M. Muschitiello

610 total citations
46 papers, 426 citations indexed

About

M. Muschitiello is a scholar working on Electrical and Electronic Engineering, Nuclear and High Energy Physics and Hardware and Architecture. According to data from OpenAlex, M. Muschitiello has authored 46 papers receiving a total of 426 indexed citations (citations by other indexed papers that have themselves been cited), including 43 papers in Electrical and Electronic Engineering, 5 papers in Nuclear and High Energy Physics and 4 papers in Hardware and Architecture. Recurrent topics in M. Muschitiello's work include Radiation Effects in Electronics (22 papers), Semiconductor materials and devices (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). M. Muschitiello is often cited by papers focused on Radiation Effects in Electronics (22 papers), Semiconductor materials and devices (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). M. Muschitiello collaborates with scholars based in Netherlands, Italy and United States. M. Muschitiello's co-authors include Véronique Ferlet-Cavrois, Ali Zadeh, Marta Bagatin, V. Ferlet-Cavrois, Simone Gerardin, A. Paccagnella, Enrico Zanoni, Silvia Beltrami, Arto Javanainen and C. Canali and has published in prestigious journals such as Scientific Reports, IEEE Transactions on Electron Devices and Electronics Letters.

In The Last Decade

M. Muschitiello

44 papers receiving 409 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Muschitiello Netherlands 12 375 44 40 38 34 46 426
Len Adams United Kingdom 2 234 0.6× 46 1.0× 59 1.5× 27 0.7× 16 0.5× 2 314
T. F. Miyahira United States 19 762 2.0× 34 0.8× 71 1.8× 10 0.3× 69 2.0× 54 806
G.K. Lum United States 10 259 0.7× 36 0.8× 45 1.1× 14 0.4× 42 1.2× 30 332
Thierry Nuns France 15 423 1.1× 52 1.2× 69 1.7× 34 0.9× 53 1.6× 50 483
R.K. Lawrence United States 16 771 2.1× 38 0.9× 34 0.8× 28 0.7× 50 1.5× 52 800
T. Hirao Japan 16 605 1.6× 28 0.6× 51 1.3× 11 0.3× 74 2.2× 51 670
J.W. Howard United States 17 663 1.8× 53 1.2× 89 2.2× 66 1.7× 18 0.5× 40 733
B.G. Rax United States 17 1.0k 2.7× 31 0.7× 64 1.6× 14 0.4× 51 1.5× 64 1.1k
O. Flament France 20 989 2.6× 47 1.1× 84 2.1× 40 1.1× 18 0.5× 61 1.0k
R. Ostojić Switzerland 11 341 0.9× 153 3.5× 21 0.5× 11 0.3× 29 0.9× 72 528

Countries citing papers authored by M. Muschitiello

Since Specialization
Citations

This map shows the geographic impact of M. Muschitiello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Muschitiello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Muschitiello more than expected).

Fields of papers citing papers by M. Muschitiello

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Muschitiello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Muschitiello. The network helps show where M. Muschitiello may publish in the future.

Co-authorship network of co-authors of M. Muschitiello

This figure shows the co-authorship network connecting the top 25 collaborators of M. Muschitiello. A scholar is included among the top collaborators of M. Muschitiello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Muschitiello. M. Muschitiello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Muschitiello, M., et al.. (2024). A Characterization Method for TID Versus Temperature Effects on Microelectronic Circuits. IEEE Transactions on Nuclear Science. 71(8). 1932–1939.
2.
Martín‐Holgado, Pedro, et al.. (2023). Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases. 13–21. 1 indexed citations
3.
Bagatin, Marta, Simone Gerardin, A. Paccagnella, et al.. (2022). Energy Deposition by Ultrahigh Energy Ions in Large and Small Sensitive Volumes. IEEE Transactions on Nuclear Science. 69(3). 241–247. 1 indexed citations
4.
Muschitiello, M., et al.. (2019). SEGR and PIGS Failure Analysis of SiC Mosfet. 1–5. 7 indexed citations
5.
Muschitiello, M., et al.. (2019). SEE Responses of Mos-SIC, Mos-si and Sic Mosfet. 1 indexed citations
6.
Muschitiello, M., et al.. (2019). TID test results of radiation hardened SiC MOS structures pre-temperature stressed. 1–4. 1 indexed citations
7.
Javanainen, Arto, Véronique Ferlet-Cavrois, M. Muschitiello, et al.. (2018). Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers. IEEE Transactions on Nuclear Science. 65(2). 732–738. 2 indexed citations
8.
Hidding, B., O. Karger, G. Pretzler, et al.. (2017). Laser-plasma-based Space Radiation Reproduction in the Laboratory. Scientific Reports. 7(1). 42354–42354. 31 indexed citations
9.
Roche, Nicolas J.-H., Ani Khachatrian, S. Büchner, et al.. (2015). Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor. IEEE Transactions on Nuclear Science. 62(6). 2679–2686. 5 indexed citations
10.
O’Mahony, Denis, et al.. (2015). A comparison of the60Co gamma radiation hardness, breakdown characteristics and the effect of SiNxcapping on InAlN and AlGaN HEMTs for space applications. Semiconductor Science and Technology. 31(2). 25008–25008. 7 indexed citations
11.
Muschitiello, M., et al.. (2015). Enhanced Low Dose Rate Sensitivity Analysis of Vertical BJT-STMicroelectronics. 45. 1–4. 1 indexed citations
12.
Muschitiello, M., et al.. (2015). Dosimetry Inter-Laboratory Comparison between ESTEC, CNA-ALTER/RADLAB, and UCL. 1. 1–8. 7 indexed citations
13.
Bagatin, Marta, Simone Gerardin, A. Paccagnella, et al.. (2014). Sample-to-Sample Variability and Bit Errors Induced by Total Dose in Advanced NAND Flash Memories. IEEE Transactions on Nuclear Science. 61(6). 2889–2895. 25 indexed citations
14.
Javanainen, Arto, Véronique Ferlet-Cavrois, Jukka Jaatinen, et al.. (2014). SEGR in SiO${}_2$–Si$_3$N$_4$ Stacks. IEEE Transactions on Nuclear Science. 61(4). 1902–1908. 8 indexed citations
15.
Ferlet-Cavrois, V., N. Ikeda, Masasi Inoue, et al.. (2012). Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance. IEEE Transactions on Nuclear Science. 59(6). 2920–2929. 15 indexed citations
16.
Liu, Sandra, Jean‐Marie Lauenstein, Véronique Ferlet-Cavrois, et al.. (2011). Effects of Ion Species on SEB Failure Voltage of Power DMOSFET. IEEE Transactions on Nuclear Science. 58(6). 2991–2997. 29 indexed citations
17.
Muschitiello, M., et al.. (2003). Thermally Induced Voltage Alteration (TIVA) applied to ESD induced failures. Microelectronics Reliability. 43(9-11). 1699–1704. 3 indexed citations
18.
Muschitiello, M., et al.. (1993). Failure analysis of encapsulated electronic devices by means of scanning ultrasonic microscopy technique. Scanning. 15(4). 236–242. 8 indexed citations
19.
Canali, C., F. Corsi, M. Muschitiello, & Enrico Zanoni. (1989). Infrared microscopy study of anomalous latchup characteristics due to current redistribution in different parasitic paths. IEEE Transactions on Electron Devices. 36(5). 969–978. 13 indexed citations
20.
Muschitiello, M., et al.. (1989). Infra-red microscopy direct observation of current redistribution and SPICE simulation of latch-up I/V hysteresis effects. Electronics Letters. 25(20). 1371–1372. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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