M. Stecher
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- Electrostatic Discharge in Electronics 47
- Integrated Circuits and Semiconductor Failure Analysis 34
- Semiconductor materials and devices 31
- Advancements in Semiconductor Devices and Circuit Design 17
- Silicon Carbide Semiconductor Technologies 10
- Electronic Packaging and Soldering Technologies 9
- Electromagnetic Compatibility and Noise Suppression 7
- Thin-Film Transistor Technologies 7
M. Stecher
71 papers receiving 874 citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 849
- Condensed Matter Physics 37
- Hardware and Architecture 21
- Mechanics of Materials 68
- Mechanical Engineering 76
Countries citing papers authored by M. Stecher
This map shows the geographic impact of M. Stecher's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Stecher with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Stecher more than expected).
Fields of papers citing papers by M. Stecher
This network shows the impact of papers produced by M. Stecher. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Stecher. The network helps show where M. Stecher may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Stecher, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2012 | 1 | |
| 3 | 2010 | 3 | |
| 4 | 2010 | 9 | |
| 5 | 2009 | 6 | |
| 6 | 2008 | 6 | |
| 7 | ESD protection considerations in advanced high-voltage technologies for automotive | 2006 | 31 |
| 8 | 2006 | 5 | |
| 9 | 2006 | 1 | |
| 10 | 2005 | 1 | |
| 11 | 2005 | 26 | |
| 12 | 2004 | 38 | |
| 13 | 2004 | 3 | |
| 14 | Coupled bipolar transistors as very robust ESD protection devices for automotive applications | 2003 | 15 |
| 15 | 2003 | 3 | |
| 16 | 2002 | 20 | |
| 17 | Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping technique | 2001 | 12 |
| 18 | 2001 | 3 | |
| 19 | 2001 | 2 | |
| 20 | Study of bipolar transistor action during ESD stress in smart power ESD protection devices using interferometric temperature mapping | 1999 | 0 |
About M. Stecher
M. Stecher is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Hardware and Architecture, having authored 74 papers that have together received 918 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (47 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers), Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Silicon Carbide Semiconductor Technologies (10 papers), Electronic Packaging and Soldering Technologies (9 papers), Electromagnetic Compatibility and Noise Suppression (7 papers) and Thin-Film Transistor Technologies (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (849 citations), Condensed Matter Physics (37 citations) and Hardware and Architecture (21 citations). M. Stecher has collaborated with scholars based in Germany, Austria and Italy. Frequent co-authors include E. Gornik, D. Pogány, G. Groos, S. Bychikhin, M. Denison, P. Alpern, Martin Litzenberger, N. Jensen, Kai Esmark and Harald Goßner. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, IEEE Electron Device Letters and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.