A. Spitzer
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 5
- Catalysis top 10%
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- Advanced Chemical Physics Studies 9
- Materials Chemistry top 10%
- Catalytic Processes in Materials Science 5
- Electronic and Structural Properties of Oxides 5
- Silicon Nanostructures and Photoluminescence 4
- Electrochemistry top 10%
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- Semiconductor materials and devices 16
- Advancements in Semiconductor Devices and Circuit Design 4
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- Copper Interconnects and Reliability 4
- Journals
- Surface Science (13 papers)Applied Surface Science (3 papers)Journal of Applied Physics (3 papers)
- Partner nations
- GermanyUnited States
In The Last Decade
A. Spitzer
31 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 60
- Surfaces, Coatings and Films 171
- Catalysis 135
- Atomic and Molecular Physics, and Optics 542
- Materials Chemistry 660
- Electrochemistry 55
Countries citing papers authored by A. Spitzer
This map shows the geographic impact of A. Spitzer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Spitzer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Spitzer more than expected).
Fields of papers citing papers by A. Spitzer
This network shows the impact of papers produced by A. Spitzer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Spitzer. The network helps show where A. Spitzer may publish in the future.
Co-authorship network
The 25 scholars most cited alongside A. Spitzer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2010 | 9 | |
| 2 | 1997 | 17 | |
| 3 | 1996 | 77 | |
| 4 | 1996 | 15 | |
| 5 | 1990 | 12 | |
| 6 | 1989 | 34 | |
| 7 | Comparison of Methods Characterizing Time Dependent Dielectric Breakdown in Thin Oxide and Oxide-Nitride-Oxide Layers | 1987 | 2 |
| 8 | 1987 | 83 | |
| 9 | 1987 | 12 | |
| 10 | 1986 | 1 | |
| 11 | 1985 | 70 | |
| 12 | 1985 | 12 | |
| 13 | 1985 | 45 | |
| 14 | 1984 | 11 | |
| 15 | 1984 | 81 | |
| 16 | 1984 | 22 | |
| 17 | 1983 | 3 | |
| 18 | 1982 | 196 | |
| 19 | 1982 | 134 | |
| 20 | 1981 | 41 |
About A. Spitzer
A. Spitzer is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 31 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Advanced Chemical Physics Studies (9 papers), Catalytic Processes in Materials Science (5 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Electronic and Structural Properties of Oxides (5 papers), Copper Interconnects and Reliability (4 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers) and Silicon Nanostructures and Photoluminescence (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (171 citations), Catalysis (135 citations) and Atomic and Molecular Physics, and Optics (542 citations). A. Spitzer has collaborated with scholars based in Germany and United States. Frequent co-authors include H. Lüth, D. Ehlers, H. Reisinger, A. Ritz, Frank Becker, D. A. Pawlik, H. Wendt, W. Hönlein, V. Lehmann and A. Eßer. Their work appears in journals such as Surface Science, Applied Surface Science, Journal of Applied Physics, Physical review. B, Condensed matter and Soft Matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.