V. Pouget
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing 19
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- Radiation Effects in Electronics 52
- Integrated Circuits and Semiconductor Failure Analysis 46
- Semiconductor materials and devices 27
- Low-power high-performance VLSI design 12
- Electrostatic Discharge in Electronics 11
- Advancements in Semiconductor Devices and Circuit Design 7
- Instrumentation top 10%
- Radiation top 10%
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 9
- Co-authors
- Dale McMorrowD. LewisS. BüchnerP. FouillatF. MillerAntoine TouboulF. WrobelFrédéric Saigné
- Journals
- IEEE Transactions on Nuclear Science (37 papers)Microelectronics Reliability (20 papers)IEEE Transactions on Device and Materials Reliability (2 papers)
- Partner nations
- FranceUnited StatesBelgium
In The Last Decade
V. Pouget
80 papers receiving 988 citations
Peers
Comparison fields: 5 of 49
- Hardware and Architecture 277
- Electrical and Electronic Engineering 963
- Instrumentation 26
- Radiation 54
- Computational Mechanics 106
Countries citing papers authored by V. Pouget
This map shows the geographic impact of V. Pouget's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Pouget with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Pouget more than expected).
Fields of papers citing papers by V. Pouget
This network shows the impact of papers produced by V. Pouget. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Pouget. The network helps show where V. Pouget may publish in the future.
Co-authorship network
The 25 scholars most cited alongside V. Pouget, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 1 | |
| 3 | Single-Event Effects Testing with a Laser Beam - Guidelines | 2023 | 0 |
| 4 | 2022 | 3 | |
| 5 | 2022 | 2 | |
| 6 | 2021 | 6 | |
| 7 | 2021 | 17 | |
| 8 | 2021 | 5 | |
| 9 | 2020 | 26 | |
| 10 | 2020 | 6 | |
| 11 | Analysis of SET Propagation in a System in Package Point of Load Converter | 2020 | 7 |
| 12 | 2020 | 1 | |
| 13 | 2019 | 9 | |
| 14 | 2019 | 11 | |
| 15 | 2012 | 8 | |
| 16 | 2012 | 42 | |
| 17 | 2011 | 17 | |
| 18 | 2007 | 7 | |
| 19 | 2006 | 3 | |
| 20 | 2004 | 35 |
About V. Pouget
V. Pouget is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Computational Mechanics, Radiation and Industrial and Manufacturing Engineering, having authored 83 papers that have together received 1.0k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (52 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers), Semiconductor materials and devices (27 papers), VLSI and Analog Circuit Testing (19 papers), Low-power high-performance VLSI design (12 papers), Electrostatic Discharge in Electronics (11 papers), Ion-surface interactions and analysis (9 papers) and Advancements in Semiconductor Devices and Circuit Design (7 papers). The work is most often cited by research in Hardware and Architecture (277 citations), Electrical and Electronic Engineering (963 citations), Instrumentation (26 citations), Radiation (54 citations) and Computational Mechanics (106 citations). V. Pouget has collaborated with scholars based in France, United States and Belgium. Frequent co-authors include Dale McMorrow, D. Lewis, S. Büchner, P. Fouillat, F. Miller, Antoine Touboul, F. Wrobel, Frédéric Saigné, F. Darracq and Camille Larue. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Instrumentation and Measurement and Optics Express.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.