Nicolas J.-H. Roche

673 citations
43 papers · 555 indexed · h-index 16
Topics
Radiation Effects in Electronics (35 papers)Integrated Circuits and Semiconductor Failure Analysis (23 papers)Semiconductor materials and devices (20 papers)
Journals
IEEE Transactions on Nuclear ScienceECS TransactionsNASA Technical Reports Server (NASA)

In The Last Decade

Nicolas J.-H. Roche

43 papers receiving 536 citations

Peers

Nicolas J.-H. Roche
Comparison fields: 5 of 30
  • Electrical and Electronic Engineering 506
  • Computational Mechanics 81
  • Materials Chemistry 51
  • Condensed Matter Physics 47
  • Hardware and Architecture 37
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Citations per field
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Citations per year

Countries citing papers authored by Nicolas J.-H. Roche

Since Specialization
Citations

This map shows the geographic impact of Nicolas J.-H. Roche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicolas J.-H. Roche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicolas J.-H. Roche more than expected).

Fields of papers citing papers by Nicolas J.-H. Roche

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nicolas J.-H. Roche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicolas J.-H. Roche. The network helps show where Nicolas J.-H. Roche may publish in the future.

Co-authorship network of co-authors of Nicolas J.-H. Roche

This figure shows the co-authorship network connecting the top 25 collaborators of Nicolas J.-H. Roche. A scholar is included among the top collaborators of Nicolas J.-H. Roche based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nicolas J.-H. Roche. Nicolas J.-H. Roche is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 16
2 5
3 2
4 3
5 10
6 3
7 1
8 13
9 16
10 3
11 5
12 4
13 12
14 14
15 42
16 7
17 21
18 16
19 24
20
Total Dose Effects on Single Event Transients in Digital CMOS and Linear Bipolar Circuits
1

About Nicolas J.-H. Roche

Nicolas J.-H. Roche is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Condensed Matter Physics, having authored 43 papers that have together received 555 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (35 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Semiconductor materials and devices (20 papers). The work is most often cited by research in Electrical and Electronic Engineering (506 citations), Instrumentation (29 citations) and Hardware and Architecture (37 citations). Nicolas J.-H. Roche has collaborated with scholars based in United States, France and Netherlands. Frequent co-authors include Dale McMorrow, S. Büchner, Ani Khachatrian, Jeffrey H. Warner, Joel M. Hales, John D. Cressler, Zachary E. Fleetwood, Andrew D. Koehler, Adrian Ildefonso and Travis J. Anderson. Their work appears in journals such as IEEE Transactions on Nuclear Science, ECS Transactions and NASA Technical Reports Server (NASA).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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