F. Miller

871 total citations
44 papers, 661 citations indexed

About

F. Miller is a scholar working on Electrical and Electronic Engineering, Radiation and Computational Mechanics. According to data from OpenAlex, F. Miller has authored 44 papers receiving a total of 661 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 7 papers in Radiation and 6 papers in Computational Mechanics. Recurrent topics in F. Miller's work include Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and Semiconductor materials and devices (15 papers). F. Miller is often cited by papers focused on Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and Semiconductor materials and devices (15 papers). F. Miller collaborates with scholars based in France, Netherlands and United States. F. Miller's co-authors include N. Buard, S. Büchner, V. Pouget, Dale McMorrow, R. Gaillard, T. Carrière, Bruno Allard, G. Sarrabayrouse, Marise Bafleur and J.M. Palau and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Nuclear Science and Microelectronics Reliability.

In The Last Decade

F. Miller

43 papers receiving 635 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Miller France 13 614 138 57 57 39 44 661
A. I. Chumakov Russia 17 661 1.1× 188 1.4× 66 1.2× 85 1.5× 74 1.9× 91 715
Gregory R. Allen United States 15 518 0.8× 202 1.5× 37 0.6× 26 0.5× 23 0.6× 61 559
N.F. Haddad United States 12 826 1.3× 237 1.7× 76 1.3× 37 0.6× 38 1.0× 33 844
R.L. Pease United States 14 814 1.3× 176 1.3× 51 0.9× 92 1.6× 41 1.1× 28 845
V. Pouget France 19 963 1.6× 277 2.0× 54 0.9× 106 1.9× 38 1.0× 83 1.0k
J.L. Titus United States 24 1.5k 2.4× 170 1.2× 48 0.8× 44 0.8× 38 1.0× 53 1.5k
Andrey V. Yanenko Russia 12 311 0.5× 95 0.7× 38 0.7× 57 1.0× 39 1.0× 38 346
P. Calvel France 18 867 1.4× 137 1.0× 57 1.0× 29 0.5× 16 0.4× 59 912
Martin A. Carts United States 19 1.0k 1.7× 258 1.9× 70 1.2× 20 0.4× 22 0.6× 56 1.1k
Anthony M. Phan United States 14 601 1.0× 150 1.1× 79 1.4× 17 0.3× 23 0.6× 39 634

Countries citing papers authored by F. Miller

Since Specialization
Citations

This map shows the geographic impact of F. Miller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Miller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Miller more than expected).

Fields of papers citing papers by F. Miller

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Miller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Miller. The network helps show where F. Miller may publish in the future.

Co-authorship network of co-authors of F. Miller

This figure shows the co-authorship network connecting the top 25 collaborators of F. Miller. A scholar is included among the top collaborators of F. Miller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Miller. F. Miller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Miller, F., et al.. (2025). Early Assessment of the Fault Tolerance of Complex Digital Components From Virtual Platform Based Profiling. IEEE Transactions on Nuclear Science. 72(8). 2717–2726.
2.
Miller, F., et al.. (2024). Study of the Impact on the Radiation Design Margin of the Statistical Distributions Used to Analyze Radiation Degradation Data. IEEE Transactions on Nuclear Science. 71(8). 1924–1931. 1 indexed citations
3.
Miller, F., et al.. (2024). Using High-Level Profiling Data to Early Assess the Robustness of Digital Systems. 1–6. 1 indexed citations
4.
Miller, F., et al.. (2023). Understanding the Link Between Complex Digital Devices Soft Error Rate and the Running Software. IEEE Transactions on Nuclear Science. 70(8). 1747–1754. 2 indexed citations
5.
Miller, F., et al.. (2021). Single-Event Transient (SET) sensitivity into the Clock Networks of FPGAs. 1 indexed citations
6.
Fouladirad, Mitra, et al.. (2017). Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. Microelectronics Reliability. 75. 14–19. 5 indexed citations
7.
Roche, Nicolas J.-H., Ani Khachatrian, S. Büchner, et al.. (2015). Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor. IEEE Transactions on Nuclear Science. 62(6). 2679–2686. 5 indexed citations
8.
Santini, Thiago, et al.. (2014). Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectronics Reliability. 54(9-10). 1718–1723. 42 indexed citations
9.
Miller, F., et al.. (2013). New Combined Approach for the Evaluation of the Soft-Errors of Complex ICs. IEEE Transactions on Nuclear Science. 60(4). 2704–2711. 4 indexed citations
10.
11.
Büchner, S., Nicolas J.-H. Roche, Jeffrey H. Warner, et al.. (2012). Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL. IEEE Transactions on Nuclear Science. 59(4). 988–998. 42 indexed citations
12.
Leveugle, R., et al.. (2012). Microprocessor Soft Error Rate Prediction Based on Cache Memory Analysis. IEEE Transactions on Nuclear Science. 59(4). 980–987. 8 indexed citations
13.
Miller, F., et al.. (2011). Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power Devices. IEEE Transactions on Nuclear Science. 58(3). 813–819. 9 indexed citations
14.
Miller, F., et al.. (2010). Use of Laser to Explain Heavy Ion Induced SEFIs in SDRAMs. IEEE Transactions on Nuclear Science. 57(1). 272–278. 12 indexed citations
15.
Miller, F., et al.. (2009). Novel DRAM mitigation technique. 33. 109–113. 2 indexed citations
16.
Touboul, Antoine, C. Petit, F. Wrobel, et al.. (2009). Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown. IEEE Transactions on Nuclear Science. 56(4). 2213–2217. 10 indexed citations
17.
Miller, F., et al.. (2008). SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges. IEEE Transactions on Nuclear Science. 55(4). 2166–2173. 32 indexed citations
18.
Wrobel, F., et al.. (2008). Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons. Journal of Applied Physics. 104(9). 5 indexed citations
20.
Miller, F., et al.. (2003). Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems. 199–209. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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