G. Groos

582 total citations
33 papers, 461 citations indexed

About

G. Groos is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, G. Groos has authored 33 papers receiving a total of 461 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 5 papers in Materials Chemistry and 4 papers in Biomedical Engineering. Recurrent topics in G. Groos's work include Electrostatic Discharge in Electronics (24 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Semiconductor materials and devices (15 papers). G. Groos is often cited by papers focused on Electrostatic Discharge in Electronics (24 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Semiconductor materials and devices (15 papers). G. Groos collaborates with scholars based in Germany, Austria and Italy. G. Groos's co-authors include M. Stecher, E. Gornik, D. Pogány, S. Bychikhin, M. Stutzmann, Martin Litzenberger, M. K. Kelly, R. Dimitrov, H. Angerer and O. Ambacher and has published in prestigious journals such as Applied Physics Letters, Surface Science and IEEE Transactions on Electron Devices.

In The Last Decade

G. Groos

30 papers receiving 442 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
G. Groos Germany	13	357	112	78	75	47	33	461
T. Niwa Japan	10	277 0.8×	100 0.9×	48 0.6×	163 2.2×	44 0.9×	20	318
M.J. Helix United States	10	440 1.2×	57 0.5×	55 0.7×	215 2.9×	33 0.7×	28	454
L. Henry United States	13	586 1.6×	42 0.4×	76 1.0×	211 2.8×	51 1.1×	62	678
T. Takayama Japan	12	276 0.8×	79 0.7×	63 0.8×	200 2.7×	37 0.8×	28	358
D. Schmitz Germany	11	226 0.6×	65 0.6×	81 1.0×	149 2.0×	42 0.9×	48	308
A. Touboul France	11	382 1.1×	107 1.0×	32 0.4×	70 0.9×	31 0.7×	51	430
Nicolas J.-H. Roche United States	16	506 1.4×	47 0.4×	51 0.7×	32 0.4×	21 0.4×	43	555
Shang-Yi Chiang United States	11	565 1.6×	44 0.4×	113 1.4×	307 4.1×	41 0.9×	31	637
Stephen LaLumondiere United States	10	282 0.8×	45 0.4×	78 1.0×	137 1.8×	156 3.3×	31	365
Ashok K. Saxena India	11	352 1.0×	37 0.3×	36 0.5×	238 3.2×	60 1.3×	28	468

Countries citing papers authored by G. Groos

Since Specialization

Citations

This map shows the geographic impact of G. Groos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Groos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Groos more than expected).

Fields of papers citing papers by G. Groos

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Groos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Groos. The network helps show where G. Groos may publish in the future.

Co-authorship network of co-authors of G. Groos

This figure shows the co-authorship network connecting the top 25 collaborators of G. Groos. A scholar is included among the top collaborators of G. Groos based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Groos. G. Groos is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Groos, G.. (2012). Characterisation method for chip card ESD events causing terminal failures. Microelectronics Reliability. 52(9-10). 2005–2009. 1 indexed citations

Rudan, M., Susanna Reggiani, Elena Gnani, et al.. (2006). Theory and experimental validation of a new analytical model for the position-dependent Hall Voltage in devices with arbitrary aspect ratio. IEEE Transactions on Electron Devices. 53(2). 314–322. 5 indexed citations

Groos, G., et al.. (2005). Algorithm for the automatic verification of complex mixed-signal ICS regarding ESD-stress. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1. 213–216. 1 indexed citations

Reggiani, Susanna, N. Jensen, G. Groos, et al.. (2005). Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures. IEEE Transactions on Electron Devices. 52(10). 2290–2299. 39 indexed citations

Pogány, D., S. Bychikhin, M. Denison, et al.. (2005). Thermally-driven motion of current filaments in ESD protection devices. Solid-State Electronics. 49(3). 421–429. 17 indexed citations

Reggiani, Susanna, Elena Gnani, M. Rudan, et al.. (2005). Predictive device simulation for ESD protection structures validated with transient interferometric thermal-mapping experiments. 49. 411–414.

Bychikhin, S., D. Pogány, E. Gornik, et al.. (2004). Error analysis in phase extraction in a 2D holographic imaging of semiconductor devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5290. 233–233. 4 indexed citations

Jensen, N., G. Groos, M. Denison, et al.. (2003). Coupled bipolar transistors as very robust ESD protection devices for automotive applications. Electrical Overstress/Electrostatic Discharge Symposium. 1–6. 15 indexed citations

Pogány, D., S. Bychikhin, Martin Litzenberger, et al.. (2003). Single-shot nanosecond thermal imaging of semiconductor devices using absorption measurements. IEEE Transactions on Device and Materials Reliability. 3(3). 85–88. 3 indexed citations

10.

Pogány, D., S. Bychikhin, J. Kuzmı́k, et al.. (2003). Thermal distribution during destructive pulses in ESD protection devices using a single-shot, two-dimensional interferometric method. 345–348. 1 indexed citations

11.

Pogány, D., S. Bychikhin, Martin Litzenberger, et al.. (2002). Extraction of spatio-temporal distribution of power dissipation in semiconductor devices using nanosecond interferometric mapping technique. Applied Physics Letters. 81(15). 2881–2883. 20 indexed citations

12.

Pogány, D., Martin Litzenberger, S. Bychikhin, et al.. (2002). A Method for Extraction of Power Dissipating Sources from Interferometric Thermal Mapping Measurements. 34. 243–246. 2 indexed citations

13.

Pogány, D., Martin Litzenberger, G. Groos, et al.. (2001). Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping technique. Electrical Overstress/Electrostatic Discharge Symposium. 214–225. 12 indexed citations

14.

Bychikhin, S., Martin Litzenberger, D. Pogány, et al.. (2001). Laser interferometric mapping of smart power ESD protection devices with different blocking capabilities. 40. 231–234. 3 indexed citations

15.

Bychikhin, S., Martin Litzenberger, Reinhard Pichler, et al.. (2001). Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability. 41(9-10). 1501–1506. 2 indexed citations

16.

Esmark, Kai, Martin Litzenberger, D. Pogány, et al.. (2000). Thermal and free carrier concentration mapping during ESD event in smart Power ESD protection devices using an improved laser interferometric technique. Microelectronics Reliability. 40(8-10). 1365–1370. 27 indexed citations

17.

Zybill, Christian, M. Schwartzkopff, E. Hartmann, et al.. (1999). <title>Domain structure of poled (111) PZT (PbZr<formula><inf><roman>0.25</roman></inf></formula>Ti<formula><inf><roman>0.75</roman></inf></formula>O<formula><inf><roman>3</roman></inf></formula>) films</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3675. 84–93. 3 indexed citations

18.

Wegscheider, W., et al.. (1998). Direct writing of in-plane-gated nanostructures by focused laser beam-induced doping. Physica E Low-dimensional Systems and Nanostructures. 2(1-4). 441–448. 2 indexed citations

19.

Groos, G. & M. Stutzmann. (1998). Si-nanostructures made by laser-annealing. Journal of Non-Crystalline Solids. 227-230. 938–942. 4 indexed citations

20.

Kelly, M. K., O. Ambacher, G. Groos, et al.. (1996). Optical patterning of GaN films. Applied Physics Letters. 69(12). 1749–1751. 118 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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