Harald Goßner
Impact in
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- Semiconductor materials and devices
- Electrostatic Discharge in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Electromagnetic Compatibility and Noise Suppression
- Ferroelectric and Negative Capacitance Devices
- Hardware and Architecture top 10%
Papers in
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- Electrostatic Discharge in Electronics 110
- Semiconductor materials and devices 93
- Advancements in Semiconductor Devices and Circuit Design 67
- Integrated Circuits and Semiconductor Failure Analysis 63
- Electromagnetic Compatibility and Noise Suppression 25
- Silicon Carbide Semiconductor Technologies 15
- Radio Frequency Integrated Circuit Design 9
- Co-authors
- Mayank ShrivastavaV. Ramgopal RaoMaryam Shojaei BaghiniKai EsmarkWolfgang StadlerI. EiseleKaustav BanerjeeChristian Russ
- Journals
- IEEE Transactions on Electron Devices (29 papers)Microelectronics Reliability (16 papers)IEEE Transactions on Electromagnetic Compatibility (5 papers)IEEE Transactions on Device and Materials Reliability (4 papers)IEEE Electron Device Letters (3 papers)
- Partner nations
- GermanyUnited StatesIndia
In The Last Decade
Harald Goßner
151 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 1.6k
- Hardware and Architecture 43
- Biomedical Engineering 179
- Condensed Matter Physics 42
- Atomic and Molecular Physics, and Optics 97
Countries citing papers authored by Harald Goßner
This map shows the geographic impact of Harald Goßner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Harald Goßner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Harald Goßner more than expected).
Fields of papers citing papers by Harald Goßner
This network shows the impact of papers produced by Harald Goßner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Harald Goßner. The network helps show where Harald Goßner may publish in the future.
Co-authors
The 25 scholars most cited alongside Harald Goßner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2022 | 3 | |
| 3 | 2020 | 1 | |
| 4 | 2020 | 5 | |
| 5 | 2020 | 5 | |
| 6 | 2019 | 12 | |
| 7 | 2019 | 4 | |
| 8 | 2018 | 4 | |
| 9 | 2018 | 10 | |
| 10 | 2018 | 12 | |
| 11 | Analysis of current sharing in large and small-signal IC pin models | 2014 | 3 |
| 12 | Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation | 2013 | 16 |
| 13 | A systematic method for determining soft-failure robustness of a subsystem | 2013 | 8 |
| 14 | ESD characterization of atomically-thin graphene | 2012 | 6 |
| 15 | Study of system ESD codesign of a realistic mobile board | 2011 | 23 |
| 16 | An automated approach for verification of onchip interconnect resistance for electrostatic discharge paths | 2011 | 3 |
| 17 | Improving surface bipolar activity in thin gate oxide DE-NMOS — A critical HV I/O protection element for nano-meter scale technologies | 2010 | 2 |
| 18 | Cable discharges into communication interfaces | 2006 | 22 |
| 19 | Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping technique | 2001 | 12 |
| 20 | Study of bipolar transistor action during ESD stress in smart power ESD protection devices using interferometric temperature mapping | 1999 | 0 |
About Harald Goßner
Harald Goßner is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Condensed Matter Physics, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 156 papers that have together received 1.7k indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (110 papers), Semiconductor materials and devices (93 papers), Advancements in Semiconductor Devices and Circuit Design (67 papers), Integrated Circuits and Semiconductor Failure Analysis (63 papers), Electromagnetic Compatibility and Noise Suppression (25 papers), Silicon Carbide Semiconductor Technologies (15 papers), Nanowire Synthesis and Applications (11 papers) and Radio Frequency Integrated Circuit Design (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.6k citations), Hardware and Architecture (43 citations), Biomedical Engineering (179 citations), Condensed Matter Physics (42 citations) and Atomic and Molecular Physics, and Optics (97 citations). Harald Goßner has collaborated with scholars based in Germany, United States and India. Frequent co-authors include Mayank Shrivastava, V. Ramgopal Rao, Maryam Shojaei Baghini, Kai Esmark, Wolfgang Stadler, I. Eisele, Kaustav Banerjee, Christian Russ, T. Schulz and E. Gornik. Their work appears in journals such as IEEE Transactions on Electron Devices, Microelectronics Reliability, IEEE Transactions on Electromagnetic Compatibility, IEEE Transactions on Device and Materials Reliability and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.