S. P. Klepner

752 total citations
19 papers, 570 citations indexed

About

S. P. Klepner is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, S. P. Klepner has authored 19 papers receiving a total of 570 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 3 papers in Materials Chemistry. Recurrent topics in S. P. Klepner's work include Semiconductor materials and devices (10 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers) and Surface and Thin Film Phenomena (6 papers). S. P. Klepner is often cited by papers focused on Semiconductor materials and devices (10 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers) and Surface and Thin Film Phenomena (6 papers). S. P. Klepner collaborates with scholars based in United States. S. P. Klepner's co-authors include J.Y.-C. Sun, Yuan Taur, J. H. Greiner, R.H. Dennard, S. Basavaiah, C. J. Kircher, S.E. Schuster, B.A. Chappell, R. Franch and Alexander Warnecke and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Journal of Solid-State Circuits.

In The Last Decade

S. P. Klepner

19 papers receiving 534 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
S. P. Klepner United States	10	443	210	129	78	70	19	570
D. Herrell United States	14	316 0.7×	172 0.8×	138 1.1×	24 0.3×	52 0.7×	34	466
D.K. Brock United States	14	272 0.6×	223 1.1×	217 1.7×	21 0.3×	107 1.5×	24	428
Timothy J. Maloney United States	18	1.0k 2.4×	235 1.1×	26 0.2×	76 1.0×	69 1.0×	71	1.1k
C.A. Liechti United States	13	730 1.6×	330 1.6×	92 0.7×	26 0.3×	75 1.1×	29	767
R.J. Lomax United States	12	400 0.9×	173 0.8×	25 0.2×	48 0.6×	28 0.4×	43	486
J.X. Przybysz United States	17	450 1.0×	347 1.7×	363 2.8×	16 0.2×	175 2.5×	60	713
K. Stein United States	14	601 1.4×	103 0.5×	45 0.3×	18 0.2×	81 1.2×	40	650
J. M. Hergenrother United States	14	915 2.1×	562 2.7×	437 3.4×	104 1.3×	106 1.5×	29	1.4k
Anthony Annunziata United States	8	249 0.6×	317 1.5×	129 1.0×	22 0.3×	24 0.3×	19	479
Y. Saitoh Japan	14	535 1.2×	136 0.6×	275 2.1×	68 0.9×	50 0.7×	44	706

Countries citing papers authored by S. P. Klepner

Since Specialization

Citations

This map shows the geographic impact of S. P. Klepner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. P. Klepner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. P. Klepner more than expected).

Fields of papers citing papers by S. P. Klepner

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. P. Klepner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. P. Klepner. The network helps show where S. P. Klepner may publish in the future.

Co-authorship network of co-authors of S. P. Klepner

This figure shows the co-authorship network connecting the top 25 collaborators of S. P. Klepner. A scholar is included among the top collaborators of S. P. Klepner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. P. Klepner. S. P. Klepner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

Kosonocky, Stephen, A. A. Bright, R.A. Haring, et al.. (2002). Designing a testable system on a chip. 9. 2–7. 1 indexed citations

Chappell, T.I., et al.. (1991). A 2-ns cycle, 3.8-ns access 512-kb CMOS ECL SRAM with a fully pipelined architecture. IEEE Journal of Solid-State Circuits. 26(11). 1577–1585. 99 indexed citations

Klepner, S. P., S. Basavaiah, A. Ray, et al.. (1991). Process Integration for a 2ns Cycle/4ns Access 512K CMOS SRAM. 920. 31–32. 1 indexed citations

Chappell, T.I., S.E. Schuster, B.A. Chappell, et al.. (1989). A 3.5 ns/77 K and 6.2 ns/300 K 64 K CMOS RAM with ECL interfaces. IEEE Journal of Solid-State Circuits. 24(4). 859–868. 8 indexed citations

Sun, J.Y.-C., S. P. Klepner, Yuan Taur, et al.. (1988). A HIGH PERFORMANCE LIQUID-NITROGEN CMOS SRAM TECHNOLOGY. Le Journal de Physique Colloques. 49(C4). C4–25. 2 indexed citations

Sun, J.Y.-C., Yuan Taur, R.H. Dennard, & S. P. Klepner. (1987). Submicrometer-channel CMOS for low-temperature operation. IEEE Transactions on Electron Devices. 34(1). 19–27. 98 indexed citations

Taur, Yuan, J.Y.-C. Sun, D. Moy, et al.. (1987). Source—Drain contact resistance in CMOS with self-aligned TiSi₂. IEEE Transactions on Electron Devices. 34(3). 575–580. 45 indexed citations

Sun, J.Y.-C., et al.. (1986). 0.5&#181;m-channel CMOS technology optimized for liquid-nitrogen-temperature operation. 236–239. 5 indexed citations

Wong, C. Y. & S. P. Klepner. (1986). X-ray photoelectron spectroscopy on surface oxidation of silicon by some cleaning procedures. Applied Physics Letters. 48(18). 1229–1230. 9 indexed citations

10.

Schuster, S.E., B.A. Chappell, R. Franch, et al.. (1986). A 15-ns CMOS 64K RAM. IEEE Journal of Solid-State Circuits. 21(5). 704–712. 24 indexed citations

11.

Magerlein, J. H., et al.. (1984). Low defect density insulating films deposited on room temperature substrates. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 2(4). 636–640. 8 indexed citations

12.

Bright, A. A. & S. P. Klepner. (1983). Fine-grained base electrode process for Pb-alloy Josephson technology. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(4). 1846–1851. 6 indexed citations

13.

Bright, A. A., et al.. (1983). Thin film fabrication for the Josephson technology cross-sectional model. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 1(1). 77–90. 9 indexed citations

14.

Klepner, S. P.. (1981). Process test chip for Josephson integrated circuits. IEEE Transactions on Magnetics. 17(1). 282–285. 1 indexed citations

15.

Greiner, J. H. & S. P. Klepner. (1981). Process characterization of Josephson circuits. Journal of Vacuum Science and Technology. 18(2). 262–267. 3 indexed citations

16.

Basavaiah, S., C. J. Kircher, E. P. Harris, et al.. (1980). High-reliability Pb-alloy Josephson junctions for integrated circuits. IEEE Transactions on Electron Devices. 27(10). 1979–1987. 42 indexed citations

17.

Greiner, J. H., C. J. Kircher, S. P. Klepner, et al.. (1980). Fabrication Process for Josephson Integrated Circuits. IBM Journal of Research and Development. 24(2). 195–205. 155 indexed citations

18.

Geppert, L., J. H. Greiner, D. Herrell, & S. P. Klepner. (1979). Damped three-junction interferometers for latching logic. IEEE Transactions on Magnetics. 15(1). 412–415. 21 indexed citations

19.

Hu, S. M., et al.. (1976). Dislocation propagation and emitter edge defects in silicon wafers. Journal of Applied Physics. 47(9). 4098–4106. 33 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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