J. Fabula
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 2
- Embedded Systems Design Techniques 1
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- Radiation Effects in Electronics 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- Low-power high-performance VLSI design 1
- VLSI and FPGA Design Techniques 1
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- Radiation Detection and Scintillator Technologies 1
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- Force Microscopy Techniques and Applications 1
- Co-authors
- C. CarmichaelAustin LeseaPeter AlfkeSaar DrimerR. PadovaniF. LimaRicardo ReisRonald D. Schrimpf
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and Quality
- Journals
- IEEE Transactions on Device and Materials Reliability (1 paper)IEEE Transactions on Nuclear Science (1 paper)NASA Technical Reports Server (NASA) (1 paper)
- Partner nations
- United StatesBrazil
In The Last Decade
J. Fabula
6 papers receiving 286 citations
Peers
Comparison fields: 5 of 24
- Hardware and Architecture 207
- Electrical and Electronic Engineering 290
- Safety, Risk, Reliability and Quality 23
- Software 8
- Radiation 18
Countries citing papers authored by J. Fabula
This map shows the geographic impact of J. Fabula's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Fabula with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Fabula more than expected).
Fields of papers citing papers by J. Fabula
This network shows the impact of papers produced by J. Fabula. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Fabula. The network helps show where J. Fabula may publish in the future.
Co-authorship network
The 16 scholars most cited alongside J. Fabula, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 59 | |
| 2 | 2005 | 85 | |
| 3 | 2005 | 155 | |
| 4 | 2005 | 6 | |
| 5 | SEE and TID extension testing of the Xilinx XQR18V04 4Mbit radiation hardened configuration PROM | 2002 | 1 |
| 6 | 1966 | 1 |
About J. Fabula
J. Fabula is a scholar working on Hardware and Architecture, Radiation and Electrical and Electronic Engineering, having authored 6 papers that have together received 307 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (2 papers), Force Microscopy Techniques and Applications (1 paper), Embedded Systems Design Techniques (1 paper), Low-power high-performance VLSI design (1 paper), VLSI and FPGA Design Techniques (1 paper) and Radiation Detection and Scintillator Technologies (1 paper). The work is most often cited by research in Hardware and Architecture (207 citations), Electrical and Electronic Engineering (290 citations) and Safety, Risk, Reliability and Quality (23 citations). J. Fabula has collaborated with scholars based in United States and Brazil. Frequent co-authors include C. Carmichael, Austin Lesea, Peter Alfke, Saar Drimer, R. Padovani, F. Lima, Ricardo Reis, Ronald D. Schrimpf, Marcus H. Mendenhall and P.E. Dodd. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Nuclear Science and NASA Technical Reports Server (NASA).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.