T. Gheewala
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics top 10%
- Biomedical Engineering
- Hardware and Architecture top 10%
- Co-authors
- Stuart BermonAmar MukherjeeP. VarmaRobert L. WhiteH. C. JonesK. RajkananDavid F. HeidelSteven B. Kaplan
- Topics
- Advanced Electrical Measurement Techniques (12 papers)VLSI and Analog Circuit Testing (8 papers)Integrated Circuits and Semiconductor Failure Analysis (7 papers)
- Partner nations
- United States
In The Last Decade
T. Gheewala
23 papers receiving 323 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 287
- Atomic and Molecular Physics, and Optics 165
- Condensed Matter Physics 122
- Biomedical Engineering 68
- Hardware and Architecture 66
Countries citing papers authored by T. Gheewala
This map shows the geographic impact of T. Gheewala's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Gheewala with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Gheewala more than expected).
Fields of papers citing papers by T. Gheewala
This network shows the impact of papers produced by T. Gheewala. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Gheewala. The network helps show where T. Gheewala may publish in the future.
Co-authorship network of co-authors of T. Gheewala
This figure shows the co-authorship network connecting the top 25 collaborators of T. Gheewala. A scholar is included among the top collaborators of T. Gheewala based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Gheewala. T. Gheewala is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 30 | |
| 2 | 0 | |
| 3 | 3 | |
| 4 | 4 | |
| 5 | 4 | |
| 6 | Delay Testing Using a Matrix of Accessible Storage | 1 |
| 7 | Economics of ASIC test development | 1 |
| 8 | 8 | |
| 9 | 0 | |
| 10 | 1 | |
| 11 | 45 | |
| 12 | 1 | |
| 13 | 7 | |
| 14 | 3 | |
| 15 | 54 | |
| 16 | 34 | |
| 17 | 8 | |
| 18 | 27 | |
| 19 | 25 | |
| 20 | 16 |
About T. Gheewala
T. Gheewala is a scholar working on Hardware and Architecture, Condensed Matter Physics and Electrical and Electronic Engineering, having authored 26 papers that have together received 367 indexed citations. Recurring topics across this work include Advanced Electrical Measurement Techniques (12 papers), VLSI and Analog Circuit Testing (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). The work is most often cited by research in Condensed Matter Physics (122 citations), Hardware and Architecture (66 citations) and Atomic and Molecular Physics, and Optics (165 citations). T. Gheewala has collaborated with scholars based in United States. Frequent co-authors include Stuart Bermon, Amar Mukherjee, P. Varma, Robert L. White, H. C. Jones, K. Rajkanan, David F. Heidel and Steven B. Kaplan. Their work appears in journals such as Applied Physics Letters, Proceedings of the IEEE and IEEE Journal of Solid-State Circuits.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.