papers citing papers by Bruce W. Smith
This network shows the impact of papers produced by Bruce W. Smith. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce W. Smith. The network helps show where Bruce W. Smith may publish in the future.
Co-authorship network of co-authors of Bruce W. Smith
This figure shows the co-authorship network connecting the top 25 collaborators of Bruce W. Smith. A scholar is included among the top collaborators of Bruce W. Smith based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bruce W. Smith. Bruce W. Smith is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 0 | |
| 7 | 52 | |
| 8 | 5 | |
| 9 | Microlithography (Corrosion Technology) | 1 |
| 10 | 7 | |
| 11 | 12 | |
| 12 | 2 | |
| 13 | Optical Microlithography XVII | 8 |
| 14 | 12 | |
| 15 | 2 | |
| 16 | 0 | |
| 17 | 1 | |
| 18 | 1 | |
| 19 | 30 | |
| 20 | 2 |
About Bruce W. Smith
Bruce W. Smith is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Media Technology, having authored 155 papers that have together received 1.0k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (112 papers), Optical Coatings and Gratings (36 papers) and Integrated Circuits and Semiconductor Failure Analysis (34 papers). The work is most often cited by research in Surfaces, Coatings and Films (368 citations), Electrical and Electronic Engineering (779 citations) and Media Technology (114 citations). Bruce W. Smith has collaborated with scholars based in United States, Belgium and United Kingdom. Frequent co-authors include Neal Lafferty, Kazuaki Suzuki, Paul Zimmerman, Peng Xie, John J. McManus, Emmanuel P. Giannelis, Markos Trikeriotis, Christopher K. Ober, Evan L. Schwartz and Peng Xie. Their work appears in journals such as SHILAP Revista de lepidopterología, Chemistry of Materials and Journal of Applied Psychology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.