W. Huott
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 14
- Parallel Computing and Optimization Techniques 2
-
- Integrated Circuits and Semiconductor Failure Analysis 12
- Low-power high-performance VLSI design 11
- Semiconductor materials and devices 7
- Advancements in Semiconductor Devices and Circuit Design 3
- Radiation Effects in Electronics 2
-
- Engineering and Test Systems 2
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringComputer Networks and Communications
- Journals
- IBM Journal of Research and Development (2 papers)IEEE Journal of Solid-State Circuits (1 paper)Microelectronics Reliability (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
W. Huott
21 papers receiving 344 citations
Peers
Comparison fields: 5 of 23
- Hardware and Architecture 242
- Electrical and Electronic Engineering 338
- Computer Networks and Communications 22
- Control and Systems Engineering 20
- Software 3
Countries citing papers authored by W. Huott
This map shows the geographic impact of W. Huott's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Huott with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Huott more than expected).
Fields of papers citing papers by W. Huott
This network shows the impact of papers produced by W. Huott. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Huott. The network helps show where W. Huott may publish in the future.
Co-authorship network
The 25 scholars most cited alongside W. Huott, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 0 | |
| 2 | 2011 | 18 | |
| 3 | 2010 | 1 | |
| 4 | 2008 | 9 | |
| 5 | 2007 | 43 | |
| 6 | 2007 | 47 | |
| 7 | 2006 | 16 | |
| 8 | 2006 | 9 | |
| 9 | 2005 | 0 | |
| 10 | 2004 | 33 | |
| 11 | 2003 | 15 | |
| 12 | 2003 | 9 | |
| 13 | 2002 | 3 | |
| 14 | 2002 | 4 | |
| 15 | 2002 | 9 | |
| 16 | 2002 | 13 | |
| 17 | 2002 | 39 | |
| 18 | 2000 | 9 | |
| 19 | 1998 | 7 | |
| 20 | 1997 | 25 |
About W. Huott
W. Huott is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Control and Systems Engineering and Biomedical Engineering, having authored 23 papers that have together received 357 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Low-power high-performance VLSI design (11 papers), Semiconductor materials and devices (7 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Parallel Computing and Optimization Techniques (2 papers), Radiation Effects in Electronics (2 papers) and Engineering and Test Systems (2 papers). The work is most often cited by research in Hardware and Architecture (242 citations), Electrical and Electronic Engineering (338 citations), Computer Networks and Communications (22 citations), Control and Systems Engineering (20 citations) and Software (3 citations). W. Huott has collaborated with scholars based in United States and Germany. Frequent co-authors include Bryan Robbins, R. Franch, Y.H. Chan, P.J. Restle, N. James, R. M. Dixon, S. Weitzel, D. Plass, Pramod Kumar Patel and D.R. Knebel. Their work appears in journals such as IBM Journal of Research and Development, IEEE Journal of Solid-State Circuits, Microelectronics Reliability and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.