Journal of Electronic Testing

13.3k citations
1.5k papers · indexed · active since 1950
Topics
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in Electronics

In The Last Decade

Journal of Electronic Testing

1.3k papers receiving 12.3k citations

Peers

Journal of Electronic Testing
Comparison fields: 5 of 130
  • Electrical and Electronic Engineering 10.9k
  • Hardware and Architecture 9.4k
  • Control and Systems Engineering 1.3k
  • Artificial Intelligence 1.3k
  • Computer Networks and Communications 1.1k
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Journal of Electronic Testing relative to ACM Transactions on Design Automation of Electronic Systems United States ACM Transactions on Design Automation of Electronic Systems's profile →
Citations per field
00.5×1.5×2.5×
ACM Transactions on Design Automation of Electronic Systems · 1×
Citations per year

Countries where authors publish in Journal of Electronic Testing

Since Specialization
Citations

This map shows the geographic impact of research published in Journal of Electronic Testing. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Journal of Electronic Testing with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Journal of Electronic Testing more than expected).

Fields of papers published in Journal of Electronic Testing

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in Journal of Electronic Testing. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Journal of Electronic Testing.

About Journal of Electronic Testing

The 1.5k papers published in Journal of Electronic Testing in the last decades have received a total of 13.3k indexed citations . Papers published in Journal of Electronic Testing usually cover Hardware and Architecture (1.1k papers), Software (118 papers) and Electrical and Electronic Engineering (1.2k papers) specifically the topics of VLSI and Analog Circuit Testing (985 papers), Integrated Circuits and Semiconductor Failure Analysis (710 papers) and Radiation Effects in Electronics (393 papers). The most active scholars publishing in Journal of Electronic Testing are Erik Jan Marinissen, Krishnendu Chakrabarty, Y. Zorian, Hans-Joachim Wunderlich, M. Nicolaidis, Vikram Iyengar, Vishwani D. Agrawal, B.F. Cockburn, Ujjwal Guin and Robert Aitken.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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