A. Vassighi

549 total citations
14 papers, 425 citations indexed

About

A. Vassighi is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computer Networks and Communications. According to data from OpenAlex, A. Vassighi has authored 14 papers receiving a total of 425 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 2 papers in Materials Chemistry and 1 paper in Computer Networks and Communications. Recurrent topics in A. Vassighi's work include Advancements in Semiconductor Devices and Circuit Design (12 papers), Semiconductor materials and devices (10 papers) and Low-power high-performance VLSI design (5 papers). A. Vassighi is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (12 papers), Semiconductor materials and devices (10 papers) and Low-power high-performance VLSI design (5 papers). A. Vassighi collaborates with scholars based in Canada, United States and United Kingdom. A. Vassighi's co-authors include Manoj Sachdev, O. Semenov, A. Keshavarzi, C.F. Hawkins, Yibin Ye, G. Schrom, S. Narendra and Vivek De and has published in prestigious journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Device and Materials Reliability and Journal of Electronic Testing.

In The Last Decade

A. Vassighi

13 papers receiving 408 citations

Peers

A. Vassighi
O. Semenov Canada
M. Rencz Hungary
Islam A. Salama United States
Zhao Yi China
Kodai Yamada Japan
Shaodi Wang United States
Yarui Peng United States
A. Kornfeld Israel
Debendra Mallik United States
Dusan Petranovic United States
O. Semenov Canada
A. Vassighi
Citations per year, relative to A. Vassighi A. Vassighi (= 1×) peers O. Semenov

Countries citing papers authored by A. Vassighi

Since Specialization
Citations

This map shows the geographic impact of A. Vassighi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Vassighi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Vassighi more than expected).

Fields of papers citing papers by A. Vassighi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Vassighi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Vassighi. The network helps show where A. Vassighi may publish in the future.

Co-authorship network of co-authors of A. Vassighi

This figure shows the co-authorship network connecting the top 25 collaborators of A. Vassighi. A scholar is included among the top collaborators of A. Vassighi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Vassighi. A. Vassighi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
Vassighi, A., et al.. (2008). Characterizing infant mortality in high volume manufacturing. 717–718. 7 indexed citations
2.
Vassighi, A. & Manoj Sachdev. (2006). Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems). Springer eBooks. 6 indexed citations
3.
Semenov, O., A. Vassighi, & Manoj Sachdev. (2006). Impact of Self-Heating Effect on Long-Term Reliability and Performance Degradation in CMOS Circuits. IEEE Transactions on Device and Materials Reliability. 6(1). 17–27. 146 indexed citations
4.
Vassighi, A. & Manoj Sachdev. (2006). Thermal and Power Management of Integrated Circuits. Kluwer Academic Publishers eBooks. 73 indexed citations
5.
Vassighi, A. & Manoj Sachdev. (2006). Thermal Runaway in Integrated Circuits. IEEE Transactions on Device and Materials Reliability. 6(2). 300–305. 64 indexed citations
6.
Vassighi, A., O. Semenov, & Manoj Sachdev. (2004). Thermal runaway avoidance during burn-in. 655–656. 9 indexed citations
7.
Vassighi, A., O. Semenov, Manoj Sachdev, & A. Keshavarzi. (2004). Thermal management of high performance microprocessors in burn-in environment. 313–319. 11 indexed citations
8.
Vassighi, A., A. Keshavarzi, S. Narendra, et al.. (2004). Design optimizations for microprocessors at low temperature. 2–5. 7 indexed citations
9.
Vassighi, A., O. Semenov, Manoj Sachdev, A. Keshavarzi, & C.F. Hawkins. (2004). CMOS IC Technology Scaling and Its Impact on Burn-In. IEEE Transactions on Device and Materials Reliability. 4(2). 208–221. 28 indexed citations
10.
Semenov, O., A. Vassighi, Manoj Sachdev, A. Keshavarzi, & C.F. Hawkins. (2004). Burn-in temperature projections for deep sub-micron technologies. 1. 95–104. 16 indexed citations
11.
Semenov, O., A. Vassighi, Manoj Sachdev, A. Keshavarzi, & C.F. Hawkins. (2003). Effect of cmos technology scaling on thermal management during burn-in. IEEE Transactions on Semiconductor Manufacturing. 16(4). 686–695. 21 indexed citations
12.
Vassighi, A., O. Semenov, Manoj Sachdev, & A. Keshavarzi. (2003). Effect of static power dissipation in burn-in environment on yield of VLSI. 12–19.
13.
Semenov, O., A. Vassighi, & Manoj Sachdev. (2003). Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing. Journal of Electronic Testing. 19(3). 341–352. 8 indexed citations
14.
Semenov, O., A. Vassighi, & Manoj Sachdev. (2002). Impact of technology scaling on thermal behavior of leakage current in sub-quarter micron MOSFETs: perspective of low temperature current testing. Microelectronics Journal. 33(11). 985–994. 29 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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