J.W. Howard

1.1k total citations
40 papers, 733 citations indexed

About

J.W. Howard is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computational Mechanics. According to data from OpenAlex, J.W. Howard has authored 40 papers receiving a total of 733 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 7 papers in Computational Mechanics. Recurrent topics in J.W. Howard's work include Radiation Effects in Electronics (27 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Semiconductor materials and devices (12 papers). J.W. Howard is often cited by papers focused on Radiation Effects in Electronics (27 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Semiconductor materials and devices (12 papers). J.W. Howard collaborates with scholars based in United States, Australia and Germany. J.W. Howard's co-authors include R.C. Block, S. Büchner, C. Poivey, R.L. Pease, L. W. Massengill, Dale McMorrow, W.J. Stapor, M.R. Pinto, Y. Boulghassoul and A.R. Knudson and has published in prestigious journals such as Journal of Applied Physics, Radiation Research and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

In The Last Decade

J.W. Howard

37 papers receiving 686 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J.W. Howard United States 17 663 164 89 70 66 40 733
N.F. Haddad United States 12 826 1.2× 237 1.4× 76 0.9× 37 0.5× 47 0.7× 33 844
T. Carrière France 21 811 1.2× 177 1.1× 94 1.1× 74 1.1× 60 0.9× 37 925
F. Bezerra France 17 756 1.1× 154 0.9× 115 1.3× 37 0.5× 109 1.7× 76 822
P. Calvel France 18 867 1.3× 137 0.8× 57 0.6× 29 0.4× 34 0.5× 59 912
K.B. Crawford United States 14 572 0.9× 196 1.2× 60 0.7× 21 0.3× 29 0.4× 43 633
N. Buard France 12 415 0.6× 99 0.6× 55 0.6× 36 0.5× 43 0.7× 30 443
Anthony M. Phan United States 14 601 0.9× 150 0.9× 79 0.9× 17 0.2× 62 0.9× 39 634
G.L. Hash United States 24 1.6k 2.4× 339 2.1× 136 1.5× 73 1.0× 70 1.1× 48 1.6k
Andrew Michael Chugg United Kingdom 13 332 0.5× 70 0.4× 69 0.8× 25 0.4× 30 0.5× 29 362
Leif Scheick United States 18 813 1.2× 94 0.6× 50 0.6× 36 0.5× 18 0.3× 80 889

Countries citing papers authored by J.W. Howard

Since Specialization
Citations

This map shows the geographic impact of J.W. Howard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.W. Howard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.W. Howard more than expected).

Fields of papers citing papers by J.W. Howard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.W. Howard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.W. Howard. The network helps show where J.W. Howard may publish in the future.

Co-authorship network of co-authors of J.W. Howard

This figure shows the co-authorship network connecting the top 25 collaborators of J.W. Howard. A scholar is included among the top collaborators of J.W. Howard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.W. Howard. J.W. Howard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Marshall, Paul W., et al.. (2004). The Impact of System Configuration on Device Radiation Damage Testing of Optical Components. ESA Special Publication. 536. 17. 1 indexed citations
3.
Howard, J.W., et al.. (2004). Single event effects testing of the Linfinity SG1525A pulse width modulator controller. NASA STI Repository (National Aeronautics and Space Administration). 133–140. 4 indexed citations
4.
Büchner, S., Dale McMorrow, C. Poivey, et al.. (2004). Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions. IEEE Transactions on Nuclear Science. 51(5). 2776–2781. 48 indexed citations
5.
Reed, Robert A., et al.. (2003). The impact of system configuration on device radiation damage testing of optical components. 17–21. 1 indexed citations
6.
O'Bryan, Martha V., Kenneth A. LaBel, Robert A. Reed, et al.. (2003). Recent radiation damage and single event effect results for microelectronics. 1–14. 15 indexed citations
7.
Sternberg, Andrew L., L. W. Massengill, Ronald D. Schrimpf, et al.. (2002). Effect of amplifier parameters on single-event transients in an inverting operational amplifier. IEEE Transactions on Nuclear Science. 49(3). 1496–1501. 39 indexed citations
8.
Howard, J.W., et al.. (2002). Synopsis V1.0 Single Event Transient and Destructive Single Event Effects Testing of the Linfinity SG1525A Pulse Width Modulator Controller.
9.
O'Bryan, Martha V., K.A. LaBel, Robert A. Reed, et al.. (2002). Radiation damage and single event effect results for candidate spacecraft electronics. NASA STI Repository (National Aeronautics and Space Administration). 106–122. 22 indexed citations
10.
Howard, J.W., et al.. (2002). SEU tests with an improved Cf-252 system. 88–92.
11.
Howard, J.W., et al.. (2002). The effects of ion track structure in simulating single event phenomena. 509–516. 23 indexed citations
12.
Boulghassoul, Y., L. W. Massengill, Andrew L. Sternberg, et al.. (2002). Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis. IEEE Transactions on Nuclear Science. 49(6). 3090–3096. 47 indexed citations
13.
Koga, R., S. Crain, K.B. Crawford, et al.. (2002). Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators. 53–60. 26 indexed citations
14.
Poivey, C., et al.. (2001). Development of a test methodology for single-event transients (SETs) in linear devices. IEEE Transactions on Nuclear Science. 48(6). 2180–2186. 18 indexed citations
15.
Katz, R., Robert A. Reed, Igor Kleyner, et al.. (1999). The effects of architecture and process on the hardness of programmable technologies. IEEE Transactions on Nuclear Science. 46(6). 1736–1743. 7 indexed citations
16.
Titus, J.L., C.F. Wheatley, D.I. Burton, et al.. (1999). Prediction of early lethal SEGR failures of VDMOSFETs for commercial space systems'. IEEE Transactions on Nuclear Science. 46(6). 1640–1651. 23 indexed citations
17.
Howard, J.W., R.C. Block, W.J. Stapor, et al.. (1995). High-energy heavy-ion-induced charge transport across multiple junctions. IEEE Transactions on Nuclear Science. 42(6). 1780–1788. 4 indexed citations
18.
Howard, J.W., et al.. (1994). High energy heavy-ion-induced single event transients in epitaxial structures. IEEE Transactions on Nuclear Science. 41(6). 2018–2025. 30 indexed citations
19.
Howard, J.W., et al.. (1991). An extended ambipolar model: Formulation, analytical investigations, and application to photocurrent modeling. Journal of Applied Physics. 69(1). 307–319. 21 indexed citations
20.
Howard, J.W., et al.. (1990). A new method for using /sup 252/Cf in SEU testing (SRAM). IEEE Transactions on Nuclear Science. 37(6). 1916–1922. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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