N. Defrance
- Condensed Matter Physics top 5%
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Co-authors
- Virginie HoelJ.C. de JaegerY. CordierHassan MaherMarie LesecqP. FrijlinkF. LecourtJean-Claude de Jaeger
- Topics
- GaN-based semiconductor devices and materials (32 papers)Semiconductor materials and devices (16 papers)Radio Frequency Integrated Circuit Design (10 papers)
In The Last Decade
N. Defrance
30 papers receiving 396 citations
Peers
Comparison fields: 5 of 18
- Condensed Matter Physics 356
- Electrical and Electronic Engineering 302
- Electronic, Optical and Magnetic Materials 142
- Materials Chemistry 85
- Atomic and Molecular Physics, and Optics 71
Countries citing papers authored by N. Defrance
This map shows the geographic impact of N. Defrance's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Defrance with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Defrance more than expected).
Fields of papers citing papers by N. Defrance
This network shows the impact of papers produced by N. Defrance. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Defrance. The network helps show where N. Defrance may publish in the future.
Co-authorship network of co-authors of N. Defrance
This figure shows the co-authorship network connecting the top 25 collaborators of N. Defrance. A scholar is included among the top collaborators of N. Defrance based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Defrance. N. Defrance is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 2 | |
| 5 | 25 | |
| 6 | 2 | |
| 7 | 19 | |
| 8 | S-Parameter Characterization of GaN HEMT Power Transistors for High Frequency Modeling | 1 |
| 9 | 6 | |
| 10 | 5 | |
| 11 | 17 | |
| 12 | 97 | |
| 13 | 4 | |
| 14 | 4 | |
| 15 | 9 | |
| 16 | 4 | |
| 17 | 8 | |
| 18 | 9 | |
| 19 | 1 | |
| 20 | 6 |
About N. Defrance
N. Defrance is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 33 papers that have together received 410 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (32 papers), Semiconductor materials and devices (16 papers) and Radio Frequency Integrated Circuit Design (10 papers). The work is most often cited by research in Condensed Matter Physics (356 citations), Electronic, Optical and Magnetic Materials (142 citations) and Electrical and Electronic Engineering (302 citations). N. Defrance has collaborated with scholars based in France, Germany and Canada. Frequent co-authors include Virginie Hoel, J.C. de Jaeger, Y. Cordier, Hassan Maher, Marie Lesecq, P. Frijlink, F. Lecourt, Jean-Claude de Jaeger, Étienne Okada and B. Damilano. Their work appears in journals such as Scientific Reports, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.